Arama Sonu&ccedil;lar&#305; Nondestructive testing. - Daralt&#305;lm&#305;&#351;: Elektronik K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dNondestructive$002btesting.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300? 2024-12-01T10:28:33Z Holographic nondestructive testing ent://SD_ILS/0/SD_ILS:256095 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Erf, Robert K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122413506">http://www.sciencedirect.com/science/book/9780122413506</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nondestructive Testing of Materials and Structures ent://SD_ILS/0/SD_ILS:335698 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;B&uuml;y&uuml;k&ouml;zt&uuml;rk, Oral. author.&#160;Ta&#351;demir, Mehmet Ali. author.&#160;G&uuml;ne&#351;, O&#287;uz. editor.&#160;Akkaya, Y&#305;lmaz. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335698.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-0723-8">http://dx.doi.org/10.1007/978-94-007-0723-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nondestructive testing of food quality ent://SD_ILS/0/SD_ILS:297402 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Irudayaraj, Joseph, 1961-&#160;Reh, Christoph.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0803/2007023792-b.html">http://catdir.loc.gov/catdir/enhancements/fy0803/2007023792-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470388310">http://dx.doi.org/10.1002/9780470388310</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nondestructive testing of deep foundations ent://SD_ILS/0/SD_ILS:296723 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Hertlein, Bernhardt H.&#160;Davis, Allen George.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470034831">http://dx.doi.org/10.1002/0470034831</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook on nondestructive testing of concrete ent://SD_ILS/0/SD_ILS:289528 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Malhotra, V. M.&#160;Carino, Nicholas J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040050">Distributed by publisher. 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(Carlos)&#160;Kulcsar, P. (Pablo)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444897916">http://www.sciencedirect.com/science/book/9780444897916</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Non-destructive testing proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam, the Netherlands, April 23-28, 1989 ent://SD_ILS/0/SD_ILS:256113 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;World Conference on Non-Destructive Testing (12th : 1989 : Amsterdam, Netherlands)&#160;Boogaard, J.&#160;Dijk, G. M. van.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444874504">http://www.sciencedirect.com/science/book/9780444874504</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Emerging technologies in non-destructive testing V proceedings of the fifth Conference on Emerging Technologies in NDT, Ioannina, Greece, 19-21 September 2011 ent://SD_ILS/0/SD_ILS:290067 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;International Conference on Emerging Technologies in Non Destructive Testing (5th : 2011 : Ioannina, Greece)&#160;Paipetis, Alkis.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203114452">Distributed by publisher. 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E. (Xavier Emanuel), 1968-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780340676486">http://www.sciencedirect.com/science/book/9780340676486</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural health monitoring of aerospace composites ent://SD_ILS/0/SD_ILS:364054 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Giurgiutiu, Victor, author.<br/>Yer Numaras&#305;&#160;ONLINE(364054.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124096059">http://www.sciencedirect.com/science/book/9780124096059</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications ent://SD_ILS/0/SD_ILS:518392 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Liu, Zheng. editor.&#160;Ukida, Hiroyuki. editor.&#160;Ramuhalli, Pradeep. editor.&#160;Niel, Kurt. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(518392.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Heat exchanger design handbook ent://SD_ILS/0/SD_ILS:290849 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Kuppan, T., 1957-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439842133">Distributed by publisher. 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(Herfried)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444824769">http://www.sciencedirect.com/science/book/9780444824769</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electronics reliability and measurement technology nondestructive evaluation ent://SD_ILS/0/SD_ILS:254151 2024-12-01T10:28:33Z 2024-12-01T10:28:33Z Yazar&#160;Heyman, Joseph S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>