Arama Sonuçları Microelectronics. - Daraltılmış: Security systems.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectronics.$0026qf$003dSUBJECT$002509Konu$002509Security$002bsystems.$002509Security$002bsystems.$0026ps$003d300$0026isd$003dtrue?dt=list
2026-03-25T11:18:01Z
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:614253
2026-03-25T11:18:01Z
2026-03-25T11:18:01Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-54209-5">https://doi.org/10.1007/978-3-662-54209-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Occupational Injuries From Electrical Shock and Arc Flash Events
ent://SD_ILS/0/SD_ILS:611586
2026-03-25T11:18:01Z
2026-03-25T11:18:01Z
Yazar Campbell, Richard B. author. Dini, David A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-6508-3">https://doi.org/10.1007/978-1-4939-6508-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Functional Safety for Road Vehicles New Challenges and Solutions for E-mobility and Automated Driving
ent://SD_ILS/0/SD_ILS:615793
2026-03-25T11:18:01Z
2026-03-25T11:18:01Z
Yazar Ross, Hans-Leo. author. (orcid)0009-0009-0125-8824 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-33361-8">https://doi.org/10.1007/978-3-319-33361-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Secure Data Deletion
ent://SD_ILS/0/SD_ILS:617190
2026-03-25T11:18:01Z
2026-03-25T11:18:01Z
Yazar Reardon, Joel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-28778-2">https://doi.org/10.1007/978-3-319-28778-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliable Design of Electronic Equipment An Engineering Guide
ent://SD_ILS/0/SD_ILS:529320
2026-03-25T11:18:01Z
2026-03-25T11:18:01Z
Yazar Natarajan, Dhanasekharan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09111-2">https://doi.org/10.1007/978-3-319-09111-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
CMOS Test and Evaluation A Physical Perspective
ent://SD_ILS/0/SD_ILS:530329
2026-03-25T11:18:01Z
2026-03-25T11:18:01Z
Yazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>