Arama Sonuçları Probability - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dProbability$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300?2026-01-21T06:27:37ZProbability, statistics, reliability for engineersent://SD_ILS/0/SD_ILS:751892026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Ayyub, Bilal M. McCuen, Richard H., 1941-<br/>Yer Numarası TA 330 A99 1997<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:3129152026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Yer Numarası ONLINE(312915.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mechanical reliability improvement : probability and statistics for experimental testingent://SD_ILS/0/SD_ILS:5412972026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Little, R. E. (Robert Eugene), 1933- Kosikowski, D. M.<br/>Yer Numarası TA169 L778 2003<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:2987812026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Natvig, Bent, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modeling, prediction, and optimizationent://SD_ILS/0/SD_ILS:3003372026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied life data analysisent://SD_ILS/0/SD_ILS:3002482026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Nelson, Wayne, 1936- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and manufacturing practices for performability engineeringent://SD_ILS/0/SD_ILS:6001022026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Chaturvedi, Sanjay K., editor. Gargama, Heeralal, editor. Rai, Rajiv N., editor.<br/>Yer Numarası TS171 .D47 2025<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis of modern power systemsent://SD_ILS/0/SD_ILS:5990182026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Yer Numarası TA169 .S234 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>What every engineer should know about reliability and risk analysisent://SD_ILS/0/SD_ILS:5656372026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Modarres, M. (Mohammad), author. Groth, Katrina, author.<br/>Yer Numarası TA169 .M63 2023<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and maintenance modeling with optimization : advances and applicationsent://SD_ILS/0/SD_ILS:5624462026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Kimura, Mitsutaka, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095231">https://www.taylorfrancis.com/books/9781003095231</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>What every engineer should know about risk engineering and managementent://SD_ILS/0/SD_ILS:5812432026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Wang, John X., 1962- author.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003371014">https://www.taylorfrancis.com/books/9781003371014</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Physics-Of-Healthy in Mechatronics.ent://SD_ILS/0/SD_ILS:5981462026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.<br/>Yer Numarası TA169 .E515 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applicationsent://SD_ILS/0/SD_ILS:5974472026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Zio, Enrico, author. Li, Yan-Fu, author.<br/>Yer Numarası TA169 .Z57 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability of maintained systems subjected to wear failure mechanisms : theory and applicationsent://SD_ILS/0/SD_ILS:5952402026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Bayle, Franck, author.<br/>Yer Numarası TA169<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dynamic system reliability : modelling and analysis of dynamic and dependent behaviorsent://SD_ILS/0/SD_ILS:5952892026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Xing, Liudong, author. Levitin, Gregory, author. Wang, Chaonan, 1986- author.<br/>Yer Numarası TA169 .X56 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structural reliability analysis and predictionent://SD_ILS/0/SD_ILS:5938072026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Melchers, R. E. (Robert E.), 1945- author. Beck, André T., author.<br/>Yer Numarası TA656.5 .M45 2018<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:5937282026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Yer Numarası TA169.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:3420102026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Gunawan, Indra.<br/>Yer Numarası ONLINE(342010.1)<br/>Elektronik Erişim Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering and economicsent://SD_ILS/0/SD_ILS:5457262026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Ayyub, Bilal M., author.<br/>Yer Numarası T174.5 .A99 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466518261">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design decisions under uncertainty with limited informationent://SD_ILS/0/SD_ILS:5442702026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Nikolaidis, Efstratios, author. Mourelatos, Zissimos P. Pandey, Vijitashwa.<br/>Yer Numarası TA174 .N55 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781136853296">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:3638772026-01-21T06:27:37Z2026-01-21T06:27:37ZYazar Modarres, M. (Mohammad) Kaminskiy, Mark, 1946- Krivtsov, Vasiliy, 1963-<br/>Yer Numarası TA169 M627 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>