Arama Sonu&ccedil;lar&#305; Microscopy - Daralt&#305;lm&#305;&#351;: Physics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Konu$002509Physics.$002509Physics.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-29T03:08:50Z Confocal Raman Microscopy ent://SD_ILS/0/SD_ILS:192021 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Dieing, Thomas. editor.&#160;Hollricher, Olaf. editor.&#160;Toporski, Jan. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-12522-5">http://dx.doi.org/10.1007/978-3-642-12522-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Acoustic Scanning Probe Microscopy ent://SD_ILS/0/SD_ILS:333153 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Marinello, Francesco. editor.&#160;Passeri, Daniele. editor.&#160;Savio, Enrico. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333153.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:333265 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Fultz, Brent. author.&#160;Howe, James. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333265.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Digital Holographic Microscopy Principles, Techniques, and Applications ent://SD_ILS/0/SD_ILS:172981 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Kim, Myung K. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-7793-9">http://dx.doi.org/10.1007/978-1-4419-7793-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy Physics of Image Formation ent://SD_ILS/0/SD_ILS:166076 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Kohl, Helmut. author.&#160;Reimer, Ludwig. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-40093-8">http://dx.doi.org/10.1007/978-0-387-40093-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> EMC 2008 14th European Microscopy Congress 1&ndash;5 September 2008, Aachen, Germany Volume 1: Instrumentation and Methods ent://SD_ILS/0/SD_ILS:188617 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Luysberg, Martina. editor.&#160;Tillmann, Karsten. editor.&#160;Weirich, Thomas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85156-1">http://dx.doi.org/10.1007/978-3-540-85156-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> EMC 2008 14th European Microscopy Congress 1&ndash;5 September 2008, Aachen, Germany Volume 2: Materials Science ent://SD_ILS/0/SD_ILS:188643 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Richter, Silvia. editor.&#160;Schwedt, Alexander. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85226-1">http://dx.doi.org/10.1007/978-3-540-85226-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> EMC 2008 14th European Microscopy Congress 1&ndash;5 September 2008, Aachen, Germany Volume 3: Life Science ent://SD_ILS/0/SD_ILS:188644 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Aretz, Anke. editor.&#160;Hermanns-Sachweh, Benita. editor.&#160;Mayer, Joachim. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85228-5">http://dx.doi.org/10.1007/978-3-540-85228-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 ent://SD_ILS/0/SD_ILS:333137 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333137.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> 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Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1&ndash;13 October 2002 ent://SD_ILS/0/SD_ILS:168790 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;Vilarinho, Paula Maria. editor.&#160;Rosenwaks, Yossi. editor.&#160;Kingon, Angus. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Magnetism and Synchrotron Radiation: Towards the Fourth Generation Light Sources Proceedings of the 6th International School &ldquo;Synchrotron 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Gethyn. editor.&#160;Wilhelm, Klaus. editor.<br/>Yer Numaras&#305;&#160;ONLINE(332349.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7804-1">http://dx.doi.org/10.1007/978-1-4614-7804-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance ent://SD_ILS/0/SD_ILS:332776 2024-12-29T03:08:50Z 2024-12-29T03:08:50Z Yazar&#160;van Schooten, Kipp. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332776.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Auger- and X-Ray Photoelectron Spectroscopy in Materials Science A User-Oriented Guide ent://SD_ILS/0/SD_ILS:333149 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