Arama Sonuçları Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$0026pe$003dd$00253A$0026ps$003d300$0026isd$003dtrue?dt=list2024-12-27T09:27:55ZReliability engineeringent://SD_ILS/0/SD_ILS:3418702024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Yer Numarası ONLINE(341870.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
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Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical reliability engineeringent://SD_ILS/0/SD_ILS:3055632024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical reliability engineeringent://SD_ILS/0/SD_ILS:2950992024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic reliability engineeringent://SD_ILS/0/SD_ILS:2951012024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Safety Engineeringent://SD_ILS/0/SD_ILS:1761932024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Life cycle reliability engineeringent://SD_ILS/0/SD_ILS:2969262024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of reliability engineeringent://SD_ILS/0/SD_ILS:2951002024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Introduction to reliability engineeringent://SD_ILS/0/SD_ILS:476112024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Lewis, Elmer Eugene, 1938-<br/>Yer Numarası TA 169 L47 1987<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Fatigue and Fracture Reliability Engineeringent://SD_ILS/0/SD_ILS:1684582024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4894102024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:1928242024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:1852032024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software engineering : design, reliability and managementent://SD_ILS/0/SD_ILS:325612024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Shooman, Martin L.<br/>Yer Numarası QA 76.9.S88 S56 1983<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Durability and reliability in engineering desingent://SD_ILS/0/SD_ILS:482452024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kivenson, Gilbert.<br/>Yer Numarası TS 173 K57 1971<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Telecommunications system reliability engineering, theory, and practiceent://SD_ILS/0/SD_ILS:2493972024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Ayers, Mark L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Hydrosystems engineering reliability assessment and risk analysisent://SD_ILS/0/SD_ILS:2932152024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practiceent://SD_ILS/0/SD_ILS:4018452024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:4829352024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineeringent://SD_ILS/0/SD_ILS:4852132024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:3420102024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Gunawan, Indra.<br/>Yer Numarası ONLINE(342010.1)<br/>Elektronik Erişim Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.ent://SD_ILS/0/SD_ILS:3052862024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Epperlein, Peter W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a>
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W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332682.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:1459072024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Calixto, Eduardo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Engineering Basic Concepts and Applications in ICTent://SD_ILS/0/SD_ILS:1945502024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:1725712024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar McPherson, J.W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:2860842024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Wessels, William R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420094404">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:3638772024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Modarres, M. (Mohammad) Kaminskiy, Mark, 1946- Krivtsov, Vasiliy, 1963-<br/>Yer Numarası TA169 M627 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood functionent://SD_ILS/0/SD_ILS:1335152024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Surhone, Lambert M. Timpledon, Miriam T. Marseken, Susan F.<br/>Yer Numarası H61 .S87 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009ent://SD_ILS/0/SD_ILS:2888582024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) Furuta, Hitoshi. Frangopol, Dan M. Shinozuka, Masanobu. Hirokane, Michiyuki.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Reliability, Availability, Maintainability and Safety in Engineering Designent://SD_ILS/0/SD_ILS:1757452024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generationent://SD_ILS/0/SD_ILS:2868932024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliabilityent://SD_ILS/0/SD_ILS:1839932024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Bertsche, Bernd. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering design reliability applications for the aerospace, automotive, and ship industriesent://SD_ILS/0/SD_ILS:1530402024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1845342024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Levitin, Gregory. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliabilityent://SD_ILS/0/SD_ILS:1845352024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Levitin, Gregory. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System Signatures and their Applications in Engineering Reliabilityent://SD_ILS/0/SD_ILS:1668812024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Samaniego, Francisco J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:3016722024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar El-Haik, Basem.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a>
