Arama Sonuçları Mueller, William, M., ed.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMueller$00252C$002bWilliam$00252C$002bM.$00252C$002bed.$0026ps$003d300?dt=list2026-06-01T14:20:17ZMetallographic specimen preparation : optical and electron microscopyent://SD_ILS/0/SD_ILS:177342026-06-01T14:20:17Z2026-06-01T14:20:17ZYazar McCall, James L., ed. Mueller William M., ed.<br/>Yer Numarası TN 690.7 M47 1974<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Microstructural analysis tools and techniquesent://SD_ILS/0/SD_ILS:612662026-06-01T14:20:17Z2026-06-01T14:20:17ZYazar McCall, James L., ed. Mueller, William, M., ed.<br/>Yer Numarası TN 689.2 M53 1973<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>