Arama Sonu&ccedil;lar&#305; Reliability (Engineering). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529.$0026ps$003d300$0026isd$003dtrue? 2026-02-20T22:16:58Z Reliability engineering ent://SD_ILS/0/SD_ILS:596162 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Elsayed, Elsayed A., author.<br/>Yer Numaras&#305;&#160;TA169 .E52 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Yer Numaras&#305;&#160;ONLINE(341870.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:544208 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;TA174 .E544 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability engineering and services ent://SD_ILS/0/SD_ILS:594657 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Jin, Tongdan, author.<br/>Yer Numaras&#305;&#160;TS173 .J56 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to reliability engineering ent://SD_ILS/0/SD_ILS:47611 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Lewis, Elmer Eugene, 1938-<br/>Yer Numaras&#305;&#160;TA 169 L47 1987<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Introduction to Quality and Reliability Engineering ent://SD_ILS/0/SD_ILS:529803 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Jiang, Renyan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-662-47215-6">https://doi.org/10.1007/978-3-662-47215-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fatigue and Fracture Reliability Engineering ent://SD_ILS/0/SD_ILS:168458 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Xiong, J.J. author.&#160;Shenoi, R.A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic models in reliability engineering ent://SD_ILS/0/SD_ILS:554549 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Cui, Lirong, 1960- editor.&#160;Frenkel, Ilia, 1950- editor.&#160;Lisnianski, Anatoly, editor.<br/>Yer Numaras&#305;&#160;TA169 .S759 2020 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429331527">https://www.taylorfrancis.com/books/9780429331527</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability in civil engineering ent://SD_ILS/0/SD_ILS:599747 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Jin, Wei-Liang, author.&#160;Ye, Qian, author.&#160;Bai, Yong, author.<br/>Yer Numaras&#305;&#160;TA633 .J56 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119419044">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119419044</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational intelligence in sustainable reliability engineering ent://SD_ILS/0/SD_ILS:598272 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Malik, S. C., editor.<br/>Yer Numaras&#305;&#160;TA169 .C65 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> RELIABILITY ENGINEERING a life cycle approach. ent://SD_ILS/0/SD_ILS:575297 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Bradley, Edgar.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Cloud reliability engineering : technologies and tools ent://SD_ILS/0/SD_ILS:571108 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Raj, Pethuru, editor.&#160;Achary, Rathnakar, editor.<br/>Yer Numaras&#305;&#160;QA76.585 .C568 2021<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003030973">https://www.taylorfrancis.com/books/9781003030973</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk and reliability in geotechnical engineering ent://SD_ILS/0/SD_ILS:544526 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ching, Jianye, editor.&#160;Phoon, Kok-Kwang, editor.<br/>Yer Numaras&#305;&#160;TA706 .R48 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482227222">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:489410 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:192824 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Shooman, Martin L.<br/>Yer Numaras&#305;&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kivenson, Gilbert.<br/>Yer Numaras&#305;&#160;TS 173 K57 1971<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Risk and Reliability : Coastal and Hydraulic Engineering ent://SD_ILS/0/SD_ILS:541176 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Reeve, Dominic, author.<br/>Yer Numaras&#305;&#160;TC205 .R448 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ayers, Mark L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday ent://SD_ILS/0/SD_ILS:527804 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Liu, Yu. editor.&#160;Wang, Dong. editor.&#160;Mi, Jinhua. editor.&#160;Li, He. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a 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Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003140092">https://www.taylorfrancis.com/books/9781003140092</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability management and engineering : challenges and future trends ent://SD_ILS/0/SD_ILS:583504 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Garg, Harish, editor.&#160;Ram, Mangey, editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429268922">https://www.taylorfrancis.com/books/9780429268922</a> OCLC metadata license agreement <a 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(orcid)0000-0003-4541-2693&#160;Zaitseva, Elena. editor.&#160;Kvassay, Miroslav. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> DISCRETE STOCHASTIC MODELS AND APPLICATIONS FOR RELIABILITY ENGINEERING AND STATISTICAL QUALITY CONTROL ent://SD_ILS/0/SD_ILS:589623 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Eryilmaz, Serkan.<br/>Yer Numaras&#305;&#160;QA274.2<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003160632">https://www.taylorfrancis.com/books/9781003160632</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability-based design in soil and rock engineering ent://SD_ILS/0/SD_ILS:551889 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Low, Bak Kong, author.<br/>Yer Numaras&#305;&#160;TA705<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112297">https://www.taylorfrancis.com/books/9781003112297</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:482935 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering ent://SD_ILS/0/SD_ILS:485213 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ali, Syed Riffat. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Gunawan, Indra.