Arama Sonu&ccedil;lar&#305; Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300?dt=list 2025-12-07T20:59:54Z Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Yer Numaras&#305;&#160;ONLINE(341870.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:544208 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;TA174 .E544 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to reliability engineering ent://SD_ILS/0/SD_ILS:47611 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Lewis, Elmer Eugene, 1938-<br/>Yer Numaras&#305;&#160;TA 169 L47 1987<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Introduction to Quality and Reliability Engineering ent://SD_ILS/0/SD_ILS:529803 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Jiang, Renyan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a 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K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Shooman, Martin L.<br/>Yer Numaras&#305;&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kivenson, Gilbert.<br/>Yer Numaras&#305;&#160;TS 173 K57 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(orcid)0000-0003-4541-2693&#160;Zaitseva, Elena. editor.&#160;Kvassay, Miroslav. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:482935 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering ent://SD_ILS/0/SD_ILS:485213 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ali, Syed Riffat. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Gunawan, Indra.<br/>Yer Numaras&#305;&#160;ONLINE(342010.1)<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Gas and oil reliability engineering modeling and analysis ent://SD_ILS/0/SD_ILS:145907 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Calixto, Eduardo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. ent://SD_ILS/0/SD_ILS:305286 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Epperlein, Peter W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332682.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Basic Concepts and Applications in ICT ent://SD_ILS/0/SD_ILS:194550 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Lazzaroni, Massimo. author.&#160;Cristaldi, Loredana. author.&#160;Peretto, Lorenzo. author.&#160;Rinaldi, Paola. author.&#160;Catelani, Marcantonio. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood function ent://SD_ILS/0/SD_ILS:133515 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Surhone, Lambert M.&#160;Timpledon, Miriam T.&#160;Marseken, Susan F.<br/>Yer Numaras&#305;&#160;H61 .S87 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability engineering and risk analysis : a practical guide ent://SD_ILS/0/SD_ILS:363877 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Modarres, M. (Mohammad)&#160;Kaminskiy, Mark, 1946-&#160;Krivtsov, Vasiliy, 1963-<br/>Yer Numaras&#305;&#160;TA169 M627 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:547196 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Wessels, William R., author.<br/>Yer Numaras&#305;&#160;TS173 .W45 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design ent://SD_ILS/0/SD_ILS:175745 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Stapelberg, Rudolph Frederick. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009 ent://SD_ILS/0/SD_ILS:546575 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan)&#160;CRC Press.<br/>Yer Numaras&#305;&#160;TA168 .I58 2009<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781439847657">https://www.taylorfrancis.com/books/9781439847657</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367803667">https://www.taylorfrancis.com/books/9780367803667</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation ent://SD_ILS/0/SD_ILS:547574 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TA167 .D468 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439803844">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability applications for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:153040 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.&#160;CRC Press.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability ent://SD_ILS/0/SD_ILS:183993 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Bertsche, Bernd. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability applications : for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:539978 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;TA174 .E54 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420051339">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System Signatures and their Applications in Engineering Reliability 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href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550</a> John Wiley <a href="http://dx.doi.org/10.1002/0471714682">http://dx.doi.org/10.1002/0471714682</a> Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability verification, testing and analysis in engineering design ent://SD_ILS/0/SD_ILS:547339 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Wasserman, Gary S., 1951, author.<br/>Yer Numaras&#305;&#160;TA169 .W37 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135551483">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering maintainability how to design for reliability and easy maintenance ent://SD_ILS/0/SD_ILS:254337 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S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability analysis : a systems engineering approach with nuclear power plant applications ent://SD_ILS/0/SD_ILS:69593 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dougherty, E. M.