Arama Sonu&ccedil;lar&#305; Quality control. - Daralt&#305;lm&#305;&#351;: Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dQuality$002bcontrol.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300?dt=list 2024-11-22T12:43:34Z Total quality process control for injection molding ent://SD_ILS/0/SD_ILS:297905 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Gordon, M. Joseph.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470584491">http://dx.doi.org/10.1002/9780470584491</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10381077">http://site.ebrary.com/lib/alltitles/Doc?id=10381077</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=35165">http://www.books24x7.com/marc.asp?bookid=35165</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Food safety in the seafood industry : a practical guide for ISO 22000 and FSSC 22000 implementation ent://SD_ILS/0/SD_ILS:424369 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Soares, Nuno, 1975- author.&#160;Martins, Cristina, 1990- author.&#160;Vicente, Ant&oacute;nio A., author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1002/9781118965108">Wiley Online Library</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Driving sustainability to business success : the DS factor-management system integration and automation ent://SD_ILS/0/SD_ILS:342062 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Pilot, Jayne.<br/>Yer Numaras&#305;&#160;ONLINE(342062.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/PublicFullRecord.aspx?p=1810505">Click here to view book</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781118356937.jpg">http://catalogimages.wiley.com/images/db/jimages/9781118356937.jpg</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118936733">http://dx.doi.org/10.1002/9781118936733</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{97DD79E9-A497-4924-970A-A4EBEA6F6FBE}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{97DD79E9-A497-4924-970A-A4EBEA6F6FBE}Img100.jpg</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Total information risk management maximizing the value of data and information assets ent://SD_ILS/0/SD_ILS:306693 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Borek, Alexander.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124055476">http://www.sciencedirect.com/science/book/9780124055476</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Competing with data quality : concepts, tools, and techniques for building a successful approach to data quality ent://SD_ILS/0/SD_ILS:341867 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Jugulum, Rajesh.<br/>Yer Numaras&#305;&#160;ONLINE(341867.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637638">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637638</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118840962">http://dx.doi.org/10.1002/9781118840962</a> MyiLibrary <a href="http://www.myilibrary.com?id=578524">http://www.myilibrary.com?id=578524</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{E6482791-38B4-490B-81DF-709683244DDC}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{E6482791-38B4-490B-81DF-709683244DDC}Img100.jpg</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=1637638">http://swb.eblib.com/patron/FullRecord.aspx?p=1637638</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Problem solving and data analysis using Minitab : a clear and easy guide to six sigma methodology ent://SD_ILS/0/SD_ILS:299348 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Khan, Rehman M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley Online Library <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118307502">http://onlinelibrary.wiley.com/book/10.1002/9781118307502</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118307502">http://dx.doi.org/10.1002/9781118307502</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781118307571.jpg">http://catalogimages.wiley.com/images/db/jimages/9781118307571.jpg</a> ebrary <a href="http://site.ebrary.com/id/10657930">http://site.ebrary.com/id/10657930</a> <a href="http://rbdigital.oneclickdigital.com">http://rbdigital.oneclickdigital.com</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mastering system identification in 100 exercises ent://SD_ILS/0/SD_ILS:249360 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Schoukens, J. (Johan)&#160;Pintelon, R. (Rik)&#160;Rolain, Yves.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEEXplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6183553">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6183553</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and availability of cloud computing ent://SD_ILS/0/SD_ILS:249383 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical and managerial techniques for six sigma methodology theory and application ent://SD_ILS/0/SD_ILS:305612 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Barone, Stefano.&#160;Franco, Eva Lo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119968405">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780470711835">Available by subscription from Safari Books Online</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=834629">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=834629</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=834629">http://swb.eblib.com/patron/FullRecord.aspx?p=834629</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis ent://SD_ILS/0/SD_ILS:299377 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Carlson, Carl (Carl Seymour)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118312575">http://dx.doi.org/10.1002/9781118312575</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=46749">http://www.books24x7.com/marc.asp?bookid=46749</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10558143">http://site.ebrary.com/lib/alltitles/Doc?id=10558143</a> ebrary <a href="http://site.ebrary.com/id/10558143">http://site.ebrary.com/id/10558143</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Problem solving for process operators and specialists ent://SD_ILS/0/SD_ILS:298688 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Bonem, Joe M.