Arama Sonuçları Microscopy - Daraltılmış: Nanotechnology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Konu$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list2024-12-29T03:32:03ZAtom Probe Microscopyent://SD_ILS/0/SD_ILS:1742622024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Gault, Baptiste. author. Moody, Michael P. author. Cairney, Julie M. author. Ringer, Simon P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-3436-8">http://dx.doi.org/10.1007/978-1-4614-3436-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Acoustic Scanning Probe Microscopyent://SD_ILS/0/SD_ILS:3331532024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333153.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Magnetic Microscopy of Nanostructuresent://SD_ILS/0/SD_ILS:1808642024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Hopster, Herbert. editor. Oepen, Hans Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b137837">http://dx.doi.org/10.1007/b137837</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical nanoscopy and novel microscopy techniquesent://SD_ILS/0/SD_ILS:3565222024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Xi, Peng, editor.<br/>Yer Numarası ONLINE(356522.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466586307">Distributed by publisher. 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Barry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniquesent://SD_ILS/0/SD_ILS:1885642024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniquesent://SD_ILS/0/SD_ILS:1870502024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a 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href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:1661962024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Scanning Probe Methods II Scanning Probe Microscopy Techniquesent://SD_ILS/0/SD_ILS:1814122024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfacesent://SD_ILS/0/SD_ILS:1817522024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Kaupp, Gerd. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-28472-7">http://dx.doi.org/10.1007/978-3-540-28472-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002ent://SD_ILS/0/SD_ILS:1687902024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technologyent://SD_ILS/0/SD_ILS:1812322024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Yamashita, Mikio. editor. Shigekawa, Hidemi. editor. Morita, Ryuji. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138671">http://dx.doi.org/10.1007/b138671</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Egerton, Ray F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Solid State Engineeringent://SD_ILS/0/SD_ILS:4867052024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Razeghi, Manijeh. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-75708-7">https://doi.org/10.1007/978-3-319-75708-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Theory of Bilayer Graphene Spectroscopyent://SD_ILS/0/SD_ILS:3333742024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Mucha-Kruczyński, Marcin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333374.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-30936-6">http://dx.doi.org/10.1007/978-3-642-30936-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Photoemission Spectroscopy on High Temperature Superconductor A Study of Bi2Sr2CaCu2O8 by Laser-Based Angle-Resolved Photoemissionent://SD_ILS/0/SD_ILS:3335792024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Zhang, Wentao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333579.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-32472-7">http://dx.doi.org/10.1007/978-3-642-32472-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraineent://SD_ILS/0/SD_ILS:3323212024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332321.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Local Electrode Atom Probe Tomography A User's Guideent://SD_ILS/0/SD_ILS:3324442024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.<br/>Yer Numarası ONLINE(332444.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-8721-0">http://dx.doi.org/10.1007/978-1-4614-8721-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonanceent://SD_ILS/0/SD_ILS:3327762024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar van Schooten, Kipp. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332776.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>UV-VIS and Photoluminescence Spectroscopy for Nanomaterials Characterizationent://SD_ILS/0/SD_ILS:3331572024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Kumar, Challa. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333157.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-27594-4">http://dx.doi.org/10.1007/978-3-642-27594-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fullerene nano-whiskersent://SD_ILS/0/SD_ILS:2909002024-12-29T03:32:03Z2024-12-29T03:32:03ZYazar Miyazawa, Kun'ichi.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9789814267632">Distributed by publisher. 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