&#160;Fragola, J. R., ort. yaz.<br/>Yer Numaras&#305;&#160;TK 9153 D68 1988<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Graph theory in modern engineering computer aided design, control, optimization, reliability analysis ent://SD_ILS/0/SD_ILS:256727 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Henley, Ernest J.&#160;Williams, R. A. (Richard A.)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123408501">http://www.sciencedirect.com/science/book/9780123408501</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability ent://SD_ILS/0/SD_ILS:526829 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Woo, Seongwoo. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Interconnect Reliability in Advanced Memory Device Packaging ent://SD_ILS/0/SD_ILS:526838 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Gan, Chong Leong,. author.&#160;Huang, Chen-Yu,. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Predictive Analytics in System Reliability ent://SD_ILS/0/SD_ILS:526781 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kumar, Vijay. editor.&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Artificial Intelligence for Smart Manufacturing Methods, Applications, and Challenges ent://SD_ILS/0/SD_ILS:527797 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Tran, Kim Phuc. editor. 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Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4661-2">http://dx.doi.org/10.1007/978-1-4471-4661-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintenance Management in Network Utilities Framework and Practical Implementation ent://SD_ILS/0/SD_ILS:173475 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;G&oacute;mez Fern&aacute;ndez, Juan F. author.&#160;Crespo M&aacute;rquez, Adolfo. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2757-4">http://dx.doi.org/10.1007/978-1-4471-2757-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis ent://SD_ILS/0/SD_ILS:299377 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Carlson, Carl (Carl Seymour)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118312575">http://dx.doi.org/10.1002/9781118312575</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=46749">http://www.books24x7.com/marc.asp?bookid=46749</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10558143">http://site.ebrary.com/lib/alltitles/Doc?id=10558143</a> ebrary <a href="http://site.ebrary.com/id/10558143">http://site.ebrary.com/id/10558143</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bayesian Inference for Probabilistic Risk Assessment A Practitioner's Guidebook ent://SD_ILS/0/SD_ILS:176181 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kelly, Dana. author.&#160;Smith, Curtis. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-187-5">http://dx.doi.org/10.1007/978-1-84996-187-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Innovations in Power Systems Reliability ent://SD_ILS/0/SD_ILS:168417 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Anders, George. editor.&#160;Vaccaro, Alfredo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Nonparametric Statistics in Reliability ent://SD_ILS/0/SD_ILS:168426 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;G&aacute;miz, M. Luz. author.&#160;Kulasekera, K. 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S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering Decisions for Life Quality How Safe is Safe Enough? ent://SD_ILS/0/SD_ILS:176019 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Nathwani, J. S. author.&#160;Lind, N. C. author.&#160;Pandey, M. D. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-602-1">http://dx.doi.org/10.1007/978-1-84882-602-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Complexity of Proceduralized Tasks ent://SD_ILS/0/SD_ILS:176068 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Park, Jinkyun. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-791-2">http://dx.doi.org/10.1007/978-1-84882-791-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Justifying the Dependability of Computer-based Systems With Applications in Nuclear Engineering ent://SD_ILS/0/SD_ILS:175833 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Courtois, Pierre-Jacques. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-372-9">http://dx.doi.org/10.1007/978-1-84800-372-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product Reliability Specification and Performance ent://SD_ILS/0/SD_ILS:175790 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Murthy, Dodderi Narshima Prabhakar. author.&#160;Rausand, Marvin. author.&#160;&Oslash;ster&aring;s, Trond. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Complex System Maintenance Handbook ent://SD_ILS/0/SD_ILS:175670 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kobbacy, Khairy A. 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(Jimmy Chih-Ming), 1963- editor.&#160;Sung, Wen-Pei, editor.&#160;Chen, Ran, Dr., editor.<br/>Yer Numaras&#305;&#160;TH880 .I58 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315751986">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product-Focused Software Process Improvement 16th International Conference, PROFES 2015, Bolzano, Italy, December 2-4, 2015, Proceedings ent://SD_ILS/0/SD_ILS:518832 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Abrahamsson, Pekka. editor.&#160;Corral, Luis. editor.&#160;Oivo, Markku. editor.&#160;Russo, Barbara. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-26844-6">https://doi.org/10.1007/978-3-319-26844-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bridge deck analysis 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Yazar&#160;Ko&#322;owrocki, Krzysztof, author.