Arama Sonuçları Reliability (Engineering) -- Mathematical models.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529$002b--$002bMathematical$002bmodels.$0026pe$003dd$00253A$0026ps$003d300?2025-01-16T05:41:35ZThe theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability models for engineers and scientistsent://SD_ILS/0/SD_ILS:2900302025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Kaminskiy, Mark, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466565937">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic models for dynamical systemsent://SD_ILS/0/SD_ILS:3639312025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Benaroya, Haym, 1954- author. Han, Seon Mi, author. Nagurka, Mark L., author.<br/>Yer Numarası TA169 B463 2013<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability and maintenance networks and systemsent://SD_ILS/0/SD_ILS:2861482025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Beichelt, Frank, 1942- Tittmann, Peter.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439826362">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Ushakov, I. A. (Igorʹ Alekseevich)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human reliability and error in transportation systemsent://SD_ILS/0/SD_ILS:2713342025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Dhillon, B. S.<br/>Yer Numarası TA1145 D45 2007<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability and risk a Bayesian perspectiveent://SD_ILS/0/SD_ILS:2968192025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Todinov, M. T. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:1194812025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Todinov, M. T.<br/>Yer Numarası TA169 .T65 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systemsent://SD_ILS/0/SD_ILS:2495942025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Pukite, Jan, 1928- Pukite, Paul.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis and prediction a methodology oriented treatmentent://SD_ILS/0/SD_ILS:2552442025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical models for the study of the reliability of systemsent://SD_ILS/0/SD_ILS:2566732025-01-16T05:41:35Z2025-01-16T05:41:35ZYazar Kaufmann, A. (Arnold), 1911- Grouchko, Daniel. Cruon, R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124023703">http://www.sciencedirect.com/science/book/9780124023703</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>