Arama Sonuçları Microtechnology. - Daraltılmış: Metrology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicrotechnology.$0026qf$003dSUBJECT$002509Konu$002509Metrology.$002509Metrology.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-01-17T01:20:33Z
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:145816
2026-01-17T01:20:33Z
2026-01-17T01:20:33Z
Yazar Leach, R. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
2026-01-17T01:20:33Z
2026-01-17T01:20:33Z
Yazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>