<br/>Yer Numaras&#305;&#160;ONLINE(355886.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability prediction from burn-in data fit to reliability models ent://SD_ILS/0/SD_ILS:355921 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Bernstein, Joseph.<br/>Yer Numaras&#305;&#160;ONLINE(355921.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to imprecise probabilities ent://SD_ILS/0/SD_ILS:341745 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Augustin, Thomas, editor.<br/>Yer Numaras&#305;&#160;ONLINE(341745.1)<br/>Elektronik Eri&#351;im&#160;Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470973813.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470973813.jpg</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1662760">http://public.eblib.com/choice/publicfullrecord.aspx?p=1662760</a> ebrary <a href="http://site.ebrary.com/id/10856859">http://site.ebrary.com/id/10856859</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118763117">http://dx.doi.org/10.1002/9781118763117</a> MyiLibrary <a href="http://www.myilibrary.com?id=595066">http://www.myilibrary.com?id=595066</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modern industrial statistics : with applications in R, MINITAB and JMP ent://SD_ILS/0/SD_ILS:341751 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kenett, Ron.&#160;Amberti, Daniele, contributor.&#160;Zacks, Shelemyahu, 1932-<br/>Yer Numaras&#305;&#160;ONLINE(341751.1)<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118763667">http://dx.doi.org/10.1002/9781118763667</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of safety-critical systems : theory and application ent://SD_ILS/0/SD_ILS:341773 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Rausand, Marvin.<br/>Yer Numaras&#305;&#160;ONLINE(341773.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic design for optimization and robustness for engineers 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R634 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781498710473">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, Reliability, Risk and Life-Cycle Performance of Structures and Infrastructures ent://SD_ILS/0/SD_ILS:539366 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Deodatis, George, editor.&#160;Ellingwood, Bruce R., editor.&#160;Frangopol, Dan M., editor.<br/>Yer Numaras&#305;&#160;TA656<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429227950">https://www.taylorfrancis.com/books/9780429227950</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for Laboratory Quality Auditing ent://SD_ILS/0/SD_ILS:539624 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Singer, author.<br/>Yer Numaras&#305;&#160;R850 .S564 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781498710527">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Occupational safety and hygiene II : selected extended and revised contributions from the International Symposium Occupational Safety and Hygiene, Guimaraes, Portugal, 13-14 February 2014 ent://SD_ILS/0/SD_ILS:540365 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Symposium Occupational Safety and Hygiene (2014 : Portugal), sponsor.&#160;Arezes, Pedro M., editor.&#160;Baptista, Joao Santos, editor.&#160;Barroso, Monica P., editor.&#160;Carneiro, Paula, editor.<br/>Yer Numaras&#305;&#160;T55 .A1 I58 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315773520">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety and Reliability Methodology and Applications. ent://SD_ILS/0/SD_ILS:545362 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yer Numaras&#305;&#160;TA169.7<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429226823">https://www.taylorfrancis.com/books/9780429226823</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Resilience engineering in practice. Volume 2, Becoming resilient ent://SD_ILS/0/SD_ILS:546515 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Nemeth, Christopher P., editor.&#160;Hollnagel, Erik, 1941- editor.<br/>Yer Numaras&#305;&#160;TA169 .R4663 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315605708">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk analysis in engineering and economics ent://SD_ILS/0/SD_ILS:545726 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ayyub, Bilal M., author.<br/>Yer Numaras&#305;&#160;T174.5 .A99 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466518261">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Civil engineering and urban planning III : proceedings of the Third International Conference on Civil Engineering and Urban Planning (CEUP 2014), Wuhan, China, 20-22 June 2014 ent://SD_ILS/0/SD_ILS:547358 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Conference on Civil Engineering and Urban Planning (3rd : 2014 : Wuhan, China)&#160;Mohammadian, Abolfazl, 1970- editor.<br/>Yer Numaras&#305;&#160;TA5 .I58 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315743004">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic models for dynamical systems ent://SD_ILS/0/SD_ILS:363931 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Benaroya, Haym, 1954- author.&#160;Han, Seon Mi, author.&#160;Nagurka, Mark L., author.<br/>Yer Numaras&#305;&#160;TA169 B463 2013<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Fracture mechanics. 