Arama Sonuçları Particles (Nuclear physics) - Daraltılmış: Chemistry.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dParticles$002b$002528Nuclear$002bphysics$002529$0026qf$003dSUBJECT$002509Konu$002509Chemistry.$002509Chemistry.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list
2024-11-23T10:37:35Z
Solid State Gas Sensing
ent://SD_ILS/0/SD_ILS:164739
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Yazar Comini, Elisabetta. editor. Faglia, Guido. editor. Sberveglieri, Giorgio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-09665-0">http://dx.doi.org/10.1007/978-0-387-09665-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced Batteries Materials Science Aspects
ent://SD_ILS/0/SD_ILS:167334
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Yazar Huggins, Robert A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-76424-5">http://dx.doi.org/10.1007/978-0-387-76424-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Biophysics and the Challenges of Emerging Threats
ent://SD_ILS/0/SD_ILS:204768
2024-11-23T10:37:35Z
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Yazar Puglisi, Joseph D. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2368-1">http://dx.doi.org/10.1007/978-90-481-2368-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Surface and Interface Analysis An Electrochemists Toolbox
ent://SD_ILS/0/SD_ILS:185266
2024-11-23T10:37:35Z
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Yazar Holze, Rudolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
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Yazar Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
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Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Cryogenic Mixed Refrigerant Processes
ent://SD_ILS/0/SD_ILS:167589
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Yazar Gadhiraju, Venkatarathnam. author. Timmerhaus, Klaus D. editor. Rizzuto, Carlo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-78514-1">http://dx.doi.org/10.1007/978-0-387-78514-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Nanocrystal Quantum Dots Synthesis, Assembly, Spectroscopy and Applications
ent://SD_ILS/0/SD_ILS:177039
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Yazar Rogach, Andrey L. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-75237-1">http://dx.doi.org/10.1007/978-3-211-75237-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:186997
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Yazar Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
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Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IX Characterization
ent://SD_ILS/0/SD_ILS:187051
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Yazar Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:187052
2024-11-23T10:37:35Z
2024-11-23T10:37:35Z
Yazar Bhushan, Bharat. editor. Tomitori, Masahiko. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Conducting Polymers A New Era in Electrochemistry
ent://SD_ILS/0/SD_ILS:187539
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Yazar Inzelt, György. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-75930-0">http://dx.doi.org/10.1007/978-3-540-75930-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of Nanoscale Film Analysis
ent://SD_ILS/0/SD_ILS:165623
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Yazar Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Thermotropic Liquid Crystals Recent Advances
ent://SD_ILS/0/SD_ILS:169445
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Yazar Ramamoorthy, Ayyalusamy. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5354-1">http://dx.doi.org/10.1007/1-4020-5354-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Science of Microscopy
ent://SD_ILS/0/SD_ILS:166500
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Yazar Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
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Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
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2024-11-23T10:37:35Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
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Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Square-Wave Voltammetry Theory and Application
ent://SD_ILS/0/SD_ILS:186949
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Yazar Mirceski, Valentin. author. Komorsky-Lovric, Sebojka. author. Lovric, Milivoj. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73740-7">http://dx.doi.org/10.1007/978-3-540-73740-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
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Yazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
ent://SD_ILS/0/SD_ILS:166225
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Yazar Lang, Sidney B. author. Chan, Helen L. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-38039-1">http://dx.doi.org/10.1007/978-0-387-38039-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:184678
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Yazar Klingshirn, Claus. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-38347-5">http://dx.doi.org/10.1007/978-3-540-38347-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Physics of Zero- and One-Dimensional Nanoscopic Systems
ent://SD_ILS/0/SD_ILS:186608
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Yazar Karmakar, Sachindra Nath. editor. Maiti, Santanu Kumar. editor. Chowdhury, Jayeeta. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72632-6">http://dx.doi.org/10.1007/978-3-540-72632-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Nanoscale Transistors Device Physics, Modeling and Simulation
ent://SD_ILS/0/SD_ILS:165457
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Yazar Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
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Yazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid State NMR Spectroscopy for Biopolymers Principles and Applications
ent://SD_ILS/0/SD_ILS:169139
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Yazar Saitô, Hazime. author. Ando, Isao. author. Naito, Akira. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-4303-1">http://dx.doi.org/10.1007/1-4020-4303-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Planewaves, Pseudopotentials and the LAPW Method
ent://SD_ILS/0/SD_ILS:165667
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Yazar Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-29684-5">http://dx.doi.org/10.1007/978-0-387-29684-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
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Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-11-23T10:37:35Z
2024-11-23T10:37:35Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Practical X-Ray Fluorescence Analysis
ent://SD_ILS/0/SD_ILS:184419
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Yazar Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-36722-2">http://dx.doi.org/10.1007/978-3-540-36722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-11-23T10:37:35Z
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Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metalle Struktur und Eigenschaften der Metalle und Legierungen
ent://SD_ILS/0/SD_ILS:183904
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Yazar Hornbogen, Erhard. author. Warlimont, Hans. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-34011-4">http://dx.doi.org/10.1007/3-540-34011-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Thin Films and Heterostructures for Oxide Electronics
ent://SD_ILS/0/SD_ILS:165225
2024-11-23T10:37:35Z
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Yazar Ogale, Satischandra B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electron Scattering From Atoms, Molecules, Nuclei, and Bulk Matter
ent://SD_ILS/0/SD_ILS:165394
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Yazar Whelan, Colm T. editor. Mason, Nigel J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-27567-3">http://dx.doi.org/10.1007/0-387-27567-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
ent://SD_ILS/0/SD_ILS:182995
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Yazar Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of Powder Diffraction and Structural Characterization of Materials
ent://SD_ILS/0/SD_ILS:165065
2024-11-23T10:37:35Z
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Yazar Pecharsky, Vitalij K. author. Zavalij, Peter Y. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b106242">http://dx.doi.org/10.1007/b106242</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:181030
2024-11-23T10:37:35Z
2024-11-23T10:37:35Z
Yazar Klingshirn, Claus. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138175">http://dx.doi.org/10.1007/b138175</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Half-metallic Alloys Fundamentals and Applications
ent://SD_ILS/0/SD_ILS:182698
2024-11-23T10:37:35Z
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Yazar Galanakis, I. editor. Dederichs, P.H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b137760">http://dx.doi.org/10.1007/b137760</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>