Arama Sonuçları Nanostructures -- Measurement.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dNanostructures$002b--$002bMeasurement.$0026ps$003d300?dt=list
2026-01-15T14:58:12Z
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
ent://SD_ILS/0/SD_ILS:459965
2026-01-15T14:58:12Z
2026-01-15T14:58:12Z
Yazar Klapetek, Petr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128133477">https://www.sciencedirect.com/science/book/9780128133477</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Proceedings of the 11th European Conference on Thermoelectrics ECT 2013
ent://SD_ILS/0/SD_ILS:530708
2026-01-15T14:58:12Z
2026-01-15T14:58:12Z
Yazar Amaldi, Andrea. editor. Tang, Francois. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-07332-3">https://doi.org/10.1007/978-3-319-07332-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Silicon heterostructure handbook : materials, fabrication, devices, circuits, and applications of SiGe and Si strained-layer epitaxy
ent://SD_ILS/0/SD_ILS:543505
2026-01-15T14:58:12Z
2026-01-15T14:58:12Z
Yazar Cressler, John D.<br/>Yer Numarası TK7871.96 .B55 S55 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420026580">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>