Arama Sonuçları Pineda de Gyvez, José. - Daraltılmış: Elektronik KütüphaneSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dPineda$002bde$002bGyvez$00252C$002bJos$0025C3$0025A9.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300?2025-01-19T02:12:49ZIntegrated circuit manufacturability the art of process and design integrationent://SD_ILS/0/SD_ILS:2496342025-01-19T02:12:49Z2025-01-19T02:12:49ZYazar Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibrationent://SD_ILS/0/SD_ILS:2055722025-01-19T02:12:49Z2025-01-19T02:12:49ZYazar Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Editionent://SD_ILS/0/SD_ILS:1663512025-01-19T02:12:49Z2025-01-19T02:12:49ZYazar Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-46547-2">http://dx.doi.org/10.1007/0-387-46547-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>