Arama Sonu&ccedil;lar&#305; Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-26T15:39:14Z Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Yer Numaras&#305;&#160;ONLINE(341870.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:287313 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. 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(Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to reliability engineering ent://SD_ILS/0/SD_ILS:47611 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Lewis, Elmer Eugene, 1938-<br/>Yer Numaras&#305;&#160;TA 169 L47 1987<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Fatigue and Fracture Reliability Engineering ent://SD_ILS/0/SD_ILS:168458 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Xiong, J.J. author.&#160;Shenoi, R.A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a 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href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Shooman, Martin L.<br/>Yer Numaras&#305;&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Kivenson, Gilbert.<br/>Yer Numaras&#305;&#160;TS 173 K57 1971<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Ayers, Mark L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice ent://SD_ILS/0/SD_ILS:401845 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;De Felice, Fabio. editor.&#160;Petrillo, Antonella. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering ent://SD_ILS/0/SD_ILS:485213 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Ali, Syed Riffat. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:482935 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Gunawan, Indra.<br/>Yer Numaras&#305;&#160;ONLINE(342010.1)<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Gas and oil reliability engineering modeling and analysis ent://SD_ILS/0/SD_ILS:145907 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Calixto, Eduardo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. ent://SD_ILS/0/SD_ILS:305286 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Epperlein, Peter W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332682.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Basic Concepts and Applications in ICT ent://SD_ILS/0/SD_ILS:194550 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Lazzaroni, Massimo. author.&#160;Cristaldi, Loredana. author.&#160;Peretto, Lorenzo. author.&#160;Rinaldi, Paola. author.&#160;Catelani, Marcantonio. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood function ent://SD_ILS/0/SD_ILS:133515 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Surhone, Lambert M.&#160;Timpledon, Miriam T.&#160;Marseken, Susan F.<br/>Yer Numaras&#305;&#160;H61 .S87 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:286084 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Wessels, William R.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420094404">Distributed by publisher. 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(Mohammad)&#160;Kaminskiy, Mark, 1946-&#160;Krivtsov, Vasiliy, 1963-<br/>Yer Numaras&#305;&#160;TA169 M627 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design ent://SD_ILS/0/SD_ILS:175745 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Stapelberg, Rudolph Frederick. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009 ent://SD_ILS/0/SD_ILS:288858 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan)&#160;Furuta, Hitoshi.&#160;Frangopol, Dan M.&#160;Shinozuka, Masanobu.&#160;Hirokane, Michiyuki.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. 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I. (Marius I.), 1948-&#160;B&#259;jenescu, Titu I., 1938-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781119990093">http://dx.doi.org/10.1002/9781119990093</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41699">http://www.books24x7.com/marc.asp?bookid=41699</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mine safety a modern approach ent://SD_ILS/0/SD_ILS:144518 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dhillon, B. S. 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S. author.&#160;Lind, N. C. author.&#160;Pandey, M. 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H. author.&#160;Murthy, D. N. Prabhakar. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-011-7">http://dx.doi.org/10.1007/978-1-84800-011-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Measurement Uncertainty An Approach via the Mathematical Theory of Evidence ent://SD_ILS/0/SD_ILS:166341 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Salicone, Simona. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-46328-5">http://dx.doi.org/10.1007/978-0-387-46328-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human Reliability and Error in Transportation Systems ent://SD_ILS/0/SD_ILS:175578 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dhillon, B. 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Prabhakar. author.&#160;Blischke, Wallace R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-258-6">http://dx.doi.org/10.1007/1-84628-258-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Universal Generating Function in Reliability Analysis and Optimization ent://SD_ILS/0/SD_ILS:175337 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Levitin, Gregory. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability strategies and implementation ent://SD_ILS/0/SD_ILS:295695 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Levin, Mark, 1959-&#160;Kalal, Ted T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a> <a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a> John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems ent://SD_ILS/0/SD_ILS:175839 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Seong, Poong Hyun. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. 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PLM in Transition Times: The Place of Humans and Transformative Technologies 19th IFIP WG 5.1 International Conference, PLM 2022, Grenoble, France, July 10-13, 2022, Revised Selected Papers ent://SD_ILS/0/SD_ILS:520558 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;No&euml;l, Fr&eacute;d&eacute;ric. editor.&#160;Nyffenegger, Felix. editor. (orcid)&#160;Rivest, Louis. editor.&#160;Bouras, Abdelaziz. editor. (orcid)&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(520558.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-25182-5">https://doi.org/10.1007/978-3-031-25182-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mathematical Foundations of Software Engineering A Practical Guide to Essentials ent://SD_ILS/0/SD_ILS:520574 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;O'Regan, Gerard. