Arama Sonuçları Optical measurements. - Daraltılmış: Interferometry.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dOptical$002bmeasurements.$0026qf$003dSUBJECT$002509Konu$002509Interferometry.$002509Interferometry.$0026te$003dILS$0026ps$003d300?dt=list
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Fringe pattern analysis for optical metrology : theory, algorithms, and applications
ent://SD_ILS/0/SD_ILS:342225
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Yazar Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Yer Numarası ONLINE(342225.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a>
MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical shop testing
ent://SD_ILS/0/SD_ILS:296984
2024-12-23T08:45:44Z
2024-12-23T08:45:44Z
Yazar Malacara, Daniel, 1937- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470135976">http://dx.doi.org/10.1002/9780470135976</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Interferogram analysis for optical testing
ent://SD_ILS/0/SD_ILS:288501
2024-12-23T08:45:44Z
2024-12-23T08:45:44Z
Yazar Malacara, Daniel, 1937- Servn̕, Manuel. Malacara, Zacarias, 1948-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420027273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>