<br/>Yer Numaras&#305;&#160;ONLINE(342010.1)<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332682.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. ent://SD_ILS/0/SD_ILS:305286 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Epperlein, Peter W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Gas and oil reliability engineering modeling and analysis ent://SD_ILS/0/SD_ILS:145907 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Calixto, Eduardo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Basic Concepts and Applications in ICT ent://SD_ILS/0/SD_ILS:194550 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Lazzaroni, Massimo. author.&#160;Cristaldi, Loredana. author.&#160;Peretto, Lorenzo. author.&#160;Rinaldi, Paola. author.&#160;Catelani, Marcantonio. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:547196 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Wessels, William R., author.<br/>Yer Numaras&#305;&#160;TS173 .W45 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood function ent://SD_ILS/0/SD_ILS:133515 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Surhone, Lambert M.&#160;Timpledon, Miriam T.&#160;Marseken, Susan F.<br/>Yer Numaras&#305;&#160;H61 .S87 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability engineering and risk analysis : a practical guide ent://SD_ILS/0/SD_ILS:363877 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Modarres, M. (Mohammad)&#160;Kaminskiy, Mark, 1946-&#160;Krivtsov, Vasiliy, 1963-<br/>Yer Numaras&#305;&#160;TA169 M627 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009 ent://SD_ILS/0/SD_ILS:546575 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan)&#160;CRC Press.<br/>Yer Numaras&#305;&#160;TA168 .I58 2009<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781439847657">https://www.taylorfrancis.com/books/9781439847657</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367803667">https://www.taylorfrancis.com/books/9780367803667</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation ent://SD_ILS/0/SD_ILS:547574 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TA167 .D468 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439803844">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design ent://SD_ILS/0/SD_ILS:175745 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Stapelberg, Rudolph Frederick. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability applications : for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:539978 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;TA174 .E54 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420051339">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability ent://SD_ILS/0/SD_ILS:183993 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Bertsche, Bernd. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability applications for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:153040 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.&#160;CRC Press.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimization ent://SD_ILS/0/SD_ILS:184534 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Levitin, Gregory. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliability ent://SD_ILS/0/SD_ILS:184535 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Levitin, Gregory. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System Signatures and their Applications in Engineering Reliability ent://SD_ILS/0/SD_ILS:166881 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Samaniego, Francisco J. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i 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S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability analysis : a systems engineering approach with nuclear power plant applications ent://SD_ILS/0/SD_ILS:69593 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dougherty, E. M.&#160;Fragola, J. R., ort. yaz.<br/>Yer Numaras&#305;&#160;TK 9153 D68 1988<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Graph theory in modern engineering computer aided design, control, optimization, reliability analysis ent://SD_ILS/0/SD_ILS:256727 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Henley, Ernest J.&#160;Williams, R. A. 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Yazar&#160;Woo, Seongwoo. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Interconnect Reliability in Advanced Memory Device Packaging ent://SD_ILS/0/SD_ILS:526838 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Gan, Chong Leong,. author.&#160;Huang, Chen-Yu,. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Which-Is-Better (WIB): Problems in Reliability Theory ent://SD_ILS/0/SD_ILS:526867 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Mizutani, Satoshi. 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Yazar&#160;Werbi&#324;ska-Wojciechowska, Sylwia. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-10788-8">https://doi.org/10.1007/978-3-030-10788-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering Design under Uncertainty and Health Prognostics ent://SD_ILS/0/SD_ILS:487389 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Hu, Chao. author.&#160;Youn, Byeng D. author.&#160;Wang, Pingfeng. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-92574-5">https://doi.org/10.1007/978-3-319-92574-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Maintenance Policies for Shock and Damage Models ent://SD_ILS/0/SD_ILS:399178 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Zhao, Xufeng. author.&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-70456-2">https://doi.org/10.1007/978-3-319-70456-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk-Based Engineering An Integrated Approach to Complex Systems&mdash;Special Reference to Nuclear Plants ent://SD_ILS/0/SD_ILS:400726 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Varde, Prabhakar V. author.&#160;Pecht, Michael G. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-13-0090-5">https://doi.org/10.1007/978-981-13-0090-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Advances in Multi-state Systems Reliability Theory and Applications 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S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Offshore Risk Assessment vol 2. Principles, Modelling and Applications of QRA Studies ent://SD_ILS/0/SD_ILS:484312 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Vinnem, Jan-Erik. