Arama Sonuçları Quality control. - Daraltılmış: Computer security.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dQuality$002bcontrol.$0026qf$003dSUBJECT$002509Konu$002509Computer$002bsecurity.$002509Computer$002bsecurity.$0026ps$003d300$0026isd$003dtrue?dt=list
2024-11-29T08:58:30Z
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2024-11-29T08:58:30Z
2024-11-29T08:58:30Z
Yazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
ent://SD_ILS/0/SD_ILS:485213
2024-11-29T08:58:30Z
2024-11-29T08:58:30Z
Yazar Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and availability of cloud computing
ent://SD_ILS/0/SD_ILS:249383
2024-11-29T08:58:30Z
2024-11-29T08:58:30Z
Yazar Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>