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Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability verification, testing and analysis in engineering designent://SD_ILS/0/SD_ILS:2856232024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Wasserman, Gary S., 1951-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203910443">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering maintainability how to design for reliability and easy maintenanceent://SD_ILS/0/SD_ILS:2543372024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human reliability analysis : a systems engineering approach with nuclear power plant applicationsent://SD_ILS/0/SD_ILS:695932024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dougherty, E. M. Fragola, J. R., ort. yaz.<br/>Yer Numarası TK 9153 D68 1988<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Graph theory in modern engineering computer aided design, control, optimization, reliability analysisent://SD_ILS/0/SD_ILS:2567272024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Henley, Ernest J. Williams, R. A. (Richard A.)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123408501">http://www.sciencedirect.com/science/book/9780123408501</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Technical System Maintenance Delay-Time-Based Modellingent://SD_ILS/0/SD_ILS:4834112024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Werbińska-Wojciechowska, Sylwia. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10788-8">https://doi.org/10.1007/978-3-030-10788-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering Design under Uncertainty and Health Prognosticsent://SD_ILS/0/SD_ILS:4873892024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Hu, Chao. author. Youn, Byeng D. author. Wang, Pingfeng. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-92574-5">https://doi.org/10.1007/978-3-319-92574-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Maintenance Policies for Shock and Damage Modelsent://SD_ILS/0/SD_ILS:3991782024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-70456-2">https://doi.org/10.1007/978-3-319-70456-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plantsent://SD_ILS/0/SD_ILS:4007262024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Varde, Prabhakar V. author. Pecht, Michael G. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-0090-5">https://doi.org/10.1007/978-981-13-0090-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Advances in Multi-state Systems Reliability Theory and Applicationsent://SD_ILS/0/SD_ILS:4010982024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Point Processes for Reliability Analysis Shocks and Repairable Systemsent://SD_ILS/0/SD_ILS:4023922024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Offshore Risk Assessment vol 2. Principles, Modelling and Applications of QRA Studiesent://SD_ILS/0/SD_ILS:4843122024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Vinnem, Jan-Erik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-5213-2">https://doi.org/10.1007/978-1-4471-5213-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Offshore Risk Assessment vol 1. Principles, Modelling and Applications of QRA Studiesent://SD_ILS/0/SD_ILS:4843352024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Vinnem, Jan-Erik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-5207-1">https://doi.org/10.1007/978-1-4471-5207-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Extended Warranties, Maintenance Service and Lease Contracts Modeling and Analysis for Decision-Makingent://SD_ILS/0/SD_ILS:4843742024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Murthy, D.N.Prabhakar. author. Jack, Nat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6440-1">https://doi.org/10.1007/978-1-4471-6440-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Reliability, Error, and Human Factors in Power Generationent://SD_ILS/0/SD_ILS:4876432024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Random Maintenance Policiesent://SD_ILS/0/SD_ILS:4879232024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6575-0">https://doi.org/10.1007/978-1-4471-6575-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Analysis of Offshore Steel Structures An Analytical Appraisalent://SD_ILS/0/SD_ILS:3325802024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Karadeniz, Halil. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332580.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-190-5">http://dx.doi.org/10.1007/978-1-84996-190-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality Control Applicationsent://SD_ILS/0/SD_ILS:3308942024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Chorafas, Dimitris N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330894.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2966-0">http://dx.doi.org/10.1007/978-1-4471-2966-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Improving the Earthquake Resilience of Buildings The worst case approachent://SD_ILS/0/SD_ILS:3309162024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Takewaki, Izuru. author. Moustafa, Abbas. author. Fujita, Kohei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330916.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4144-0">http://dx.doi.org/10.1007/978-1-4471-4144-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Monte Carlo Simulation Method for System Reliability and Risk Analysisent://SD_ILS/0/SD_ILS:3310172024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Zio, Enrico. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331017.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Designent://SD_ILS/0/SD_ILS:3310972024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Tinga, T. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331097.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthdayent://SD_ILS/0/SD_ILS:3311092024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331109.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populationsent://SD_ILS/0/SD_ILS:3311212024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331121.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Using Game Theory to Improve Safety within Chemical Industrial Parksent://SD_ILS/0/SD_ILS:3311292024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Reniers, Genserik. author. Pavlova, Yulia. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331129.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5052-7">http://dx.doi.org/10.1007/978-1-4471-5052-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysisent://SD_ILS/0/SD_ILS:2993772024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Carlson, Carl (Carl Seymour)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a>
