Arama Sonuçları Operating. - Daraltılmış: Systems engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dOperating.$0026qf$003dSUBJECT$002509Konu$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ps$003d300$0026isd$003dtrue?
2024-12-12T23:10:36Z
Sistem ve network mühendisliği
ent://SD_ILS/0/SD_ILS:514249
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Yazar Kırbaş, Kayhan.<br/>Yer Numarası QA76.76.O63 K463 2021<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
ent://SD_ILS/0/SD_ILS:401348
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Hardware Trojan War Attacks, Myths, and Defenses
ent://SD_ILS/0/SD_ILS:400849
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Bhunia, Swarup. editor. Tehranipoor, Mark M. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-68511-3">https://doi.org/10.1007/978-3-319-68511-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
ent://SD_ILS/0/SD_ILS:401188
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Kochs, Hans-Dieter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-64991-7">https://doi.org/10.1007/978-3-319-64991-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Low-Power Design and Power-Aware Verification
ent://SD_ILS/0/SD_ILS:402053
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Khondkar, Progyna. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-66619-8">https://doi.org/10.1007/978-3-319-66619-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Dependable Multicore Architectures at Nanoscale
ent://SD_ILS/0/SD_ILS:402190
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Ottavi, Marco. editor. Gizopoulos, Dimitris. editor. Pontarelli, Salvatore. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-54422-9">https://doi.org/10.1007/978-3-319-54422-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fault-Tolerant Design
ent://SD_ILS/0/SD_ILS:331297
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Dubrova, Elena. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331297.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-2113-9">http://dx.doi.org/10.1007/978-1-4614-2113-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design, Analysis and Test of Logic Circuits Under Uncertainty
ent://SD_ILS/0/SD_ILS:335669
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test and Diagnosis for Small-Delay Defects
ent://SD_ILS/0/SD_ILS:173108
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Predictive Technology Model for Robust Nanoelectronic Design
ent://SD_ILS/0/SD_ILS:173686
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Cao, Yu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0445-3">http://dx.doi.org/10.1007/978-1-4614-0445-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI 2010 Annual Symposium Selected papers
ent://SD_ILS/0/SD_ILS:206081
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Voros, Nikolaos. editor. Mukherjee, Amar. editor. Sklavos, Nicolas. editor. Masselos, Konstantinos. editor. Huebner, Michael. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-1488-5">http://dx.doi.org/10.1007/978-94-007-1488-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Soft Errors in Modern Electronic Systems
ent://SD_ILS/0/SD_ILS:172744
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Nicolaidis, Michael. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
ent://SD_ILS/0/SD_ILS:205032
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-3282-9">http://dx.doi.org/10.1007/978-90-481-3282-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software-Implemented Hardware Fault Tolerance
ent://SD_ILS/0/SD_ILS:165890
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2024-12-12T23:10:36Z
Yazar Goloubeva, Olga. author. Rebaudengo, Maurizio. author. Reorda, Matteo Sonza. author. Violante, Massimo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32937-4">http://dx.doi.org/10.1007/0-387-32937-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Gizopoulos / Advances in ElectronicTesting
ent://SD_ILS/0/SD_ILS:165642
2024-12-12T23:10:36Z
2024-12-12T23:10:36Z
Yazar Gizopoulos, Dimitris. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>