Arama Sonuçları Microscopy - Daraltılmış: Condensed matter.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Konu$002509Condensed$002bmatter.$002509Condensed$002bmatter.$0026te$003dILS$0026ps$003d300?dt=list
2024-10-08T06:51:00Z
Science of Microscopy
ent://SD_ILS/0/SD_ILS:166500
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Yazar Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Magnetic Microscopy of Nanostructures
ent://SD_ILS/0/SD_ILS:180864
2024-10-08T06:51:00Z
2024-10-08T06:51:00Z
Yazar Hopster, Herbert. editor. Oepen, Hans Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b137837">http://dx.doi.org/10.1007/b137837</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Roadmap of Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:184007
2024-10-08T06:51:00Z
2024-10-08T06:51:00Z
Yazar Morita, Seizo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Microscopy for Nanotechnology
ent://SD_ILS/0/SD_ILS:170039
2024-10-08T06:51:00Z
2024-10-08T06:51:00Z
Yazar Yao, Nan. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-8006-9">http://dx.doi.org/10.1007/1-4020-8006-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transmission Electron Microscopy Physics of Image Formation
ent://SD_ILS/0/SD_ILS:166076
2024-10-08T06:51:00Z
2024-10-08T06:51:00Z
Yazar Kohl, Helmut. author. Reimer, Ludwig. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-40093-8">http://dx.doi.org/10.1007/978-0-387-40093-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
ent://SD_ILS/0/SD_ILS:168790
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Yazar Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>