1, Analysis of reliability and quality control ent://SD_ILS/0/SD_ILS:305424 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Grous, Ammar, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications ent://SD_ILS/0/SD_ILS:306566 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Wu, Bin, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to thermodynamics of mechanical fatigue ent://SD_ILS/0/SD_ILS:538736 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Khonsari, Michael M., author.&#160;Amiri, Mehdi.<br/>Yer Numaras&#305;&#160;TA418.38 .K45 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466511804">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced risk analysis in engineering enterprise systems ent://SD_ILS/0/SD_ILS:538759 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Pinto, Cesar Ariel., author.&#160;Garvey, Paul R., 1956-<br/>Yer Numaras&#305;&#160;TA169 .P56 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439826157">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Yer Numaras&#305;&#160;ONLINE(365001.1)<br/>Elektronik Eri&#351;im&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Systems engineering and safety : building the bridge ent://SD_ILS/0/SD_ILS:539717 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Glismann, Peter J., author.<br/>Yer Numaras&#305;&#160;TA169 .G54 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466552135">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Strain-engineered MOSFETs ent://SD_ILS/0/SD_ILS:543457 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Maiti, C. K., author.&#160;Maiti, T. K.<br/>Yer Numaras&#305;&#160;TK7871.99 .M44 M248 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466503472">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:543776 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;El-Reedy, Mohamed Abdallah., author.<br/>Yer Numaras&#305;&#160;TA683 .E47 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439874172">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Aging power delivery infrastructures ent://SD_ILS/0/SD_ILS:544457 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Willis, H. Lee, 1949, author.&#160;Schrieber, Randall R.<br/>Yer Numaras&#305;&#160;TK1010 .W55 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315216652">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> From materials to structures : advancement through innovation ent://SD_ILS/0/SD_ILS:546274 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Australasian Conference on the Mechanics of Structures and Materials (22nd : 2012 : Sydney, Australia)&#160;Samali, Bijan, editor.&#160;Attard, Mario M., editor.&#160;Song, Chongming, editor.<br/>Yer Numaras&#305;&#160;TA645 .A97 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781134082391">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Linear systems : non-fragile control and filtering ent://SD_ILS/0/SD_ILS:544446 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Yang, Guang-Hong.&#160;Guo, Xiaqng-Gui.&#160;Che, Wei-Wei.&#160;Guan, Wei.<br/>Yer Numaras&#305;&#160;TJ220 .L56 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466580367">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability models for engineers and scientists ent://SD_ILS/0/SD_ILS:545739 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kaminskiy, Mark, 1946, author.<br/>Yer Numaras&#305;&#160;TA169 .K36 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466565937">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lead Free Solder Mechanics and Reliability ent://SD_ILS/0/SD_ILS:173692 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Pang, John Hock Lye. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Analyses for Durability and System Design Lifetime A Multidisciplinary Approach ent://SD_ILS/0/SD_ILS:237158 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Saleh, Joseph H..<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1017/CBO9780511546136">Access by subscription</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Klyatis, Lev M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:299386 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Kuo, Way, 1951-&#160;Zhu, Xiaoyan.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ushakov, I. 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Fundamentals of machine component design.<br/>Yer Numaras&#305;&#160;TJ230 J88 2012<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> Infrastructure health in civil engineering ent://SD_ILS/0/SD_ILS:540938 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ettouney, Mohammed, author.&#160;Alampalli, Sreenivas.<br/>Yer Numaras&#305;&#160;TA656.6 .E88 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420003758">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability ent://SD_ILS/0/SD_ILS:364907 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Tobias, Paul A.&#160;Trindade, David C.<br/>Yer Numaras&#305;&#160;TA169 T63 2012<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Semiconductors : integrated circuit design for manufacturability ent://SD_ILS/0/SD_ILS:543473 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Balasinki, Artur., author.<br/>Yer Numaras&#305;&#160;TK7874 .B35 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439817155">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Infrastructure health in civil engineering ent://SD_ILS/0/SD_ILS:544764 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ettouney, Mohammed., author.&#160;Alampalli, Sreenivas.<br/>Yer Numaras&#305;&#160;TA656.6 .E88 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439866542">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and maintenance : networks and systems ent://SD_ILS/0/SD_ILS:546172 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Beichelt, Frank, 1942, author.