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(520574.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-26212-8">https://doi.org/10.1007/978-3-031-26212-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Body of Knowledge for Modeling and Simulation A Handbook by the Society for Modeling and Simulation International ent://SD_ILS/0/SD_ILS:520753 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;&Ouml;ren, Tuncer. editor.&#160;Zeigler, Bernard P. editor.&#160;Tolk, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(520753.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-11085-6">https://doi.org/10.1007/978-3-031-11085-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Web Services - ICWS 2023 30th International Conference, Held as Part of the Services Conference Federation, SCF 2023, Honolulu, HI, USA, September 23-26, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521181 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Zhang, Yuchao. editor.&#160;Zhang, Liang-Jie. editor. 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Sponsor.&#160;Deodatis, G. (George), editor.&#160;Ellingwood, Bruce R., editor.&#160;Frangopol, Dan M., editor.<br/>Yer Numaras&#305;&#160;ONLINE(356919.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781315884882">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;El-Reedy, Mohamed Abdallah.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. 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(Michael Havbro)&#160;Kh&#818;ler, Jochen, 1972-&#160;Nishijima, Kazuyoshi.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203144794">Distributed by publisher. 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(David John), 1943 June 22-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mission-critical and safety-critical systems handbook design and development for embedded applications ent://SD_ILS/0/SD_ILS:146227 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Fowler, Kim.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750685672">http://www.sciencedirect.com/science/book/9780750685672</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Calculation of Roundabouts Capacity, Waiting Phenomena and Reliability ent://SD_ILS/0/SD_ILS:190985 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Mauro, Raffaele. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Process risk and reliability management operational integrity management ent://SD_ILS/0/SD_ILS:147219 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Sutton, Ian S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and optimization of structural systems proceedings of Reliability and Optimization of Structural Systems, Tum, M&iquest;nchen, Germany, 7-10 April 2010 ent://SD_ILS/0/SD_ILS:289242 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Reliability and Optimization of Structural Systems (2010 : Tum, M&iquest;nchen, Germany)&#160;Straub, D.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203841419">Distributed by publisher. 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(King-Ning), 1937-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Numerical methods in geotechnical engineering proceedings of the seventh European Conference on Numerical Methods in Geotechnical Engineering, Trondheim, Norway, 2-4 June 2010 ent://SD_ILS/0/SD_ILS:286490 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;European Conference on Numerical Methods in Geotechnical Engineering (7th : 2010 : Trondeim, Norway)&#160;Nordal, Steinar.&#160;Benz, Thomas.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203842362">Distributed by publisher. 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S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mathematical models for systems reliability ent://SD_ILS/0/SD_ILS:287784 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Epstein, Benjamin, 1918-&#160;Weissman, Ishay, 1940-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420080834">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk-based reliability analysis and generic principles for risk reduction ent://SD_ILS/0/SD_ILS:148956 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Todinov, M. T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wire Ropes Tension, Endurance, Reliability ent://SD_ILS/0/SD_ILS:183848 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Feyrer, K. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A Guide to Lead-free Solders Physical Metallurgy and Reliability ent://SD_ILS/0/SD_ILS:175373 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Evans, John W. author.&#160;Engelmaier, Werner. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Curtis, Peter M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fault trees ent://SD_ILS/0/SD_ILS:302359 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Limnios, N. (Nikolaos)&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html">http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470612484">http://dx.doi.org/10.1002/9780470612484</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk analysis in engineering : techniques, tools, and trends ent://SD_ILS/0/SD_ILS:119534 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Modarres, Mohammad.<br/>Yer Numaras&#305;&#160;T174.5 M65 2006<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Uncertainty modeling and analysis in engineering and the sciences ent://SD_ILS/0/SD_ILS:290344 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Ayyub, Bilal M.&#160;Klir, George J., 1932-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420011456">Distributed by publisher. 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L. van.<br/>Yer Numaras&#305;&#160;QA76.5 K53 2006<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability and risk a Bayesian perspective ent://SD_ILS/0/SD_ILS:296819 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Singpurwalla, Nozer D.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and risk models : setting reliability requirements ent://SD_ILS/0/SD_ILS:119481 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Todinov, M. T.<br/>Yer Numaras&#305;&#160;TA169 .T65 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Sosyal ve davran&#305;&#351;sal &ouml;l&ccedil;&uuml;mlerde g&uuml;venilirlik ve ge&ccedil;erlilik ent://SD_ILS/0/SD_ILS:108201 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;&#350;encan, H&uuml;ner.<br/>Yer Numaras&#305;&#160;BF176 .S463 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:119553 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dhillon, B. S.