Arama Sonuçları Quality control. - Daraltılmış: 1993SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dQuality$002bcontrol.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091993$0025091993$0026ps$003d300?dt=list2024-11-22T12:29:23ZQuality control and applied statistics.ent://SD_ILS/0/SD_ILS:2280362024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Executive Sciences Institute.<br/>Yer Numarası ALFABETİK V.17 1972<br/>Format: Devam Eden Süreli Yayınlar Diğer<br/>Durum Beytepe Kütüphanesi~11 ~0<br/>Quality control in analytical chemistryent://SD_ILS/0/SD_ILS:1097502024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Kateman, G. Buydens, L., 1955-<br/>Yer Numarası QD75.4.Q34 K38 1993<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~1<br/>Quality control in the pharmaceutical industryent://SD_ILS/0/SD_ILS:492362024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Cooper, Murray S. ed.<br/>Yer Numarası QV 704 QUA 1972- V.1 1.K<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~2<br/>Quality control in the food industryent://SD_ILS/0/SD_ILS:552652024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Herschdoerfer, S. M.<br/>Yer Numarası TP 370 H47 1967<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Molecular biology and pathology a guidebook for quality controlent://SD_ILS/0/SD_ILS:2511562024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Farkas, Daniel H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122491009">http://www.sciencedirect.com/science/book/9780122491009</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992ent://SD_ILS/0/SD_ILS:2562732024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444899088">http://www.sciencedirect.com/science/book/9780444899088</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of sensory optimizationent://SD_ILS/0/SD_ILS:2959902024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Gacula, Maximo C. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470385012">http://dx.doi.org/10.1002/9780470385012</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Türk-Alman Sempozyumu : Kalite Güvenliği ve Uluslararası Standartlar : Açılış konuşmaları, bildiriler, panel 22-23.11.1990, İstanbul = Türkish-Deutsches Symposium : Qualitatssicherung und Internationale Normen : Ansprachen, Vortrage, Podiumsdiskussionent://SD_ILS/0/SD_ILS:740922024-11-22T12:29:23Z2024-11-22T12:29:23ZYazar Kalite Güvenliği ve Uluslararası Standartlar Sempozyumu (1990 : İstanbul) Dinçmen, Murat, çev. Meyer, Ingo, çev. Coşkun, Özkan, çev. İTÜ İşletme Fakültesi Endüstri Mühendisliği Bölümü.<br/>Yer Numarası TS 156 K125 1990<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>