Arama Sonuçları Microelectronics. - Daraltılmış: 2009SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectronics.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092009$0025092009$0026ps$003d300?dt=list2025-03-19T15:13:43ZMaterials science in microelectronicsent://SD_ILS/0/SD_ILS:2564022025-03-19T15:13:43Z2025-03-19T15:13:43ZYazar Machlin, E. S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446394">http://www.sciencedirect.com/science/book/9780080446394</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446400">http://www.sciencedirect.com/science/book/9780080446400</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102025-03-19T15:13:43Z2025-03-19T15:13:43ZYazar Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design of cost-efficient interconnect processing units Spidergon STNoCent://SD_ILS/0/SD_ILS:2877522025-03-19T15:13:43Z2025-03-19T15:13:43ZYazar Coppola, Marcello.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420044720">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electrostatic discharge understand, simulate and fix ESD problemsent://SD_ILS/0/SD_ILS:2495732025-03-19T15:13:43Z2025-03-19T15:13:43ZYazar Mardiguian, Michel.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742025-03-19T15:13:43Z2025-03-19T15:13:43ZYazar Strong, Alvin Wayne, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced signal integrity for high-speed digital designsent://SD_ILS/0/SD_ILS:2495612025-03-19T15:13:43Z2025-03-19T15:13:43ZYazar Hall, Stephen H. Heck, Howard L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>