Arama Sonuçları Mohan, Chilukuri K.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMohan$00252C$002bChilukuri$002bK.$0026ic$003dtrue$0026ps$003d300?dt=list2026-06-06T05:33:42ZAnomaly Detection Principles and Algorithmsent://SD_ILS/0/SD_ILS:6131492026-06-06T05:33:42Z2026-06-06T05:33:42ZYazar Mehrotra, Kishan G. author. Mohan, Chilukuri K. author. Huang, HuaMing. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67526-8">https://doi.org/10.1007/978-3-319-67526-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modern Approaches in Applied Intelligence 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 – July 1, 2011, Proceedings, Part Ient://SD_ILS/0/SD_ILS:1948312026-06-06T05:33:42Z2026-06-06T05:33:42ZYazar Mehrotra, Kishan G. editor. Mohan, Chilukuri K. editor. Oh, Jae C. editor. Varshney, Pramod K. editor. Ali, Moonis. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-21822-4">http://dx.doi.org/10.1007/978-3-642-21822-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modern Approaches in Applied Intelligence 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 – July 1, 2011, Proceedings, Part IIent://SD_ILS/0/SD_ILS:1948332026-06-06T05:33:42Z2026-06-06T05:33:42ZYazar Mehrotra, Kishan G. editor. Mohan, Chilukuri K. editor. Oh, Jae C. editor. Varshney, Pramod K. editor. Ali, Moonis. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-21827-9">http://dx.doi.org/10.1007/978-3-642-21827-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>