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470929247">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=700553">Click here to view book</a> ebrary <a href="http://site.ebrary.com/id/10494548">http://site.ebrary.com/id/10494548</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=44416">http://www.books24x7.com/marc.asp?bookid=44416</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10494548">http://site.ebrary.com/lib/alltitles/Doc?id=10494548</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical analysis of profile monitoring ent://SD_ILS/0/SD_ILS:298924 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Noorossana, Rassoul, 1959-&#160;Saghaei, Abbas, 1972-&#160;Amiri, Amirhossein, 1979-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118071984">An electronic book accessible through the World Wide Web; click for information</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=45132">http://www.books24x7.com/marc.asp?bookid=45132</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10534036">http://site.ebrary.com/lib/alltitles/Doc?id=10534036</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693512">http://swb.eblib.com/patron/FullRecord.aspx?p=693512</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Project management metrics, KPIs, and dashboards a guide to measuring and monitoring project performance ent://SD_ILS/0/SD_ILS:298938 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Kerzner, Harold.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118086254">An electronic book accessible through the World Wide Web; click for information</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781118026526.jpg">http://catalogimages.wiley.com/images/db/jimages/9781118026526.jpg</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693655">http://swb.eblib.com/patron/FullRecord.aspx?p=693655</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical methods for quality improvement ent://SD_ILS/0/SD_ILS:298898 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Ryan, Thomas P., 1945-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118058114">http://dx.doi.org/10.1002/9781118058114</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=43294">http://www.books24x7.com/marc.asp?bookid=43294</a> <a href="http://resolver.library.cornell.edu/cgi-bin/EBookresolver?set=Books24x7&id=43294">http://resolver.library.cornell.edu/cgi-bin/EBookresolver?set=Books24x7&id=43294</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470590744.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470590744.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10560653">http://site.ebrary.com/lib/alltitles/Doc?id=10560653</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Basic statistical tools for improving quality ent://SD_ILS/0/SD_ILS:305301 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Kang, Chang W. (Chang Wok), 1957- author.&#160;Kvam, Paul H., 1962- author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118491751">http://onlinelibrary.wiley.com/book/10.1002/9781118491751</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118491751">http://dx.doi.org/10.1002/9781118491751</a> ebrary <a href="http://site.ebrary.com/id/10593130">http://site.ebrary.com/id/10593130</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=1010501">http://swb.eblib.com/patron/FullRecord.aspx?p=1010501</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Six Sigma quality improvement with Minitab ent://SD_ILS/0/SD_ILS:305655 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Henderson, G. Robin.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781119975328">http://dx.doi.org/10.1002/9781119975328</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=819255">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=819255</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=819255">http://swb.eblib.com/patron/FullRecord.aspx?p=819255</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System health management with aerospace applications ent://SD_ILS/0/SD_ILS:305720 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Johnson, Stephen B., 1959-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=819284">Click here to view book</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994053">http://dx.doi.org/10.1002/9781119994053</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10484794">http://site.ebrary.com/lib/alltitles/Doc?id=10484794</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Verification, validation, and testing of engineered systems ent://SD_ILS/0/SD_ILS:298010 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Engel, Avner.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=35180">http://www.books24x7.com/marc.asp?bookid=35180</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470618851">http://dx.doi.org/10.1002/9780470618851</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470618851">http://onlinelibrary.wiley.com/book/10.1002/9780470618851</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118029312">http://proquest.safaribooksonline.com/?fpi=9781118029312</a> <a href="http://proquest.safaribooksonline.com/9781118029312">http://proquest.safaribooksonline.com/9781118029312</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Bauer, Eric.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Smart data enterprise performance optimization strategy ent://SD_ILS/0/SD_ILS:297890 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;George, James A., 1948-&#160;Rodger, James A., 1952-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=510136">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780470473252">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470583067">http://dx.doi.org/10.1002/9780470583067</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy1004/2009031431-b.html">http://catdir.loc.gov/catdir/enhancements/fy1004/2009031431-b.html</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=40810">http://www.books24x7.com/marc.asp?bookid=40810</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multimedia services in wireless internet modeling and analysis ent://SD_ILS/0/SD_ILS:298384 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Cai, Lin, 1973-&#160;Shen, X. (Xuemin), 1958-&#160;Mark, Jon W.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470747759">http://onlinelibrary.wiley.com/book/10.1002/9780470747759</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454305">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454305</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470747759">http://dx.doi.org/10.1002/9780470747759</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10315627">http://site.ebrary.com/lib/alltitles/Doc?id=10315627</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power quality indices in liberalized markets ent://SD_ILS/0/SD_ILS:303761 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Caramia, Pierluigi.&#160;Carpinelli, Guido.