&#160;Tittmann, Peter.<br/>Yer Numaras&#305;&#160;TA169 .B45 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439826362">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining Mission Critical Systems in a 24/7 Environment ent://SD_ILS/0/SD_ILS:249925 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Curtis, Peter M., author.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems. ent://SD_ILS/0/SD_ILS:149176 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Smith, David J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik 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(King-Ning), 1937-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Calculation of Roundabouts Capacity, Waiting Phenomena and Reliability ent://SD_ILS/0/SD_ILS:190985 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Mauro, Raffaele. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability assessment : theory and practice ent://SD_ILS/0/SD_ILS:540046 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Spurgin, Anthony J., author.<br/>Yer Numaras&#305;&#160;TA166 .S685 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Bauer, Eric.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lunar settlements ent://SD_ILS/0/SD_ILS:542096 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Benaroya, Haym, 1954-<br/>Yer Numaras&#305;&#160;TL795.7 .L86 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420083330">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and optimization of structural systems : proceedings of Reliability and Optimization of Structural Systems, Tum, Munchen, Germany, 7-10 April 2010 ent://SD_ILS/0/SD_ILS:542232 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Reliability and Optimization of Structural Systems (2010 : Tum, Munchen, Germany)&#160;Straub, D.<br/>Yer Numaras&#305;&#160;TA658.2 .R45 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781136898563">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances and trends in structural engineering, mechanics and computation : proceedings of the Fourth International Conference on Structural Engineering, Mechanics and Computation, 6-8 September 2010, Cape Town, South Africa ent://SD_ILS/0/SD_ILS:542797 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Conference on Structural Engineering, Mechanics and Computation (4th : 2010 : ape Town, South Africa)&#160;Zingoni, Alphose.<br/>Yer Numaras&#305;&#160;TA630 .I58 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9780415618151">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Numerical methods in geotechnical engineering : proceedings of the seventh European Conference on Numerical Methods in Geotechnical Engineering, Trondheim, Norway, 2-4 June 2010 ent://SD_ILS/0/SD_ILS:544220 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;European Conference on Numerical Methods in Geotechnical Engineering (7th : 2010 : Trondeim, Norway)&#160;Nordal, Steinar.&#160;Benz, Thomas.<br/>Yer Numaras&#305;&#160;TA703.5 .E97 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781136905179">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Life cycle costing for engineers ent://SD_ILS/0/SD_ILS:545696 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA177.7 .D348 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439816899">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Frontier technologies for infrastructure engineering ent://SD_ILS/0/SD_ILS:539230 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Workshop on Frontier Technologies for Infrastrctures Engineering (2008 : Taipei, Taiwan)&#160;Chen, Shi-Shuenn.&#160;Ang, Alfredo Hua-Sing, 1930-<br/>Yer Numaras&#305;&#160;TA5 .I745 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135998851">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Geotechnical risk and safety : proceedings of the 2nd International Symposium on Geotechnical Safety and Risk, Gifu, Japan, 11-12 June, 2009 ent://SD_ILS/0/SD_ILS:544223 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Symposium on Geotechnical Safety &amp; Risk (2nd : 2009 : Gifu, Japan)&#160;Honjo, Y.<br/>Yer Numaras&#305;&#160;TD171.9 .G46 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135259518">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Operations research applications ent://SD_ILS/0/SD_ILS:546040 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ravindran, A., 1944-<br/>Yer Numaras&#305;&#160;T57.6 .O64 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420091878">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Kinetic modeling of reactions in foods ent://SD_ILS/0/SD_ILS:542827 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Boekel, M. A. J. S. van., author.<br/>Yer Numaras&#305;&#160;TX545 .B64 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420017410">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Near-earth laser communications ent://SD_ILS/0/SD_ILS:546499 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Hemmati, Hamid, 1954-<br/>Yer Numaras&#305;&#160;TK5103.6 .N43 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420015447">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis and prediction with warranty data : issues, strategies, and methods ent://SD_ILS/0/SD_ILS:543197 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Rai, Bharatendra K., author.&#160;Singh, Nanua.<br/>Yer Numaras&#305;&#160;K1032 .C6 R35 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439803264">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Silver Metallization Stability and Reliability ent://SD_ILS/0/SD_ILS:175677 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Adams, Daniel. author.