Arama Sonu&ccedil;lar&#305; Physics. - Daralt&#305;lm&#305;&#351;: System safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dPhysics.$0026qf$003dSUBJECT$002509Konu$002509System$002bsafety.$002509System$002bsafety.$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-28T19:10:02Z Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332682.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis (More Physics for Presidents) ent://SD_ILS/0/SD_ILS:205282 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-8667-9">http://dx.doi.org/10.1007/978-90-481-8667-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Suhir, E. editor.&#160;Lee, Y. C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nuclear Power and Energy Security ent://SD_ILS/0/SD_ILS:205099 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Apikyan, Samuel A. editor.&#160;Diamond, David J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3504-2">http://dx.doi.org/10.1007/978-90-481-3504-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance ent://SD_ILS/0/SD_ILS:402462 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Gheorghe, Adrian V. author.&#160;Vamanu, Dan V. author.&#160;Katina, Polinpapilinho F. author.&#160;Pulfer, Roland. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-69224-1">https://doi.org/10.1007/978-3-319-69224-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Homomorphic Encryption and Applications ent://SD_ILS/0/SD_ILS:485761 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Yi, Xun. author.&#160;Paulet, Russell. author.&#160;Bertino, Elisa. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-12229-8">https://doi.org/10.1007/978-3-319-12229-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation ent://SD_ILS/0/SD_ILS:330843 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Sabbagh, Harold A. author.&#160;Murphy, R. Kim. author.&#160;Sabbagh, Elias H. author.&#160;Aldrin, John C. author.&#160;Knopp, Jeremy S. author.<br/>Yer Numaras&#305;&#160;ONLINE(330843.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8429-6">http://dx.doi.org/10.1007/978-1-4419-8429-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations ent://SD_ILS/0/SD_ILS:331121 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Finkelstein, Maxim. author.&#160;Cha, Ji Hwan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331121.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of Space Business and Economics ent://SD_ILS/0/SD_ILS:332091 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Gurtuna, Ozgur. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332091.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6696-3">http://dx.doi.org/10.1007/978-1-4614-6696-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:332097 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Rabinovich, Semyon G. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332097.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6717-5">http://dx.doi.org/10.1007/978-1-4614-6717-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electromigration Modeling at Circuit Layout Level ent://SD_ILS/0/SD_ILS:336507 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Tan, Cher Ming. author.&#160;He, Feifei. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(336507.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-981-4451-21-5">http://dx.doi.org/10.1007/978-981-4451-21-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quantitatives Entwicklungsmanagement Modellbasierte Analyse von Produktentwicklungsprozessen ent://SD_ILS/0/SD_ILS:337101 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Hahn, Axel. author.&#160;H&auml;usler, Stefan. author.&#160;gro&szlig;e Austing, Stephan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(337101.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34510-4">http://dx.doi.org/10.1007/978-3-642-34510-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality Management in Reverse Logistics A Broad Look on Quality Issues and Their Interaction with Closed-Loop Supply Chains ent://SD_ILS/0/SD_ILS:331003 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Nikolaidis, Yiannis. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331003.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4537-0">http://dx.doi.org/10.1007/978-1-4471-4537-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Managing the Continuum: Certainty, Uncertainty, Unpredictability in Large Engineering Projects ent://SD_ILS/0/SD_ILS:335615 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Caron, Franco. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335615.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-88-470-5244-4">http://dx.doi.org/10.1007/978-88-470-5244-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday ent://SD_ILS/0/SD_ILS:331109 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Dohi, Tadashi. editor.&#160;Nakagawa, Toshio. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331109.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Technical Diagnostics Fundamentals and Application to Structures and Systems ent://SD_ILS/0/SD_ILS:333141 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Czichos, Horst. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333141.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25850-3">http://dx.doi.org/10.1007/978-3-642-25850-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ship and Offshore Structure Design in Climate Change Perspective ent://SD_ILS/0/SD_ILS:333805 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Bitner-Gregersen, Elzbieta Maria. author.&#160;Eide, Lars Ingolf. author.&#160;H&oslash;rte, Torfinn. author.&#160;Skjong, Rolf. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333805.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34138-0">http://dx.doi.org/10.1007/978-3-642-34138-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to Risk and Uncertainty in Hydrosystem Engineering ent://SD_ILS/0/SD_ILS:336085 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Goodarzi, Ehsan. author.&#160;Ziaei, Mina. author.&#160;Teang Shui, Lee. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(336085.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-5851-3">http://dx.doi.org/10.1007/978-94-007-5851-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Measurement Uncertainties Physical Parameters and Calibration of Instruments ent://SD_ILS/0/SD_ILS:194552 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Gupta, S. V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20989-5">http://dx.doi.org/10.1007/978-3-642-20989-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Quality of Measurements A Metrological Reference ent://SD_ILS/0/SD_ILS:173951 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Fridman, A.E. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1478-0">http://dx.doi.org/10.1007/978-1-4614-1478-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of Mass Determination ent://SD_ILS/0/SD_ILS:191843 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Borys, Michael. author.&#160;Schwartz, Roman. author.&#160;Reichmuth, Arthur. author.&#160;Nater, Roland. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11937-8">http://dx.doi.org/10.1007/978-3-642-11937-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Springer Handbook of Metrology and Testing ent://SD_ILS/0/SD_ILS:193364 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Czichos, Horst. editor.&#160;Saito, Tetsuya. editor.&#160;Smith, Leslie. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> European Perspectives on Security Research ent://SD_ILS/0/SD_ILS:193832 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Thoma, Klaus. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-18219-8">http://dx.doi.org/10.1007/978-3-642-18219-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials Proceedings of the IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials, held in Freiberg, Germany, September 1-4, 2009 ent://SD_ILS/0/SD_ILS:205621 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Kuna, Meinhard. editor.&#160;Ricoeur, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9887-0">http://dx.doi.org/10.1007/978-90-481-9887-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Vulnerable Systems ent://SD_ILS/0/SD_ILS:168560 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Kr&ouml;ger, Wolfgang. author.&#160;Zio, Enrico. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-655-9">http://dx.doi.org/10.1007/978-0-85729-655-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Towards Estimating Entrainment Fraction for Dust Layers ent://SD_ILS/0/SD_ILS:174242 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Ural, Erdem A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3372-9">http://dx.doi.org/10.1007/978-1-4614-3372-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety of VVER-440 Reactors Barriers Against Fission Products Release ent://SD_ILS/0/SD_ILS:176246 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Sluge&#328;, Vladim&iacute;r. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-420-3">http://dx.doi.org/10.1007/978-1-84996-420-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> FORMS/FORMAT 2010 Formal Methods for Automation and Safety in Railway and Automotive Systems ent://SD_ILS/0/SD_ILS:192596 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Schnieder, Eckehard. editor.&#160;Tarnai, Geza. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14261-1">http://dx.doi.org/10.1007/978-3-642-14261-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:172252 2024-11-28T19:10:02Z 2024-11-28T19:10:02Z Yazar&#160;Rabinovich, Semyon G. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-1456-9">http://dx.doi.org/10.1007/978-1-4419-1456-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Complex System Reliability Multichannel Systems 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