Arama Sonuçları Reliability (Engineering) -- Statistical methods

Reliability prediction for microelectronics

2026-01-20T21:37:28Z

Yazar Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Yer Numarası TK7874
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries

2026-01-20T21:37:28Z

Yazar El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.
Yer Numarası TA169 .A67 2023
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Modeling remaining useful life dynamics in reliability engineering

2026-01-20T21:37:28Z

Yazar Dersin, Pierre, author.
Yer Numarası TS173
Elektronik Erişim Taylor & Francis https://www.taylorfrancis.com/books/9781003250685 OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Reliability modelling with information measures

2026-01-20T21:37:28Z

Yazar Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.
Yer Numarası TA169 .N3526 2022 EB
Elektronik Erişim Taylor & Francis https://www.taylorfrancis.com/books/9781003309635 OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Design of experiments for reliability achievement

2026-01-20T21:37:28Z

Yazar Rigdon, Steven E., 1955- author. Pan, Rong (Professor of reliability engineering), author. Montgomery, Douglas C., author. Freeman, Laura June, author.
Yer Numarası TS173 .R54 2022
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Statistical modeling of reliability structures and industrial processes

2026-01-20T21:37:28Z

Yazar Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.
Yer Numarası TA169
Elektronik Erişim Taylor & Francis https://www.taylorfrancis.com/books/9781003203124 OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Modern industrial statistics : with applications in R, MINITAB and JMP

2026-01-20T21:37:28Z

Yazar Kenett, Ron, author. Zacks, Shelemyahu, 1932- author. Amberti, Daniele, author.
Yer Numarası TS156 .K46 2021
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties

2026-01-20T21:37:28Z

Yazar Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Yer Numarası QC88
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Achieving Product Reliability : A Key to Business Success.

2026-01-20T21:37:28Z

Yazar Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.
Yer Numarası TS156
Elektronik Erişim Taylor & Francis https://www.taylorfrancis.com/books/9781003181361 OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Stochastic models in reliability engineering

2026-01-20T21:37:28Z

Yazar Cui, Lirong, 1960- editor. Frenkel, Ilia, 1950- editor. Lisnianski, Anatoly, editor.
Yer Numarası TA169 .S759 2020 EB
Elektronik Erişim Taylor & Francis https://www.taylorfrancis.com/books/9780429331527 OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Practical applications of Bayesian reliability

2026-01-20T21:37:28Z

Yazar Liu, Yan, author. Abeyratne, Athula I., author.
Yer Numarası QA279.5
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Robust statistics : theory and methods (with R)

2026-01-20T21:37:28Z

Yazar Maronna, Ricardo A., author. Martin, R. Douglas, author. Yohai, Víctor J., author.
Yer Numarası QA276 .M336 2019
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Analytic methods in systems and software testing

2026-01-20T21:37:28Z

Yazar Kenett, Ron, editor. Ruggeri, Fabrizio, editor. Faltin, Frederick W., editor.
Yer Numarası QA76.76 .T48 A52 2018 EB
Elektronik Erişim https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Semi-Markov processes : applications in system reliability and maintenance

2026-01-20T21:37:28Z

Yazar Grabski, Franciszek, author.
Yer Numarası ONLINE(355517.1)
Elektronik Erişim ScienceDirect http://www.sciencedirect.com/science/book/9780128005187
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Modern industrial statistics : with applications in R, MINITAB and JMP

2026-01-20T21:37:28Z

Yazar Kenett, Ron. Amberti, Daniele, contributor. Zacks, Shelemyahu, 1932-
Yer Numarası ONLINE(341751.1)
Elektronik Erişim John Wiley http://dx.doi.org/10.1002/9781118763667
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Risk and Reliability : Coastal and Hydraulic Engineering

2026-01-20T21:37:28Z

Yazar Reeve, Dominic, author.
Yer Numarası TC205 .R448 2014
Elektronik Erişim Click here to view.
Format: Kitap
Durum Çevrimiçi Kütüphane~1

Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications

2026-01-20T21:37:28Z

Yazar Wu, Bin, author.
Yer Numarası ONLINE
Elektronik Erişim ScienceDirect http://www.sciencedirect.com/science/book/9780124077119
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Applications of Statistics and Probability in Civil Engineering.

2026-01-20T21:37:28Z

Yazar Faber, Michael, editor
Yer Numarası TA340
Elektronik Erişim Taylor & Francis https://www.taylorfrancis.com/books/9780429217319 OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Flowgraph models for multistate time-to-event data

2026-01-20T21:37:28Z

Yazar Huzurbazar, Aparna V., 1966- John Wiley & Sons.
Yer Numarası ONLINE
Elektronik Erişim John Wiley http://dx.doi.org/10.1002/0471686565
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Engineering design reliability handbook

2026-01-20T21:37:28Z

Yazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.
Yer Numarası TA174 .E544 2005
Elektronik Erişim Click here to view.
Format: Kitap
Durum Çevrimiçi Kütüphane~1

Reliability modelling : A statistical approach

2026-01-20T21:37:28Z

Yazar Wolstenholme, Linda C.
Yer Numarası TA 169 W65 1999
Format: Kitap
Durum Beytepe Kütüphanesi~1

Statistical reliability engineering

2026-01-20T21:37:28Z

Yazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)
Yer Numarası ONLINE
Elektronik Erişim John Wiley http://dx.doi.org/10.1002/9780470172407 Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/98038904.html
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Statistical methods for reliability data

2026-01-20T21:37:28Z

Yazar Meeker, William Q. Escobar, Luis A., ort. yaz.
Yer Numarası TS 173 M44 1998
Format: Kitap
Durum Beytepe Kütüphanesi~1

Guidelines for improving plant reliability through data collection and analysis

2026-01-20T21:37:28Z

Yazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)
Yer Numarası ONLINE
Elektronik Erişim John Wiley http://dx.doi.org/10.1002/9780470935262
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

System reliability theory models and statistical methods

2026-01-20T21:37:28Z

Yazar Høyland, Arnljot, 1924- Rausand, Marvin.
Yer Numarası ONLINE
Elektronik Erişim Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047 John Wiley http://dx.doi.org/10.1002/9780470316900 Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/30072858.html
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Reliability analysis and prediction a methodology oriented treatment

2026-01-20T21:37:28Z

Yazar Misra, Krishna B., 1943-
Yer Numarası ONLINE
Elektronik Erişim ScienceDirect http://www.sciencedirect.com/science/book/9780444896063
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1

Accelerated testing statistical models, test plans and data analyses

2026-01-20T21:37:28Z

Yazar Nelson, Wayne, 1936-
Yer Numarası ONLINE
Elektronik Erişim Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757 John Wiley http://dx.doi.org/10.1002/9780470316795 Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html
Format: Elektrnik Kaynak
Durum Çevrimiçi Kütüphane~1