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4471-5213-2">https://doi.org/10.1007/978-1-4471-5213-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Offshore Risk Assessment vol 1. 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Yazar&#160;Chorafas, Dimitris N. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330894.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2966-0">http://dx.doi.org/10.1007/978-1-4471-2966-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving the Earthquake Resilience of Buildings The worst case approach ent://SD_ILS/0/SD_ILS:330916 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Takewaki, Izuru. author.&#160;Moustafa, Abbas. author.&#160;Fujita, Kohei. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330916.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4144-0">http://dx.doi.org/10.1007/978-1-4471-4144-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on 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Rezaul. author.&#160;Murthy, D. N. Prabhakar. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-647-4">http://dx.doi.org/10.1007/978-0-85729-647-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety of Complex Technical Systems and Processes Modeling &ndash; Identification &ndash; Prediction - Optimization ent://SD_ILS/0/SD_ILS:168571 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ko&#322;owrocki, Krzysztof. author.&#160;Soszy&#324;ska-Budny, Joanna. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bayesian Inference for Probabilistic Risk Assessment A Practitioner's Guidebook ent://SD_ILS/0/SD_ILS:176181 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kelly, Dana. author.&#160;Smith, Curtis. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-187-5">http://dx.doi.org/10.1007/978-1-84996-187-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability technology principles and practice of failure prevention in electronic systems ent://SD_ILS/0/SD_ILS:298817 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Pascoe, Norman.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Failure analysis a practical guide for manufacturers of electronic components and systems ent://SD_ILS/0/SD_ILS:305690 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;B&acirc;zu, M. I. (Marius I.), 1948-&#160;B&#259;jenescu, Titu I., 1938-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781119990093">http://dx.doi.org/10.1002/9781119990093</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41699">http://www.books24x7.com/marc.asp?bookid=41699</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Simulation Methods for Reliability and Availability of Complex Systems ent://SD_ILS/0/SD_ILS:175923 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Faulin, Javier. editor.&#160;Juan, Angel A. editor.&#160;Martorell, Sebasti&aacute;n. editor.&#160;Ram&iacute;rez-M&aacute;rquez, Jos&eacute;-Emmanuel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintenance for Industrial Systems ent://SD_ILS/0/SD_ILS:176011 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Manzini, Riccardo. author.&#160;Regattieri, Alberto. author.&#160;Pham, Hoang. author.&#160;Ferrari, Emilio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-575-8">http://dx.doi.org/10.1007/978-1-84882-575-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risks in Technological Systems ent://SD_ILS/0/SD_ILS:176029 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Grimvall, G&ouml;ran. editor.&#160;Holmgren, &Aring;ke J. editor.&#160;Jacobsson, Per. editor.&#160;Thed&eacute;en, Torbj&ouml;rn. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-641-0">http://dx.doi.org/10.1007/978-1-84882-641-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mine safety a modern approach ent://SD_ILS/0/SD_ILS:144518 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Complex System Reliability Multichannel Systems with Imperfect Fault Coverage ent://SD_ILS/0/SD_ILS:176244 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Myers, Albert. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering Decisions for Life Quality How Safe is Safe Enough? ent://SD_ILS/0/SD_ILS:176019 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Nathwani, J. S. author.&#160;Lind, N. C. author.&#160;Pandey, M. 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Prabhakar. author.&#160;Blischke, Wallace R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-258-6">http://dx.doi.org/10.1007/1-84628-258-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Universal Generating Function in Reliability Analysis and Optimization ent://SD_ILS/0/SD_ILS:175337 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Levitin, Gregory. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability strategies and implementation ent://SD_ILS/0/SD_ILS:295695 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Levin, Mark, 1959-&#160;Kalal, Ted T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a> <a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a> John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing faultless mechanical products based on advanced reliability analysis ent://SD_ILS/0/SD_ILS:590951 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Woo, Seongwoo, 1966- author.<br/>Yer Numaras&#305;&#160;TS173<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003451471">https://www.taylorfrancis.com/books/9781003451471</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System reliability analysis : transition from binary to multi-state models ent://SD_ILS/0/SD_ILS:591002 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kumar, Akshay, editor.&#160;Ram, Mangey, editor.&#160;Gaonkar, Rajesh S. 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K&uuml;t&uuml;phane~1<br/> Statistical modeling of reliability structures and industrial processes ent://SD_ILS/0/SD_ILS:564431 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Triantafyllou, Ioannis S., editor.