Arama Sonuçları Raik, Jaan.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dRaik$00252C$002bJaan.$0026ps$003d300?dt=list2026-06-01T14:19:58ZDesign and test technology for dependable systems-on-chipent://SD_ILS/0/SD_ILS:2780432026-06-01T14:19:58Z2026-06-01T14:19:58ZYazar Ubar, Raimund, 1941- Raik, Jaan, 1972- Vierhaus, Heinrich Theodor, 1951-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structural Decision Diagrams in Digital Test Theory and Applicationsent://SD_ILS/0/SD_ILS:6024422026-06-01T14:19:58Z2026-06-01T14:19:58ZYazar Ubar, Raimund. author. Raik, Jaan. author. Jenihhin, Maksim. author. Jutman, Artur. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44734-1">https://doi.org/10.1007/978-3-031-44734-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papersent://SD_ILS/0/SD_ILS:6184402026-06-01T14:19:58Z2026-06-01T14:19:58ZYazar Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67104-8">https://doi.org/10.1007/978-3-319-67104-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>