&#160;Alford, Terry L. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mathematical models for systems reliability ent://SD_ILS/0/SD_ILS:538905 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Epstein, Benjamin, 1918, author.&#160;Weissman, Ishay, 1940-<br/>Yer Numaras&#305;&#160;TA169 .E67 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> RF and microwave applications and systems ent://SD_ILS/0/SD_ILS:542504 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Golio, John Michael, 1954-<br/>Yer Numaras&#305;&#160;TK7876 .R486 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420006711">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of semiconductor manufacturing technology ent://SD_ILS/0/SD_ILS:542441 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Doering, Robert, 1946-&#160;Nishi, Yoshio, 1940-<br/>Yer Numaras&#305;&#160;TK7871.85 .H3335 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability technology, human error, and quality in health care ent://SD_ILS/0/SD_ILS:542996 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;RA399 .A1 D487 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420065596">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bridge maintenance, safety management, health monitoring and informatics : proceedings of the Fourth International Conference on Bridge Maintenance, Safety and Management, Seoul, Korea, July 13-17 2008 ent://SD_ILS/0/SD_ILS:545756 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Conference on Bridge Maintenance, Safety and Management (4th : 2008 : Seoul, Korea)&#160;Koh, Hyun-Moo.&#160;Frangopol, Dan M.<br/>Yer Numaras&#305;&#160;TG315 .I58 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439828434">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A Guide to Lead-free Solders Physical Metallurgy and Reliability ent://SD_ILS/0/SD_ILS:175373 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Evans, John W. author.&#160;Engelmaier, Werner. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wire Ropes Tension, Endurance, Reliability ent://SD_ILS/0/SD_ILS:183848 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Feyrer, K. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Curtis, Peter M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk-based reliability analysis and generic principles for risk reduction ent://SD_ILS/0/SD_ILS:148956 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Todinov, M. T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fault trees ent://SD_ILS/0/SD_ILS:302359 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Limnios, N. (Nikolaos)&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html">http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470612484">http://dx.doi.org/10.1002/9780470612484</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Geotechnical Investigation and Design Tables ent://SD_ILS/0/SD_ILS:540351 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Look, Burt G., author.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;TA705<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9780429224379">Click here to view.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Operations research and management science handbook ent://SD_ILS/0/SD_ILS:540949 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ravindran, Ravi.<br/>Yer Numaras&#305;&#160;T57.6 .A32 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420009712">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Assurance technologies principles and practices : a product, process, and system safety perspective ent://SD_ILS/0/SD_ILS:295628 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Raheja, Dev.&#160;Allocco, Michael.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=54979&ref=toc">http://www.myilibrary.com?id=54979&ref=toc</a> John Wiley <a href="http://dx.doi.org/10.1002/047000942X">http://dx.doi.org/10.1002/047000942X</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853">http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/62326785.html">http://catalog.hathitrust.org/api/volumes/oclc/62326785.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and risk a Bayesian perspective ent://SD_ILS/0/SD_ILS:296819 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Singpurwalla, Nozer D.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System reliability : concepts and applications ent://SD_ILS/0/SD_ILS:392825 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Klaassen, Klaas B., 1941-&#160;Peppen, Jack C. L. van.<br/>Yer Numaras&#305;&#160;QA76.5 K53 2006<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Risk analysis in engineering : techniques, tools, and trends ent://SD_ILS/0/SD_ILS:119534 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Modarres, Mohammad.<br/>Yer Numaras&#305;&#160;T174.5 M65 2006<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Uncertainty modeling and analysis in engineering and the sciences ent://SD_ILS/0/SD_ILS:544184 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ayyub, Bilal M., author.&#160;Klir, George J., 1932-<br/>Yer Numaras&#305;&#160;TA330 .A995 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420011456">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:545920 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TA168 .D53 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Principles of structural design ent://SD_ILS/0/SD_ILS:546816 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Chen, Wai-Fah, 1936-&#160;Lui, E. M.