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ebrary <a href="http://site.ebrary.com/id/10558143">http://site.ebrary.com/id/10558143</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintenance Management in Network Utilities Framework and Practical Implementationent://SD_ILS/0/SD_ILS:1734752024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Gómez Fernández, Juan F. author. Crespo Márquez, Adolfo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2757-4">http://dx.doi.org/10.1007/978-1-4471-2757-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atomic Information Technology Safety and Economy of Nuclear Power Plantsent://SD_ILS/0/SD_ILS:1735232024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Woo, Taeho. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4030-6">http://dx.doi.org/10.1007/978-1-4471-4030-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk and Interdependencies in Critical Infrastructures A Guideline for Analysisent://SD_ILS/0/SD_ILS:1735602024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Hokstad, Per. editor. Utne, Ingrid B. editor. Vatn, Jørn. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4661-2">http://dx.doi.org/10.1007/978-1-4471-4661-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inferenceent://SD_ILS/0/SD_ILS:1733902024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Thermal Power Plant Performance Analysisent://SD_ILS/0/SD_ILS:1734162024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar de Souza, Gilberto Francisco Martha. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2309-5">http://dx.doi.org/10.1007/978-1-4471-2309-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Systems Uncertainty Quantification and Propagationent://SD_ILS/0/SD_ILS:1734222024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Grigoriu, Mircea. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2327-9">http://dx.doi.org/10.1007/978-1-4471-2327-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Bayesian Inference for Probabilistic Risk Assessment A Practitioner's Guidebookent://SD_ILS/0/SD_ILS:1761812024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kelly, Dana. author. Smith, Curtis. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-187-5">http://dx.doi.org/10.1007/978-1-84996-187-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovations in Power Systems Reliabilityent://SD_ILS/0/SD_ILS:1684172024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Nonparametric Statistics in Reliabilityent://SD_ILS/0/SD_ILS:1684262024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Reliability Assessment with OR Applicationsent://SD_ILS/0/SD_ILS:1684542024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Replacement Models with Minimal Repairent://SD_ILS/0/SD_ILS:1684572024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Tadj, Lotfi. editor. Ouali, M.-Salah. editor. Yacout, Soumaya. editor. Ait-Kadi, Daoud. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-215-5">http://dx.doi.org/10.1007/978-0-85729-215-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Processes with Applications to Reliability Theoryent://SD_ILS/0/SD_ILS:1684752024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Techniques for Structural Health Monitoringent://SD_ILS/0/SD_ILS:1684782024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Gopalakrishnan, Srinivasan. author. Ruzzene, Massimo. author. Hanagud, Sathyanaraya. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-284-1">http://dx.doi.org/10.1007/978-0-85729-284-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applications of Finite Element Methods for Reliability Studies on ULSI Interconnectionsent://SD_ILS/0/SD_ILS:1684862024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dependability of Networked Computer-based Systemsent://SD_ILS/0/SD_ILS:1684882024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Verma, Ajit Kumar. author. Ajit, Srividya. author. Kumar, Manoj. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-318-3">http://dx.doi.org/10.1007/978-0-85729-318-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety and Risk Modeling and Its Applicationsent://SD_ILS/0/SD_ILS:1685112024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-470-8">http://dx.doi.org/10.1007/978-0-85729-470-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk Navigation Strategies for Major Capital Projects Beyond the Myth of Predictabilityent://SD_ILS/0/SD_ILS:1685412024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Rolstadås, Asbjørn. author. Hetland, Per Willy. author. Jergeas, George Farage. author. Westney, Richard E. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-594-1">http://dx.doi.org/10.1007/978-0-85729-594-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Warranty Data Collection and Analysisent://SD_ILS/0/SD_ILS:1685572024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Blischke, Wallace R. author. Karim, M. 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S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering Decisions for Life Quality How Safe is Safe Enough?ent://SD_ILS/0/SD_ILS:1760192024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nathwani, J. S. author. Lind, N. C. author. Pandey, M. D. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84882-602-1">http://dx.doi.org/10.1007/978-1-84882-602-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Complexity of Proceduralized Tasksent://SD_ILS/0/SD_ILS:1760682024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Park, Jinkyun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84882-791-2">http://dx.doi.org/10.1007/978-1-84882-791-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Advances in Reliability and Quality in Designent://SD_ILS/0/SD_ILS:1757162024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Complex System Maintenance Handbookent://SD_ILS/0/SD_ILS:1756702024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kobbacy, Khairy A. 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(George), editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.<br/>Yer Numarası ONLINE(356919.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781315884882">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic models for dynamical systemsent://SD_ILS/0/SD_ILS:3639312024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Benaroya, Haym, 1954- author. Han, Seon Mi, author. Nagurka, Mark L., author.<br/>Yer Numarası TA169 B463 2013<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Fracture mechanics. 1, Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:3054242024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Grous, Ammar, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examplesent://SD_ILS/0/SD_ILS:3650012024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Yer Numarası ONLINE(365001.1)<br/>Elektronik Erişim Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Machine component designent://SD_ILS/0/SD_ILS:2701362024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Juvinall, Robert C. Marshek, Kurt M. Juvinall, Robert C. Fundamentals of machine component design.<br/>Yer Numarası TJ230 J88 2012<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Semiconductors integrated circuit design for manufacturabilityent://SD_ILS/0/SD_ILS:2851202024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Balasinki, Artur.