Arama Sonuçları Reliability (Engineering) - Daraltılmış: Electronic circuits.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ic$003dtrue$0026ps$003d300?dt=list
2025-12-08T08:35:11Z
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2025-12-08T08:35:11Z
2025-12-08T08:35:11Z
Yazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Interconnect Reliability in Advanced Memory Device Packaging
ent://SD_ILS/0/SD_ILS:526838
2025-12-08T08:35:11Z
2025-12-08T08:35:11Z
Yazar Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2025-12-08T08:35:11Z
2025-12-08T08:35:11Z
Yazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>