Arama Sonuçları Reliability (Engineering) - Daraltılmış: 2013SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092013$0025092013$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-30T03:58:25ZGas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:1459072024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Calixto, Eduardo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.ent://SD_ILS/0/SD_ILS:3052862024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Epperlein, Peter W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:3326822024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332682.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality Control Applicationsent://SD_ILS/0/SD_ILS:3308942024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Chorafas, Dimitris N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330894.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2966-0">http://dx.doi.org/10.1007/978-1-4471-2966-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Improving the Earthquake Resilience of Buildings The worst case approachent://SD_ILS/0/SD_ILS:3309162024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Takewaki, Izuru. author. Moustafa, Abbas. author. Fujita, Kohei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330916.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4144-0">http://dx.doi.org/10.1007/978-1-4471-4144-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Monte Carlo Simulation Method for System Reliability and Risk Analysisent://SD_ILS/0/SD_ILS:3310172024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Zio, Enrico. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331017.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Designent://SD_ILS/0/SD_ILS:3310972024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Tinga, T. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331097.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthdayent://SD_ILS/0/SD_ILS:3311092024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331109.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populationsent://SD_ILS/0/SD_ILS:3311212024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331121.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Using Game Theory to Improve Safety within Chemical Industrial Parksent://SD_ILS/0/SD_ILS:3311292024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Reniers, Genserik. author. Pavlova, Yulia. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331129.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5052-7">http://dx.doi.org/10.1007/978-1-4471-5052-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Analysis of Offshore Steel Structures An Analytical Appraisalent://SD_ILS/0/SD_ILS:3325802024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Karadeniz, Halil. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332580.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-190-5">http://dx.doi.org/10.1007/978-1-84996-190-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Infrastructure health in civil engineeringent://SD_ILS/0/SD_ILS:2893482024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Ettouney, Mohammed. Alampalli, Sreenivas.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420003758">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013ent://SD_ILS/0/SD_ILS:3569192024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor. Deodatis, G. (George), editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.<br/>Yer Numarası ONLINE(356919.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781315884882">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic models for dynamical systemsent://SD_ILS/0/SD_ILS:3639312024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Benaroya, Haym, 1954- author. Han, Seon Mi, author. Nagurka, Mark L., author.<br/>Yer Numarası TA169 B463 2013<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Strain-engineered MOSFETsent://SD_ILS/0/SD_ILS:2881472024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Maiti, C. K. Maiti, T. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466503472">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability models for engineers and scientistsent://SD_ILS/0/SD_ILS:2900302024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Kaminskiy, Mark, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466565937">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:3065662024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Wu, Bin, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reinforced concrete structural reliabilityent://SD_ILS/0/SD_ILS:2916602024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar El-Reedy, Mohamed Abdallah.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aging power delivery infrastructuresent://SD_ILS/0/SD_ILS:2916712024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Willis, H. Lee, 1949- Schrieber, Randall R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439896914">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear systems non-fragile control and filteringent://SD_ILS/0/SD_ILS:2872642024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Yang, Guang-Hong. Guo, Xiaqng-Gui. Che, Wei-Wei. Guan, Wei.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466580367">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>From materials to structures : advancement through innovationent://SD_ILS/0/SD_ILS:2874202024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Australasian Conference on the Mechanics of Structures and Materials (22nd : 2012 : Sydney, Australia) Samali, Bijan, editor. Attard, Mario M., editor. Song, Chongming, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203520017">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Systems engineering and safety building the bridgeent://SD_ILS/0/SD_ILS:2890772024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Glismann, Peter J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466552135">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fracture mechanics. 1, Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:3054242024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Grous, Ammar, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Introduction to thermodynamics of mechanical fatigueent://SD_ILS/0/SD_ILS:2871602024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Khonsari, Michael M. Amiri, Mehdi.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466511804">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced risk analysis in engineering enterprise systemsent://SD_ILS/0/SD_ILS:2871632024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Pinto, Cesar Ariel. Garvey, Paul R., 1956-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439826157">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examplesent://SD_ILS/0/SD_ILS:3650012024-11-30T03:58:25Z2024-11-30T03:58:25ZYazar Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Yer Numarası ONLINE(365001.1)<br/>Elektronik Erişim Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>