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439817155">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:2993862024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:3649072024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Tobias, Paul A. Trindade, David C.<br/>Yer Numarası TA169 T63 2012<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Analyses for Durability and System Design Lifetime A Multidisciplinary Approachent://SD_ILS/0/SD_ILS:2371582024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Saleh, Joseph H..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511546136">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Supportability engineering handbook implementation, measurement, and managementent://SD_ILS/0/SD_ILS:2935552024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Jones, James V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/supportability-engineering-handbook">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability centered maintenance (RCM) implementation made simpleent://SD_ILS/0/SD_ILS:2935712024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Bloom, Neil.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintaining Mission Critical Systems in a 24/7 Environmentent://SD_ILS/0/SD_ILS:2499252024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Curtis, Peter M., author. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design decisions under uncertainty with limited informationent://SD_ILS/0/SD_ILS:2864962024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nikolaidis, Efstratios. Mourelatos, Zissimos P. Pandey, Vijitashwa.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203834985">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Systems engineering tools and methodsent://SD_ILS/0/SD_ILS:2879742024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kamrani, Ali K. Azimi, Maryam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439809273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applications of statistics and probability in civil engineeringent://SD_ILS/0/SD_ILS:2900662024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar International Conference on Applications of Statistics and Probability in Civil Engineering (2011 : Z¿rich, Switzerland) Faber, M. H. (Michael Havbro) Kh̲ler, Jochen, 1972- Nishijima, Kazuyoshi.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203144794">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor Power Devices Physics, Characteristics, Reliabilityent://SD_ILS/0/SD_ILS:1915862024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantitative measurements for logisticsent://SD_ILS/0/SD_ILS:2936042024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Frohne, Philip T. SOLE--The International Society of Logistics.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/quantitative-measurements-for-logistics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:2987812024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Natvig, Bent, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:4594222024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Smith, David J. (David John), 1943 June 22-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:3129152024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Yer Numarası ONLINE(312915.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1491762024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Smith, David J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic thin-film reliabilityent://SD_ILS/0/SD_ILS:2781562024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Tu, K. N. (King-Ning), 1937-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, risk, and safety theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009 : Prague, Czech Republic, 7-19 September 2009ent://SD_ILS/0/SD_ILS:2883172024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar European Safety and Reliability Conference (2009 : Prague, Czech Republic) Bri?, Radim. Soares, C. Guedes. Martorell, Sebastiǹ.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203859759">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and optimization of structural systems proceedings of Reliability and Optimization of Structural Systems, Tum, M¿nchen, Germany, 7-10 April 2010ent://SD_ILS/0/SD_ILS:2892422024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Reliability and Optimization of Structural Systems (2010 : Tum, M¿nchen, Germany) Straub, D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203841419">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human reliability assessment theory and practiceent://SD_ILS/0/SD_ILS:2878182024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Spurgin, Anthony J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420068528">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances and trends in structural engineering, mechanics and computation proceedings of the Fourth International Conference on Structural Engineering, Mechanics and Computation, 6-8 September 2010, Cape Town, South Africaent://SD_ILS/0/SD_ILS:2884492024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar International Conference on Structural Engineering, Mechanics and Computation (4th : 2010 : Cape Town, South Africa) Zingoni, Alphose.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780415618151">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Calculation of Roundabouts Capacity, Waiting Phenomena and Reliabilityent://SD_ILS/0/SD_ILS:1909852024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Mauro, Raffaele. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Numerical methods in geotechnical engineering proceedings of the seventh European Conference on Numerical Methods in Geotechnical Engineering, Trondheim, Norway, 2-4 June 2010ent://SD_ILS/0/SD_ILS:2864902024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar European Conference on Numerical Methods in Geotechnical Engineering (7th : 2010 : Trondeim, Norway) Nordal, Steinar. Benz, Thomas.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203842362">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Architecting resilient systems accident avoidance and survival and recovery from disruptionsent://SD_ILS/0/SD_ILS:2978302024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Jackson, Scott.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470544013">http://dx.doi.org/10.1002/9780470544013</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10355233">http://site.ebrary.com/lib/alltitles/Doc?id=10355233</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mission-critical and safety-critical systems handbook design and development for embedded applicationsent://SD_ILS/0/SD_ILS:1462272024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Fowler, Kim.