Arama Sonuçları Nanotechnology. - Daraltılmış: Weights and measures.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dNanotechnology.$0026qf$003dSUBJECT$002509Konu$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026ic$003dtrue$0026ps$003d300?dt=list
2024-11-25T15:37:42Z
Particle Size Measurements Fundamentals, Practice, Quality
ent://SD_ILS/0/SD_ILS:170410
2024-11-25T15:37:42Z
2024-11-25T15:37:42Z
Yazar Merkus, Henk G. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Vacuum Technology Practice for Scientific Instruments
ent://SD_ILS/0/SD_ILS:187153
2024-11-25T15:37:42Z
2024-11-25T15:37:42Z
Yazar Yoshimura, Nagamitsu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74433-7">http://dx.doi.org/10.1007/978-3-540-74433-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Nanoscale Devices - Fundamentals and Applications
ent://SD_ILS/0/SD_ILS:169377
2024-11-25T15:37:42Z
2024-11-25T15:37:42Z
Yazar Gross, Rudolf. editor. Sidorenko, Anatolie. editor. Tagirov, Lenar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-5107-4">http://dx.doi.org/10.1007/978-1-4020-5107-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
ent://SD_ILS/0/SD_ILS:169412
2024-11-25T15:37:42Z
2024-11-25T15:37:42Z
Yazar Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5258-8">http://dx.doi.org/10.1007/1-4020-5258-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Integrated Chemical Microsensor Systems in CMOS Technology
ent://SD_ILS/0/SD_ILS:181372
2024-11-25T15:37:42Z
2024-11-25T15:37:42Z
Yazar Hierlemann, Andreas. author. Baltes, H. editor. Fujita, Hiroyuki. editor. Liepmann, Dorian. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microscale Diagnostic Techniques
ent://SD_ILS/0/SD_ILS:180737
2024-11-25T15:37:42Z
2024-11-25T15:37:42Z
Yazar Breuer, Kenneth S. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>