Arama Sonuçları Random access memory.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dRandom$002baccess$002bmemory.$0026pe$003dd$00253A$0026ps$003d300?dt=list2024-10-19T19:57:29ZInformation Security and Privacy 28th Australasian Conference, ACISP 2023, Brisbane, QLD, Australia, July 5-7, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209952024-10-19T19:57:29Z2024-10-19T19:57:29ZYazar Simpson, Leonie. editor. Rezazadeh Baee, Mir Ali. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520995.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35486-1">https://doi.org/10.1007/978-3-031-35486-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in non-volatile memory and storage technologyent://SD_ILS/0/SD_ILS:3557022024-10-19T19:57:29Z2024-10-19T19:57:29ZYazar Nishi, Yoshio, editor.<br/>Yer Numarası ONLINE(355702.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780857098030">http://www.sciencedirect.com/science/book/9780857098030</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dynamic RAM technology advancementsent://SD_ILS/0/SD_ILS:2909312024-10-19T19:57:29Z2024-10-19T19:57:29ZYazar Siddiqi, Muzaffer A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439893753">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nonvolatile memory design magnetic, resistive, and phase changeent://SD_ILS/0/SD_ILS:2861412024-10-19T19:57:29Z2024-10-19T19:57:29ZYazar Li, Hai, 1975- Chen, Yiran, 1976-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439807460">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Floating body cell a novel capacitor-less DRAM cellent://SD_ILS/0/SD_ILS:2881132024-10-19T19:57:29Z2024-10-19T19:57:29ZYazar Ohsawa, Takashi. Hamamoto, Takeshi.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9789814303088">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing static random access memories : Defects, fault models, and test patternsent://SD_ILS/0/SD_ILS:3928162024-10-19T19:57:29Z2024-10-19T19:57:29ZYazar Hamdioui, Said.<br/>Yer Numarası TK7895.M4 H34 2004<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>