Arama Sonuçları Microscopy -- Data processing. - Daraltılmış: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroscopy$002b--$002bData$002bprocessing.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ps$003d300?2025-12-28T08:07:33ZQuantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.ent://SD_ILS/0/SD_ILS:4599652025-12-28T08:07:33Z2025-12-28T08:07:33ZYazar Klapetek, Petr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128133477">https://www.sciencedirect.com/science/book/9780128133477</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Exploring scanning probe microscopy with mathematicaent://SD_ILS/0/SD_ILS:3034562025-12-28T08:07:33Z2025-12-28T08:07:33ZYazar Sarid, Dror. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590">http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590</a>
Volltext <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527610068">http://onlinelibrary.wiley.com/book/10.1002/9783527610068</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527610068">http://dx.doi.org/10.1002/9783527610068</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Virtual microscopy and virtual slides in teaching, diagnosis, and researchent://SD_ILS/0/SD_ILS:5373642025-12-28T08:07:33Z2025-12-28T08:07:33ZYazar Gu, Jiang. Ogilvie, Robert W.<br/>Yer Numarası QH211 .V57 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420039306">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Virtual microscopy and virtual slides in teaching, diagnosis, and researchent://SD_ILS/0/SD_ILS:5468662025-12-28T08:07:33Z2025-12-28T08:07:33ZYazar Gu, Jiang. Ogilvie, Robert W.<br/>Yer Numarası QH211 .V57 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420039306">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computed electron micrographs and defect identificationent://SD_ILS/0/SD_ILS:2561602025-12-28T08:07:33Z2025-12-28T08:07:33ZYazar Head, A. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780720417579">http://www.sciencedirect.com/science/book/9780720417579</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>