Arama Sonuçları Nanometrology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dNanometrology.$0026ic$003dtrue$0026ps$003d300?2025-12-16T02:14:07ZHandbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:5420192025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası TA418.7 .W47 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420082029">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:1458162025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Leach, R. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:3557742025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:5450512025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası TA418.7 .W45 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420034196">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.ent://SD_ILS/0/SD_ILS:4599652025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Klapetek, Petr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128133477">https://www.sciencedirect.com/science/book/9780128133477</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturingent://SD_ILS/0/SD_ILS:1762002025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Gao, Wei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-254-4">http://dx.doi.org/10.1007/978-1-84996-254-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Metrology and Applicationsent://SD_ILS/0/SD_ILS:5284222025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of nanophysics. Principles and methodsent://SD_ILS/0/SD_ILS:5441912025-12-16T02:14:07Z2025-12-16T02:14:07ZYazar Sattler, Klaus D.<br/>Yer Numarası QC173.4 .M5 H358 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420075410">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>