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750685672">http://www.sciencedirect.com/science/book/9780750685672</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Process risk and reliability management operational integrity managementent://SD_ILS/0/SD_ILS:1472192024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Sutton, Ian S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliability information and computer-based systemsent://SD_ILS/0/SD_ILS:2498792024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Bauer, Eric.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical system reliabilityent://SD_ILS/0/SD_ILS:1531462024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis and prediction with warranty data issues, strategies, and methodsent://SD_ILS/0/SD_ILS:2860482024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Rai, Bharatendra K. Singh, Nanua.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structural reliabilityent://SD_ILS/0/SD_ILS:2979782024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Lemaire, Maurice. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:2983962024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability technology, human error, and quality in health careent://SD_ILS/0/SD_ILS:2850362024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical models for systems reliabilityent://SD_ILS/0/SD_ILS:2877842024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Epstein, Benjamin, 1918- Weissman, Ishay, 1940-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420080834">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Silver Metallization Stability and Reliabilityent://SD_ILS/0/SD_ILS:1756772024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Guide to Lead-free Solders Physical Metallurgy and Reliabilityent://SD_ILS/0/SD_ILS:1753732024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Wire Ropes Tension, Endurance, Reliabilityent://SD_ILS/0/SD_ILS:1838482024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Feyrer, K. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fault treesent://SD_ILS/0/SD_ILS:3023592024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Limnios, N. (Nikolaos) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html">http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612484">http://dx.doi.org/10.1002/9780470612484</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Todinov, M. T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintaining mission critical systems in a 24/7 environmentent://SD_ILS/0/SD_ILS:2494852024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Curtis, Peter M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and risk a Bayesian perspectiveent://SD_ILS/0/SD_ILS:2968192024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Uncertainty modeling and analysis in engineering and the sciencesent://SD_ILS/0/SD_ILS:2903442024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Ayyub, Bilal M. Klir, George J., 1932-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420011456">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Assurance technologies principles and practices : a product, process, and system safety perspectiveent://SD_ILS/0/SD_ILS:2956282024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Raheja, Dev. Allocco, Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=54979&ref=toc">http://www.myilibrary.com?id=54979&ref=toc</a>
John Wiley <a href="http://dx.doi.org/10.1002/047000942X">http://dx.doi.org/10.1002/047000942X</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853">http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/62326785.html">http://catalog.hathitrust.org/api/volumes/oclc/62326785.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System reliability : concepts and applicationsent://SD_ILS/0/SD_ILS:3928252024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Klaassen, Klaas B., 1941- Peppen, Jack C. L. van.<br/>Yer Numarası QA76.5 K53 2006<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Risk analysis in engineering : techniques, tools, and trendsent://SD_ILS/0/SD_ILS:1195342024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Modarres, Mohammad.<br/>Yer Numarası T174.5 M65 2006<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:2872852024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:2548542024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Smith, David John, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Plant and machinery failure preventionent://SD_ILS/0/SD_ILS:2935722024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Hattangadi, A. A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/plant-machinery-failure-prevention">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Todinov, M. T. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Flowgraph models for multistate time-to-event dataent://SD_ILS/0/SD_ILS:3016332024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Huzurbazar, Aparna V., 1966- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471686565">http://dx.doi.org/10.1002/0471686565</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:1195532024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S.<br/>Yer Numarası TS173 .D45 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:1194812024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Todinov, M. T.<br/>Yer Numarası TA169 .T65 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilikent://SD_ILS/0/SD_ILS:1082012024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Şencan, Hüner.<br/>Yer Numarası BF176 .S463 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:2882352024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar LuValle, Michael J. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203492031">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical engineering failure analysisent://SD_ILS/0/SD_ILS:2882042024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Tawancy, Hani M. Ul-Hamid, Anwar. Abbas, Nureddin Mohamed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203026298">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>RCM gateway to world class maintenanceent://SD_ILS/0/SD_ILS:2547022024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Smith, Anthony M. Hinchcliffe, Glenn R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750674614">http://www.sciencedirect.com/science/book/9780750674614</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power distribution planning reference bookent://SD_ILS/0/SD_ILS:2903812024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Willis, H. Lee, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420030310">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Guidelines for failure mode and effects analysis for automotive, aerospace and general manufacturing industriesent://SD_ILS/0/SD_ILS:2872832024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dyadem Press.