<br/>Yer Numaras&#305;&#160;TA658 .P745 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420037135">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The electrical engineering handbook. Sensors, nanoscience, biomedical engineering, and instruments ent://SD_ILS/0/SD_ILS:547506 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dorf, Richard C.<br/>Yer Numaras&#305;&#160;R857 .B54 E44 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420003161">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:254854 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Smith, David John, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Plant and machinery failure prevention ent://SD_ILS/0/SD_ILS:293572 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Hattangadi, A. A.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/plant-machinery-failure-prevention">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and risk models setting reliability requirements ent://SD_ILS/0/SD_ILS:295900 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Todinov, M. T.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Flowgraph models for multistate time-to-event data ent://SD_ILS/0/SD_ILS:301633 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Huzurbazar, Aparna V., 1966-&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471686565">http://dx.doi.org/10.1002/0471686565</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:119553 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S.<br/>Yer Numaras&#305;&#160;TS173 .D45 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability and risk models : setting reliability requirements ent://SD_ILS/0/SD_ILS:119481 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Todinov, M. T.<br/>Yer Numaras&#305;&#160;TA169 .T65 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Sosyal ve davran&#305;&#351;sal &ouml;l&ccedil;&uuml;mlerde g&uuml;venilirlik ve ge&ccedil;erlilik ent://SD_ILS/0/SD_ILS:108201 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;&#350;encan, H&uuml;ner.<br/>Yer Numaras&#305;&#160;BF176 .S463 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Handbook of structural engineering ent://SD_ILS/0/SD_ILS:542832 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Chen, Wai-Fah, 1936-&#160;Lui, E. M.<br/>Yer Numaras&#305;&#160;TA633 .H36 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420039931">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> What every engineer should know about decision making under uncertainty ent://SD_ILS/0/SD_ILS:544345 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Wang, John X., 1962-&#160;CRC Press.<br/>Yer Numaras&#305;&#160;TA190 .W36 2005<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429222733">https://www.taylorfrancis.com/books/9780429222733</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The engineering handbook ent://SD_ILS/0/SD_ILS:541498 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dorf, Richard C.<br/>Yer Numaras&#305;&#160;TA151 .E424 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420039870">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computers, Software Engineering, and Digital Devices ent://SD_ILS/0/SD_ILS:542493 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dorf, Richard C., author.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;TK7885<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The electronics handbook ent://SD_ILS/0/SD_ILS:546489 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Whitaker, Jerry C.<br/>Yer Numaras&#305;&#160;TK7867 .E4244 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420036664">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:547810 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TS173 .D495 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated testing and validation testing, engineering, and management tools for lean development ent://SD_ILS/0/SD_ILS:254184 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Porter, Alex.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> RCM gateway to world class maintenance ent://SD_ILS/0/SD_ILS:254702 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Smith, Anthony M.&#160;Hinchcliffe, Glenn R.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750674614">http://www.sciencedirect.com/science/book/9780750674614</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power distribution planning reference book ent://SD_ILS/0/SD_ILS:541957 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Willis, H. Lee, 1949, author.<br/>Yer Numaras&#305;&#160;TK3091 .W55 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420030310">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical engineering failure analysis ent://SD_ILS/0/SD_ILS:545309 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Tawancy, Hani M., author.&#160;Abbas, Nureddin Mohamed.&#160;Ul-Hamid, Anwar.<br/>Yer Numaras&#305;&#160;TA169.5 .T39 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design and analysis of accelerated tests for mission critical reliability ent://SD_ILS/0/SD_ILS:546254 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;LuValle, Michael J., author.&#160;Lefevre, Bruce G.&#160;Kannan, SriRaman.<br/>Yer Numaras&#305;&#160;TA169.3 .L88 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Case studies in reliability and maintenance ent://SD_ILS/0/SD_ILS:300226 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Viewpoints and controversies in sensory science and consumer product testing ent://SD_ILS/0/SD_ILS:296001 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Moskowitz, Howard R.&#160;Mu&ntilde;oz, Alejandra M., 1957-&#160;Gacula, Maximo C.