Arama Sonu&ccedil;lar&#305; Microelectronics. - Daralt&#305;lm&#305;&#351;: 2007 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectronics.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092007$0025092007$0026pe$003dd$00253A$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-26T21:23:19Z Materials science in microelectronics ent://SD_ILS/0/SD_ILS:256402 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Machlin, E. S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446394">http://www.sciencedirect.com/science/book/9780080446394</a> ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446400">http://www.sciencedirect.com/science/book/9780080446400</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dielectric films for advanced microelectronics ent://SD_ILS/0/SD_ILS:296648 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Baklanov, Mikhail.&#160;Green, Martin.&#160;Maex, Karen.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470017944">http://dx.doi.org/10.1002/9780470017944</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Microelectronics : circuit analysis and design ent://SD_ILS/0/SD_ILS:110388 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Neamen, Donald A.<br/>Yer Numaras&#305;&#160;TK7867 .N412 2007<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Future trends in microelectronics up the nano creek ent://SD_ILS/0/SD_ILS:249507 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;FTM-5 (2006 : Crete, Greece)&#160;Luryi, Serge.&#160;Xu, Jimmy.&#160;Zaslavsky, Alex, 1963-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201522">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201522</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies ent://SD_ILS/0/SD_ILS:169369 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Henzler, Stephan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-5081-X">http://dx.doi.org/10.1007/1-4020-5081-X</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> High-Dynamic-Range (HDR) Vision ent://SD_ILS/0/SD_ILS:184770 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Hoefflinger, Bernd. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-44433-6">http://dx.doi.org/10.1007/978-3-540-44433-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Gate Stacks for High-Mobility Semiconductors ent://SD_ILS/0/SD_ILS:186295 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Dimoulas, Athanasios. editor.&#160;Gusev, Evgeni. editor.&#160;McIntyre, Paul C. editor.&#160;Heyns, Marc. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-71491-0">http://dx.doi.org/10.1007/978-3-540-71491-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electron beams and microwave vacuum electronics ent://SD_ILS/0/SD_ILS:296782 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Tsimring, Shulim E., 1924-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://www.contentreserve.com/TitleInfo.asp?ID={EA2D7BD3-8E64-4072-9BED-507FAE058D50}&Format=50">Click for information</a> <a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780470053768">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780470053768</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=275883">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=275883</a> John Wiley <a href="http://dx.doi.org/10.1002/0470053763">http://dx.doi.org/10.1002/0470053763</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470053768">http://dx.doi.org/10.1002/9780470053768</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Metamaterials with negative parameters theory, design and microwave applications ent://SD_ILS/0/SD_ILS:297076 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Marqu&eacute;s, Ricardo, 1954-&#160;Mart&iacute;n, Ferran, 1965-&#160;Sorolla, Mario, 1958-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470191736">http://dx.doi.org/10.1002/9780470191736</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical inspection of microsystems ent://SD_ILS/0/SD_ILS:287557 2024-12-26T21:23:19Z 2024-12-26T21:23:19Z Yazar&#160;Osten, Wolfgang.<br/>Yer 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