Arama Sonu&ccedil;lar&#305; Nanotechnology. - Daralt&#305;lm&#305;&#351;: Metrology. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dNanotechnology.$0026qf$003dSUBJECT$002509Konu$002509Metrology.$002509Metrology.$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-25T23:57:13Z Metrology and standardization of nanotechnology : protocols and industrial innovations ent://SD_ILS/0/SD_ILS:424285 2024-11-25T23:57:13Z 2024-11-25T23:57:13Z Yazar&#160;Mansfield, Elisabeth, editor.&#160;Kaiser, Debra L., editor.&#160;Fujita, Daisuke, editor.&#160;Voorde, M. H. van de (Marcel H.), editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamental principles of engineering nanometrology ent://SD_ILS/0/SD_ILS:145816 2024-11-25T23:57:13Z 2024-11-25T23:57:13Z Yazar&#160;Leach, R. K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamental principles of engineering nanometrology ent://SD_ILS/0/SD_ILS:355774 2024-11-25T23:57:13Z 2024-11-25T23:57:13Z Yazar&#160;Leach, R. K.<br/>Yer Numaras&#305;&#160;ONLINE(355774.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a> <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>