&#160;Verde, Paola, 1966-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470181">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470181</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470994405">http://dx.doi.org/10.1002/9780470994405</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332994">http://site.ebrary.com/lib/alltitles/Doc?id=10332994</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> End-to-end quality of service engineering in next generation heterogenous networks ent://SD_ILS/0/SD_ILS:297569 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Mellouk, Abdelhamid.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470611470">http://dx.doi.org/10.1002/9780470611470</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361264">http://site.ebrary.com/lib/alltitles/Doc?id=10361264</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical support for lean six sigma software process definition using IEEE software engineering standards ent://SD_ILS/0/SD_ILS:249325 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Land, Susan K.&#160;Smith, Douglas Burr, 1943-&#160;Walz, John W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129687">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129687</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for lean six sigma a holistic approach to design and innovation ent://SD_ILS/0/SD_ILS:297175 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Jugulum, Rajesh.&#160;Samuel, Philip.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpDLSSAHAC">http://app.knovel.com/web/toc.v/cid:kpDLSSAHAC</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=26091">http://www.books24x7.com/marc.asp?bookid=26091</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470282199">http://dx.doi.org/10.1002/9780470282199</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=484853">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=484853</a> OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={15A445C6-2AAB-42B5-B55E-57C92977F0D9}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={15A445C6-2AAB-42B5-B55E-57C92977F0D9}&Format=50</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Curtis, Peter M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Signal processing of power quality disturbances ent://SD_ILS/0/SD_ILS:249493 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Bollen, Math H. J., 1960-&#160;Gu, Irene Yu-Hua.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5224658">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5224658</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Simulation-based lean six-sigma and design for six-sigma ent://SD_ILS/0/SD_ILS:296769 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;El-Haik, Basem.&#160;Al-Aomar, Raid.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://www.contentreserve.com/TitleInfo.asp?ID={BF8047CA-456B-4CA9-A0CE-DD628C0B861D}&Format=50">Click for information</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=16837">http://www.books24x7.com/marc.asp?bookid=16837</a> John Wiley <a href="http://dx.doi.org/10.1002/0470047720">http://dx.doi.org/10.1002/0470047720</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wastewater quality monitoring and treatment ent://SD_ILS/0/SD_ILS:296802 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Quevauviller, Ph.&#160;Thomas, Olivier.&#160;Beken, Andr&eacute; van der.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=18008">http://www.books24x7.com/marc.asp?bookid=18008</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470058725">http://dx.doi.org/10.1002/9780470058725</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Qualit&auml;tssicherung in der analytischen Chemie Anwendungen in der Umwelt-, Lebensmittel- und Werkstoffanalytik, Biotechnologie und Medizintechnik ent://SD_ILS/0/SD_ILS:302339 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Funk, Werner, 1944-1996.&#160;Dammann, Vera.&#160;Donnevert, Gerhild.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481304">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481304</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527624508">http://dx.doi.org/10.1002/9783527624508</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10275638">http://site.ebrary.com/lib/alltitles/Doc?id=10275638</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Verification and validation for quality of UML 2.0 models ent://SD_ILS/0/SD_ILS:301769 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Unhelkar, Bhuvan.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://www.contentreserve.com/TitleInfo.asp?ID={3F855A2D-86BA-4E40-A6FA-1ACF9D14DA01}&Format=50">Click for information</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0619/2004065931-b.html">http://catdir.loc.gov/catdir/enhancements/fy0619/2004065931-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/0471734322">http://dx.doi.org/10.1002/0471734322</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=238767">http://swb.eblib.com/patron/FullRecord.aspx?p=238767</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical bit error rate an estimation methodology ent://SD_ILS/0/SD_ILS:249764 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Kartalopoulos, Stamatios V.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Information visualization perception for design ent://SD_ILS/0/SD_ILS:253906 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Ware, Colin.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781558608191">http://www.sciencedirect.com/science/book/9781558608191</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Understanding power quality problems voltage sags and interruptions ent://SD_ILS/0/SD_ILS:249618 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Bollen, Math H. J., 1960-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270869">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270869</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The design analysis handbook a practical guide to design validation ent://SD_ILS/0/SD_ILS:254797 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Walker, N. Edward.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computervalidierung in Labor und Betrieb Sicherheit und Qualit&auml;t computergest&uuml;tzter Systeme ent://SD_ILS/0/SD_ILS:300918 2024-11-22T12:43:34Z 2024-11-22T12:43:34Z Yazar&#160;Unkelbach, H. D. (Hans-Dieter)&#160;Bosshard, P. (Peter)&#160;Wolf, H. (Helmut), 1950-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527624560">http://dx.doi.org/10.1002/9783527624560</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481540">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481540</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10275752">http://site.ebrary.com/lib/alltitles/Doc?id=10275752</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=481540">http://swb.eblib.com/patron/FullRecord.aspx?p=481540</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>