Arama Sonu&ccedil;lar&#305; Particles (Nuclear physics) - Daralt&#305;lm&#305;&#351;: Chemistry. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dParticles$002b$002528Nuclear$002bphysics$002529$0026qf$003dSUBJECT$002509Konu$002509Chemistry.$002509Chemistry.$0026ic$003dtrue$0026ps$003d300?dt=list 2024-11-27T01:04:00Z Surface and Interface Analysis An Electrochemists Toolbox ent://SD_ILS/0/SD_ILS:185266 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Holze, Rudolf. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:188564 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. author.&#160;Fuchs, Harald. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:188568 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Biophysics and the Challenges of Emerging Threats ent://SD_ILS/0/SD_ILS:204768 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Puglisi, Joseph D. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-2368-1">http://dx.doi.org/10.1007/978-90-481-2368-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Batteries Materials Science Aspects ent://SD_ILS/0/SD_ILS:167334 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Huggins, Robert A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-76424-5">http://dx.doi.org/10.1007/978-0-387-76424-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solid State Gas Sensing ent://SD_ILS/0/SD_ILS:164739 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Comini, Elisabetta. editor.&#160;Faglia, Guido. editor.&#160;Sberveglieri, Giorgio. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-09665-0">http://dx.doi.org/10.1007/978-0-387-09665-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Conducting Polymers A New Era in Electrochemistry ent://SD_ILS/0/SD_ILS:187539 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Inzelt, Gy&ouml;rgy. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-75930-0">http://dx.doi.org/10.1007/978-3-540-75930-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Nanocrystal Quantum Dots Synthesis, Assembly, Spectroscopy and Applications ent://SD_ILS/0/SD_ILS:177039 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Rogach, Andrey L. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-211-75237-1">http://dx.doi.org/10.1007/978-3-211-75237-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:186997 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Fultz, Brent. author.&#160;Howe, James M. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:187050 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;Tomitori, Masahiko. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods IX Characterization ent://SD_ILS/0/SD_ILS:187051 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Tomitori, Masahiko. editor.&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods X Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:187052 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Tomitori, Masahiko. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Cryogenic Mixed Refrigerant Processes ent://SD_ILS/0/SD_ILS:167589 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Gadhiraju, Venkatarathnam. author.&#160;Timmerhaus, Klaus D. editor.&#160;Rizzuto, Carlo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-78514-1">http://dx.doi.org/10.1007/978-0-387-78514-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Square-Wave Voltammetry Theory and Application ent://SD_ILS/0/SD_ILS:186949 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Mirceski, Valentin. author.&#160;Komorsky-Lovric, Sebojka. author.&#160;Lovric, Milivoj. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73740-7">http://dx.doi.org/10.1007/978-3-540-73740-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Physics of Zero- and One-Dimensional Nanoscopic Systems ent://SD_ILS/0/SD_ILS:186608 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Karmakar, Sachindra Nath. editor.&#160;Maiti, Santanu Kumar. editor.&#160;Chowdhury, Jayeeta. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-72632-6">http://dx.doi.org/10.1007/978-3-540-72632-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:184523 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods VI Characterization ent://SD_ILS/0/SD_ILS:184524 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods VII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:184525 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Optics ent://SD_ILS/0/SD_ILS:184678 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Klingshirn, Claus. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-38347-5">http://dx.doi.org/10.1007/978-3-540-38347-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Thermotropic Liquid Crystals Recent Advances ent://SD_ILS/0/SD_ILS:169445 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Ramamoorthy, Ayyalusamy. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-5354-1">http://dx.doi.org/10.1007/1-4020-5354-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale ent://SD_ILS/0/SD_ILS:165534 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Kalinin, Sergei. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of Nanoscale Film Analysis ent://SD_ILS/0/SD_ILS:165623 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Alford, Terry L. author.&#160;Feldman, Leonard C. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science ent://SD_ILS/0/SD_ILS:166225 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Lang, Sidney B. author.&#160;Chan, Helen L. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-38039-1">http://dx.doi.org/10.1007/978-0-387-38039-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:166500 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Hawkes, Peter W. editor.&#160;Spence, John C. H. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:181412 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods III Characterization ent://SD_ILS/0/SD_ILS:181079 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Scanning Probe Methods IV Industrial Applications ent://SD_ILS/0/SD_ILS:181082 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Metalle Struktur und Eigenschaften der Metalle und Legierungen ent://SD_ILS/0/SD_ILS:183904 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Hornbogen, Erhard. author.&#160;Warlimont, Hans. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-540-34011-4">http://dx.doi.org/10.1007/3-540-34011-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Practical X-Ray Fluorescence Analysis ent://SD_ILS/0/SD_ILS:184419 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Beckhoff, Burkhard. editor.&#160;Kanngie&szlig;er, habil. Birgit. editor.&#160;Langhoff, Norbert. editor.&#160;Wedell, Reiner. editor.&#160;Wolff, Helmut. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-36722-2">http://dx.doi.org/10.1007/978-3-540-36722-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nanoscale Transistors Device Physics, Modeling and Simulation ent://SD_ILS/0/SD_ILS:165457 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Lundstrom, Mark S. author.&#160;Guo, Jing. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solid State NMR Spectroscopy for Biopolymers Principles and Applications ent://SD_ILS/0/SD_ILS:169139 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Sait&ocirc;, Hazime. author.&#160;Ando, Isao. author.&#160;Naito, Akira. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-4303-1">http://dx.doi.org/10.1007/1-4020-4303-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Planewaves, Pseudopotentials and the LAPW Method ent://SD_ILS/0/SD_ILS:165667 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Singh, David J. author.&#160;Nordstr&ouml;m, Lars. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29684-5">http://dx.doi.org/10.1007/978-0-387-29684-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents ent://SD_ILS/0/SD_ILS:166196 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Foster, Adam. author.&#160;Hofer, Werner. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Optics ent://SD_ILS/0/SD_ILS:181030 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Klingshirn, Claus. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138175">http://dx.doi.org/10.1007/b138175</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Half-metallic Alloys Fundamentals and Applications ent://SD_ILS/0/SD_ILS:182698 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Galanakis, I. editor.&#160;Dederichs, P.H. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b137760">http://dx.doi.org/10.1007/b137760</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11&ndash;14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:182995 2024-11-27T01:04:00Z 2024-11-27T01:04:00Z Yazar&#160;Cullis, A. G. editor.&#160;Hutchison, J. 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