Arama Sonuçları Reliability (Engineering) - Daraltılmış: 2004SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092004$0025092004$0026ic$003dtrue$0026ps$003d300?dt=list2026-06-05T07:48:02ZThe theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152026-06-05T07:48:02Z2026-06-05T07:48:02ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power distribution planning reference bookent://SD_ILS/0/SD_ILS:5419572026-06-05T07:48:02Z2026-06-05T07:48:02ZYazar Willis, H. Lee, 1949, author.<br/>Yer Numarası TK3091 .W55 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420030310">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842026-06-05T07:48:02Z2026-06-05T07:48:02ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>RCM gateway to world class maintenanceent://SD_ILS/0/SD_ILS:2547022026-06-05T07:48:02Z2026-06-05T07:48:02ZYazar Smith, Anthony M. Hinchcliffe, Glenn R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750674614">http://www.sciencedirect.com/science/book/9780750674614</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542026-06-05T07:48:02Z2026-06-05T07:48:02ZYazar LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası TA169.3 .L88 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical engineering failure analysisent://SD_ILS/0/SD_ILS:5453092026-06-05T07:48:02Z2026-06-05T07:48:02ZYazar Tawancy, Hani M., author. Abbas, Nureddin Mohamed. Ul-Hamid, Anwar.<br/>Yer Numarası TA169.5 .T39 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>