Arama Sonuçları Microscopy - Daraltılmış: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list
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Microscopy of Semiconducting Materials 2007
ent://SD_ILS/0/SD_ILS:170247
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Yazar Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
ent://SD_ILS/0/SD_ILS:182995
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Yazar Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of Solid State Engineering
ent://SD_ILS/0/SD_ILS:486705
2024-12-29T01:44:40Z
2024-12-29T01:44:40Z
Yazar Razeghi, Manijeh. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-75708-7">https://doi.org/10.1007/978-3-319-75708-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High Permittivity Gate Dielectric Materials
ent://SD_ILS/0/SD_ILS:334228
2024-12-29T01:44:40Z
2024-12-29T01:44:40Z
Yazar Kar, Samares. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334228.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-36535-5">http://dx.doi.org/10.1007/978-3-642-36535-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>