Arama Sonuçları Quality Control - Daraltılmış: Electronic circuits.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dQuality$002bControl$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ic$003dtrue$0026ps$003d300?2025-12-10T10:16:49ZReliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:4829352025-12-10T10:16:49Z2025-12-10T10:16:49ZYazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112025-12-10T10:16:49Z2025-12-10T10:16:49ZYazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineeringent://SD_ILS/0/SD_ILS:5306152025-12-10T10:16:49Z2025-12-10T10:16:49ZYazar Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Bias Temperature Instability for Devices and Circuitsent://SD_ILS/0/SD_ILS:4847552025-12-10T10:16:49Z2025-12-10T10:16:49ZYazar Grasser, Tibor. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>