<br/>Yer Numaras&#305;&#160;TS173 .D45 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:287285 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Plant and machinery failure prevention ent://SD_ILS/0/SD_ILS:293572 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Hattangadi, A. A.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/plant-machinery-failure-prevention">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and risk models setting reliability requirements ent://SD_ILS/0/SD_ILS:295900 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Todinov, M. T.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Flowgraph models for multistate time-to-event data ent://SD_ILS/0/SD_ILS:301633 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Huzurbazar, Aparna V., 1966-&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471686565">http://dx.doi.org/10.1002/0471686565</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:254854 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Smith, David John, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated testing and validation testing, engineering, and management tools for lean development ent://SD_ILS/0/SD_ILS:254184 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Porter, Alex.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical engineering failure analysis ent://SD_ILS/0/SD_ILS:288204 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Tawancy, Hani M.&#160;Ul-Hamid, Anwar.&#160;Abbas, Nureddin Mohamed.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203026298">Distributed by publisher. 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M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203910993">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for failure mode and effects analysis for automotive, aerospace and general manufacturing industries ent://SD_ILS/0/SD_ILS:287283 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dyadem Press.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203009680">Distributed by publisher. 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P.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Viewpoints and controversies in sensory science and consumer product testing ent://SD_ILS/0/SD_ILS:296001 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Moskowitz, Howard R.&#160;Mu&ntilde;oz, Alejandra M., 1957-&#160;Gacula, Maximo C.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Instrument engineers' handbook. Process software and digital networks ent://SD_ILS/0/SD_ILS:288861 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Liptk&#768;, B&#318;a G.&#160;Liptk&#768;, B&#318;a G. Instrument engineers' handbook. Process measurement and analysis.&#160;Liptk&#768;, B&#318;a G. Instrument engineers' handbook. Process control.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439863442">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing capable and reliable products ent://SD_ILS/0/SD_ILS:153867 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Booker, J. D.&#160;Raines, M.&#160;Swift, K. G.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750650762">http://www.sciencedirect.com/science/book/9780750650762</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:285886 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Neale, M. J. (Michael John)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:285959 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Wolstenholme, Linda C.<br/>Yer Numaras&#305;&#160;TA 169 W65 1999<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability fundamentals and applications ent://SD_ILS/0/SD_ILS:284992 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Yer Numaras&#305;&#160;TS 173 M44 1998<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems ent://SD_ILS/0/SD_ILS:249594 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Pukite, Jan, 1928-&#160;Pukite, Paul.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Cognitive reliability and error analysis method CREAM ent://SD_ILS/0/SD_ILS:254433 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Hollnagel, Erik, 1941-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The design analysis handbook a practical guide to design validation ent://SD_ILS/0/SD_ILS:254797 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Walker, N. Edward.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for improving plant reliability through data collection and analysis ent://SD_ILS/0/SD_ILS:300022 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probability, statistics, reliability for engineers ent://SD_ILS/0/SD_ILS:75189 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Ayyub, Bilal M.&#160;McCuen, Richard H., 1941-<br/>Yer Numaras&#305;&#160;TA 330 A99 1997<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Power System Commissioning and Maintenance Practice ent://SD_ILS/0/SD_ILS:247889 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Harker, Keith<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBPO024E">http://dx.doi.org/10.1049/PBPO024E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System reliability theory models and statistical methods ent://SD_ILS/0/SD_ILS:295270 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;H&oslash;yland, Arnljot, 1924-&#160;Rausand, Marvin.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Misra, Krishna B., 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis and prediction a methodology oriented treatment ent://SD_ILS/0/SD_ILS:255244 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Misra, Krishna B., 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated testing statistical models, test plans and data analyses ent://SD_ILS/0/SD_ILS:295259 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Nelson, Wayne, 1936-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability theory and models stochastic failure models, optimal maintenance policies, life testing, and structures ent://SD_ILS/0/SD_ILS:256119 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Abdel-Hameed, Mohamed S.&#160;&Ccedil;&#305;nlar, E. (Erhan), 1941-&#160;Quinn, Joseph.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120414208">http://www.sciencedirect.com/science/book/9780120414208</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied life data analysis ent://SD_ILS/0/SD_ILS:300248 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Nelson, Wayne, 1936-&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mathematical models for the study of the reliability of systems ent://SD_ILS/0/SD_ILS:256673 2024-11-26T15:39:14Z 2024-11-26T15:39:14Z Yazar&#160;Kaufmann, A. (Arnold), 1911-&#160;Grouchko, Daniel.&#160;Cruon, R.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124023703">http://www.sciencedirect.com/science/book/9780124023703</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>