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanical reliability improvement : probability and statistics for experimental testing ent://SD_ILS/0/SD_ILS:541297 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Little, R. E. (Robert Eugene), 1933-&#160;Kosikowski, D. M.<br/>Yer Numaras&#305;&#160;TA169 L778 2003<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk analysis in engineering and economics ent://SD_ILS/0/SD_ILS:539259 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ayyub, Bilal M., author.<br/>Yer Numaras&#305;&#160;T174.5 .A98 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for failure mode and effects analysis for automotive, aerospace and general manufacturing industries ent://SD_ILS/0/SD_ILS:540286 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dyadem Press.<br/>Yer Numaras&#305;&#160;TS156 .G795 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135495480">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The civil engineering handbook ent://SD_ILS/0/SD_ILS:545860 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Chen, Wai-Fah, 1936-&#160;Liew, J. Y. Richard.<br/>Yer Numaras&#305;&#160;TA151 .C57 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420041217">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Instrument engineers' handbook. Process software and digital networks ent://SD_ILS/0/SD_ILS:543767 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Liptak, Bela G.&#160;Liptak, Bela G. Instrument engineers' handbook. Process measurement and analysis.&#160;Liptak, Bela G. Instrument engineers' handbook. Process control.<br/>Yer Numaras&#305;&#160;TS156.8 .I56 2002<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439863442">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Neale, M. J. (Michael John)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing capable and reliable products ent://SD_ILS/0/SD_ILS:153867 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Booker, J. D.&#160;Raines, M.&#160;Swift, K. G.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750650762">http://www.sciencedirect.com/science/book/9780750650762</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Aging power delivery infrastructures ent://SD_ILS/0/SD_ILS:545289 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Willis, H. Lee, 1949, author.&#160;Welch, Gregory V.&#160;Schrieber, Randall R.<br/>Yer Numaras&#305;&#160;TK1010 .W55 2001<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135553586">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:543493 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Yer Numaras&#305;&#160;TK7836 .D473 2001<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The communications facility design handbook ent://SD_ILS/0/SD_ILS:540489 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Whitaker, Jerry C., author.<br/>Yer Numaras&#305;&#160;TK7870 .W392 2000<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420041446">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:540912 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;R855.3 .D47 2000<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA174 .D4929 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Wolstenholme, Linda C.<br/>Yer Numaras&#305;&#160;TA 169 W65 1999<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Structural modeling and experimental techniques ent://SD_ILS/0/SD_ILS:542555 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Harris, Harry G.&#160;Sabnis, Gajanan M.<br/>Yer Numaras&#305;&#160;TA643 .H37 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420049589">https://www.taylorfrancis.com/books/9781420049589</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802295">https://www.taylorfrancis.com/books/9780367802295</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Cognitive reliability and error analysis method CREAM ent://SD_ILS/0/SD_ILS:254433 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Hollnagel, Erik, 1941-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems ent://SD_ILS/0/SD_ILS:249594 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Pukite, Jan, 1928-&#160;Pukite, Paul.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The design analysis handbook a practical guide to design validation ent://SD_ILS/0/SD_ILS:254797 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Walker, N. Edward.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for improving plant reliability through data collection and analysis ent://SD_ILS/0/SD_ILS:300022 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Yer Numaras&#305;&#160;TS 173 M44 1998<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Power System Commissioning and Maintenance Practice ent://SD_ILS/0/SD_ILS:247889 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Harker, Keith<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBPO024E">http://dx.doi.org/10.1049/PBPO024E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probability, statistics, reliability for engineers ent://SD_ILS/0/SD_ILS:75189 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Ayyub, Bilal M.&#160;McCuen, Richard H., 1941-<br/>Yer Numaras&#305;&#160;TA 330 A99 1997<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> System reliability theory models and statistical methods ent://SD_ILS/0/SD_ILS:295270 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;H&oslash;yland, Arnljot, 1924-&#160;Rausand, Marvin.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2025-12-07T20:59:54Z 2025-12-07T20:59:54Z Yazar&#160;Misra, Krishna B., 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>