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203009680">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Guidelines for failure mode and effects analysis for medical devicesent://SD_ILS/0/SD_ILS:2892252024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dyadem Press.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203490112">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Viewpoints and controversies in sensory science and consumer product testingent://SD_ILS/0/SD_ILS:2960012024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Moskowitz, Howard R. Muñoz, Alejandra M., 1957- Gacula, Maximo C. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mechanical reliability improvement probability and statistics for experimental testingent://SD_ILS/0/SD_ILS:2864602024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Little, R. E. (Robert Eugene), 1933- Kosikowski, D. M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203910993">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering and economicsent://SD_ILS/0/SD_ILS:2873482024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Ayyub, Bilal M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203497692">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Case studies in reliability and maintenanceent://SD_ILS/0/SD_ILS:3002262024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instrument engineers' handbook. Process software and digital networksent://SD_ILS/0/SD_ILS:2888612024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Liptk̀, Bľa G. Liptk̀, Bľa G. Instrument engineers' handbook. Process measurement and analysis. Liptk̀, Bľa G. Instrument engineers' handbook. Process control.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439863442">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing capable and reliable productsent://SD_ILS/0/SD_ILS:1538672024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Booker, J. D. Raines, M. Swift, K. G.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750650762">http://www.sciencedirect.com/science/book/9780750650762</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Neale, M. J. (Michael John)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2858862024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Crow, Dana. Feinberg, Alec.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:2859592024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modeling, prediction, and optimizationent://SD_ILS/0/SD_ILS:3003372024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design reliability fundamentals and applicationsent://SD_ILS/0/SD_ILS:2849922024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:2544662024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modelling : A statistical approachent://SD_ILS/0/SD_ILS:781392024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Wolstenholme, Linda C.<br/>Yer Numarası TA 169 W65 1999<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Cognitive reliability and error analysis method CREAMent://SD_ILS/0/SD_ILS:2544332024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Hollnagel, Erik, 1941-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The design analysis handbook a practical guide to design validationent://SD_ILS/0/SD_ILS:2547972024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Walker, N. Edward.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Guidelines for improving plant reliability through data collection and analysisent://SD_ILS/0/SD_ILS:3000222024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods for reliability dataent://SD_ILS/0/SD_ILS:850802024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Meeker, William Q. Escobar, Luis A., ort. yaz.<br/>Yer Numarası TS 173 M44 1998<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systemsent://SD_ILS/0/SD_ILS:2495942024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Pukite, Jan, 1928- Pukite, Paul.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power System Commissioning and Maintenance Practiceent://SD_ILS/0/SD_ILS:2478892024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Harker, Keith<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBPO024E">http://dx.doi.org/10.1049/PBPO024E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:2543252024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability, statistics, reliability for engineersent://SD_ILS/0/SD_ILS:751892024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Ayyub, Bilal M. McCuen, Richard H., 1941-<br/>Yer Numarası TA 330 A99 1997<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>System reliability theory models and statistical methodsent://SD_ILS/0/SD_ILS:2952702024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>New trends in system reliability evaluationent://SD_ILS/0/SD_ILS:2552432024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis and prediction a methodology oriented treatmentent://SD_ILS/0/SD_ILS:2552442024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nelson, Wayne, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability fundamentalsent://SD_ILS/0/SD_ILS:2552152024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability theory and models stochastic failure models, optimal maintenance policies, life testing, and structuresent://SD_ILS/0/SD_ILS:2561192024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Abdel-Hameed, Mohamed S. Çınlar, E. (Erhan), 1941- Quinn, Joseph.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120414208">http://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied life data analysisent://SD_ILS/0/SD_ILS:3002482024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Nelson, Wayne, 1936- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical models for the study of the reliability of systemsent://SD_ILS/0/SD_ILS:2566732024-12-27T09:27:55Z2024-12-27T09:27:55ZYazar Kaufmann, A. (Arnold), 1911- Grouchko, Daniel. Cruon, R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124023703">http://www.sciencedirect.com/science/book/9780124023703</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>