Arama Sonuçları Quality control. - Daraltılmış: Electronic circuits.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dQuality$002bcontrol.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300$0026isd$003dtrue?dt=list
2025-12-06T09:54:31Z
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2025-12-06T09:54:31Z
2025-12-06T09:54:31Z
Yazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2025-12-06T09:54:31Z
2025-12-06T09:54:31Z
Yazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
ent://SD_ILS/0/SD_ILS:530615
2025-12-06T09:54:31Z
2025-12-06T09:54:31Z
Yazar Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:484755
2025-12-06T09:54:31Z
2025-12-06T09:54:31Z
Yazar Grasser, Tibor. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>