Arama Sonuçları Optical Metrology.
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Optical metrology
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Yazar Gåsvik, Kjell J. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical metrology
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Yazar Gåsvik, Kjell J.<br/>Yer Numarası ONLINE(318819.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
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Table of contents <a href="http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html">http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
INTRODUCTION TO OPTICAL METROLOGY
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Yazar Sirohi, R. S.<br/>Yer Numarası QC367<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003531845">https://www.taylorfrancis.com/books/9781003531845</a>
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Handbook of optical dimensional metrology
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Yazar Harding, Kevin G.<br/>Yer Numarası T50 .H268 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439854822">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical imaging and metrology advanced technologies
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Yazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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Handbook of optical metrology : principles and applications
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Yazar Yoshizawa, Toru, 1939-<br/>Yer Numarası QC367 .H36 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019513">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Biophotonics, Nanofabrication, Optical Metrology and Nonlinear and Ultrafast Photonics Proceedings of PHOTONICS 2023, Volume 3
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Yazar Prakash, Jaya. editor. Basu, Jaydeep Kumar. editor. Mukherjee, Sebabrata. editor. Chandrashekar, C. M. editor. (orcid)0000-0003-4820-2317 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-7917-8">https://doi.org/10.1007/978-981-97-7917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
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Yazar Osten, Wolfgang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
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Yazar Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Yer Numarası ONLINE(342225.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
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Handbook of 3D machine vision : optical metrology and imaging
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Yazar Song, Zhang.<br/>Yer Numarası TK8315 .H36 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439872208">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
A practical guide to optical metrology for thin films
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Yazar Quinten, Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
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Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
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Yazar Proulx, Tom. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe 2009 6th International Workshop on Advanced Optical Metrology
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Yazar Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Metrology Select Proceedings of AdMet 2024
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Yazar Yadav, Sanjay. editor. Garg, Naveen. editor. Kumar, Mukesh. editor. Aggarwal, Shankar G. editor. Jaiswal, Shiv Kumar. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-96-6418-4">https://doi.org/10.1007/978-981-96-6418-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology and Measurement Uncertainty Concepts and Applications
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Yazar Novellino do Rosario, Pedro Paulo. author. Mendes, Alexandre. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-82303-9">https://doi.org/10.1007/978-3-031-82303-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Dynamic Environments Testing, Volume 7 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
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Yazar Harvie, Julie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34930-0">https://doi.org/10.1007/978-3-031-34930-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Manufacturing IV Volume 4 - Measurement and Control Systems: Digitalization, Sustainability and Industry Applications
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Yazar Diering, Magdalena. editor. Wieczorowski, Michał. editor. (orcid)0000-0001-7526-8368 Harugade, Mukund. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-56467-3">https://doi.org/10.1007/978-3-031-56467-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Vision & Laser Vibrometry, Volume 6 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
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Yazar Baqersad, Javad. editor. Di Maio, Dario. editor. (orcid)0000-0002-5794-4702 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34910-2">https://doi.org/10.1007/978-3-031-34910-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Metrology and Applications
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Yazar Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
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Yazar Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04098-6">https://doi.org/10.1007/978-3-031-04098-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The new International System of Units (SI) : quantum metrology and quantum standards
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Yazar Göbel, Ernst O., author. Siegner, Uwe, author.<br/>Yer Numarası QC91 .G63 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527814480">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527814480</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
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Yazar Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576
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Yazar Denkena, Berend. editor. Rienäcker, Adrian. editor. Knoll, Gunter. editor. Bach, Friedrich-Wilhelm. editor. Maier, Hans Jürgen. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09692-6">https://doi.org/10.1007/978-3-319-09692-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Large and middle-scale aperture aspheric surfaces : lapping, polishing and measurement
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Yazar Li, Shengyi. Dai, Yifan.<br/>Yer Numarası TS517.5 .A86<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118537503">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118537503</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
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Yazar Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Yer Numarası ONLINE(342196.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of photonics for biomedical science
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Yazar Tuchin, V. V. (Valerii Viktorovich)<br/>Yer Numarası R857 .O6 H366 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439806296">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of semiconductor manufacturing technology
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Yazar Doering, Robert, 1946- Nishi, Yoshio, 1940-<br/>Yer Numarası TK7871.85 .H3335 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid-state lasers and applications
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Yazar Sennaroglu, Alphan.<br/>Yer Numarası TA1705 .S6748 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222059">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microlithography : science and technology
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Yazar Suzuki, Kazuaki. Smith, Bruce W., 1959-<br/>Yer Numarası TK7836 .M525 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420051537">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical inspection of microsystems
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Yazar Osten, Wolfgang.<br/>Yer Numarası TS156.2 .O652 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of photomask manufacturing technology
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Yazar Rizvi, Syed.<br/>Yer Numarası TK7872 .M3 H36 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420028782">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Laser Technology and Applications (Three- Volume Set).
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Yazar Taylor and Francis.<br/>Yer Numarası TA1675 .H363 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/e/9781420050530">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of optical engineering
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Yazar Malacara, Daniel, 1937- Thompson, Brian J.<br/>Yer Numarası TA1520 .H368 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135556525">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of silicon semiconductor metrology
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Yazar Diebold, A. C. (Alain C.)<br/>Yer Numarası TK7871.85 .H3337 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Assessment of Oral Health : Diagnostic Techniques and Validation Criteria
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Yazar Faller, R.V., editor.<br/>Yer Numarası XX(548684.1)<br/>Elektronik Erişim <a href="https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3">https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>