Arama Sonuçları Microelectronics. - Daraltılmış: 2005
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectronics.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092005$0025092005$0026te$003dILS$0026ps$003d300?dt=list
2024-12-25T01:50:50Z
Materials science in microelectronics
ent://SD_ILS/0/SD_ILS:256402
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Yazar Machlin, E. S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446394">http://www.sciencedirect.com/science/book/9780080446394</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446400">http://www.sciencedirect.com/science/book/9780080446400</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Materials science in microelectronics
ent://SD_ILS/0/SD_ILS:105683
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Yazar Machlin, E. S.<br/>Yer Numarası TK 7871.15.F5 M32 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
Field Emission in Vacuum Microelectronics
ent://SD_ILS/0/SD_ILS:165368
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2024-12-25T01:50:50Z
Yazar Fursey, George. author. Brodie, Ivor. editor. Schwoebel, Paul. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139052">http://dx.doi.org/10.1007/b139052</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High Dielectric Constant Materials VLSI MOSFET Applications
ent://SD_ILS/0/SD_ILS:180748
2024-12-25T01:50:50Z
2024-12-25T01:50:50Z
Yazar Huff, H.R. editor. Gilmer, D.C. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b137574">http://dx.doi.org/10.1007/b137574</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microcontrollers in Practice
ent://SD_ILS/0/SD_ILS:181713
2024-12-25T01:50:50Z
2024-12-25T01:50:50Z
Yazar Mitescu, Marian. author. Susnea, Ioan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-28308-0">http://dx.doi.org/10.1007/3-540-28308-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-level Test and Validation of Hardware/Software Systems
ent://SD_ILS/0/SD_ILS:175272
2024-12-25T01:50:50Z
2024-12-25T01:50:50Z
Yazar Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Gettering Defects in Semiconductors
ent://SD_ILS/0/SD_ILS:182063
2024-12-25T01:50:50Z
2024-12-25T01:50:50Z
Yazar Perevoschikov, Victor A. author. Skoupov, Vladimir D. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-29499-6">http://dx.doi.org/10.1007/3-540-29499-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced manufacturing technology for medical applications reverse engineering, software conversion, and rapid prototyping
ent://SD_ILS/0/SD_ILS:318854
2024-12-25T01:50:50Z
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Yazar Gibson, Ian, 1938-<br/>Yer Numarası ONLINE(318854.1)<br/>Elektronik Erişim <a href="http://www.contentreserve.com/TitleInfo.asp?ID={8C3120F6-FEF2-4736-95A4-46F153820E5E}&Format=50">Click for information</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAMTMARE2">http://app.knovel.com/web/toc.v/cid:kpAMTMARE2</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=255342">http://public.eblib.com/choice/publicfullrecord.aspx?p=255342</a>
ebrary <a href="http://site.ebrary.com/id/10301702">http://site.ebrary.com/id/10301702</a>
EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=152196">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=152196</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>