Arama Sonuçları Reliability (Engineering) - Daraltılmış: 2022SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092022$0025092022$0026ps$003d300?dt=list2026-06-03T11:12:59ZRELIABILITY ENGINEERING a life cycle approach.ent://SD_ILS/0/SD_ILS:5752972026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Bradley, Edgar.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability-based design in soil and rock engineeringent://SD_ILS/0/SD_ILS:5518892026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Low, Bak Kong, author.<br/>Yer Numarası TA705<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112297">https://www.taylorfrancis.com/books/9781003112297</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>DISCRETE STOCHASTIC MODELS AND APPLICATIONS FOR RELIABILITY ENGINEERING AND STATISTICAL QUALITY CONTROLent://SD_ILS/0/SD_ILS:5896232026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Eryilmaz, Serkan.<br/>Yer Numarası QA274.2<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003160632">https://www.taylorfrancis.com/books/9781003160632</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical modeling of reliability structures and industrial processesent://SD_ILS/0/SD_ILS:5644312026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003203124">https://www.taylorfrancis.com/books/9781003203124</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Product maturity. 1, Theoretical principals and industrial applicationsent://SD_ILS/0/SD_ILS:5974552026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Bayle, Franck, author.<br/>Yer Numarası TA169<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applicationsent://SD_ILS/0/SD_ILS:5974472026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Zio, Enrico, author. Li, Yan-Fu, author.<br/>Yer Numarası TA169 .Z57 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Operations research : methods, techniques, and advancementsent://SD_ILS/0/SD_ILS:5643512026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Kumar, Amit, editor. Ram, Mangey, editor.<br/>Yer Numarası T57.6<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003156291">https://www.taylorfrancis.com/books/9781003156291</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design of experiments for reliability achievementent://SD_ILS/0/SD_ILS:5975612026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Rigdon, Steven E., 1955- author. Pan, Rong (Professor of reliability engineering), author. Montgomery, Douglas C., author. Freeman, Laura June, author.<br/>Yer Numarası TS173 .R54 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optimal reliability-based design of structures against several natural hazardsent://SD_ILS/0/SD_ILS:5586592026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Ang, Alfredo Hua-Sing, 1930- author. De Leon, David (De Leon Escobido), author. Fan, Wenliang, author.<br/>Yer Numarası TA658 .A56 2022<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003177289">https://www.taylorfrancis.com/books/9781003177289</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust engineering designs of partial differential systems and their applicationsent://SD_ILS/0/SD_ILS:5674452026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Chen, Bor-Sen, author.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003229230">https://www.taylorfrancis.com/books/9781003229230</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Validity and reliability in built environment research : a selection of case studiesent://SD_ILS/0/SD_ILS:5690182026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Ahmed, Vian, editor. Opoku, Alex, editor. Olanipekun, Ayokunle, editor. Sutrisna, Monty, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243226">https://www.taylorfrancis.com/books/9780429243226</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Philosophies of structural safety and reliabilityent://SD_ILS/0/SD_ILS:5829332026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Raĭzer, V. D. (Vladimir Davidovich), author. Elishakoff, Isaac, author.<br/>Yer Numarası TA656<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modelling with information measuresent://SD_ILS/0/SD_ILS:5627312026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.<br/>Yer Numarası TA169 .N3526 2022 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VCSEL industry : communication and sensingent://SD_ILS/0/SD_ILS:5972292026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Padullaparthi, Babu Dayal, author. Tatum, Jim A., author. Iga, Kenʼichi, 1940- author.<br/>Yer Numarası TA1700<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Product maturity. 2, Principles and illustrationsent://SD_ILS/0/SD_ILS:5976112026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Bayle, Franck, author.<br/>Yer Numarası TA169<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Smart nanotextiles : wearable and technical applicationsent://SD_ILS/0/SD_ILS:5976662026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar Yilmaz, Nazire Deniz.<br/>Yer Numarası TS1767<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Physics-Of-Healthy in Mechatronics.ent://SD_ILS/0/SD_ILS:5981462026-06-03T11:12:59Z2026-06-03T11:12:59ZYazar El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.<br/>Yer Numarası TA169 .E515 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>