&#160;Ram, Mangey, editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003203124">https://www.taylorfrancis.com/books/9781003203124</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applications ent://SD_ILS/0/SD_ILS:597447 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Zio, Enrico, author.&#160;Li, Yan-Fu, author.<br/>Yer Numaras&#305;&#160;TA169 .Z57 2022<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product maturity. 1, Theoretical principals and industrial applications ent://SD_ILS/0/SD_ILS:597455 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Bayle, Franck, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multi-physics optimization : mechanics, fluid interaction structure, shaping, stochastic finite elements, random vibrations, fatigue ent://SD_ILS/0/SD_ILS:600124 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Yer Numaras&#305;&#160;TA347 .F5 E43 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Predictive safety analytics : reducing risk through modeling and machine learning ent://SD_ILS/0/SD_ILS:550242 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Stevens, Robert (Analytics consultant), author.<br/>Yer Numaras&#305;&#160;T55.3 .S72<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003364153">https://www.taylorfrancis.com/books/9781003364153</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Intelligent prognostics for engineering systems with machine learning techniques ent://SD_ILS/0/SD_ILS:579335 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Soni, Gunjan, editor.&#160;Yadav, Om Prakash, 1964- editor.&#160;Badhotiya, Gaurav Kumar, editor.&#160;Ram, Mangey, editor.<br/>Yer Numaras&#305;&#160;TA153<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003434849">https://www.taylorfrancis.com/books/9781003434849</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software reliability techniques for real-world applications ent://SD_ILS/0/SD_ILS:598123 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Youree, Roger K., author.<br/>Yer Numaras&#305;&#160;QA76.76 .R44<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Operations research : methods, techniques, and advancements ent://SD_ILS/0/SD_ILS:564351 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kumar, Amit, editor.&#160;Ram, Mangey, editor.<br/>Yer Numaras&#305;&#160;T57.6<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003156291">https://www.taylorfrancis.com/books/9781003156291</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design of mechanical systems based on statistics : a guide to improving product reliability ent://SD_ILS/0/SD_ILS:585409 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Woo, Seong-woo, author.<br/>Yer Numaras&#305;&#160;TJ245.5<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429022050">https://www.taylorfrancis.com/books/9780429022050</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Predictive analytics : modeling and optimization ent://SD_ILS/0/SD_ILS:562435 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kumar, Vijay, editor.&#160;Ram, Mangey, editor.<br/>Yer Numaras&#305;&#160;TA340<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003083177">https://www.taylorfrancis.com/books/9781003083177</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied systems analysis : science and art of solving real-life problems ent://SD_ILS/0/SD_ILS:574968 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Tarasenko, F. P. (Feliks Petrovich), author.<br/>Yer Numaras&#305;&#160;T57.6<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003054290">https://www.taylorfrancis.com/books/9781003054290</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lubrication degradation : getting into the root causes ent://SD_ILS/0/SD_ILS:564528 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Mathura, Sanya, author.&#160;Latino, Robert J., author.<br/>Yer Numaras&#305;&#160;TJ1077<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003252030">https://www.taylorfrancis.com/books/9781003252030</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for excellence in electronics manufacturing ent://SD_ILS/0/SD_ILS:596229 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Tulkoff, Cheryl, author.&#160;Caswell, Greg, author.<br/>Yer Numaras&#305;&#160;TK7870 .T845 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119109402">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119109402</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Diagnosis and fault-tolerant control. 1, Data-driven and model-based fault diagnosis techniques ent://SD_ILS/0/SD_ILS:597222 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Puig, Vicen&ccedil;, editor.&#160;Simani, Silvio, 1971- editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882329">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882329</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Diagnosis and fault-tolerant control. 2, From fault diagnosis to fault-tolerant control ent://SD_ILS/0/SD_ILS:597228 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Puig, Vicen&ccedil;, editor.&#160;Simani, Silvio, 1971- editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882350">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882350</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems ent://SD_ILS/0/SD_ILS:175839 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Seong, Poong Hyun. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design of experiments for reliability achievement ent://SD_ILS/0/SD_ILS:597561 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Rigdon, Steven E., 1955- author.&#160;Pan, Rong (Professor of reliability engineering), author.&#160;Montgomery, Douglas C., author.&#160;Freeman, Laura June, author.<br/>Yer Numaras&#305;&#160;TS173 .R54 2022<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The science of resilience : complexity, risk modeling, and systems ent://SD_ILS/0/SD_ILS:600298 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Lewis, Ted G., author<br/>Yer Numaras&#305;&#160;TA169 .L49 2026<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394354955">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394354955</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety Assurance under Uncertainties : From Software to Cyber-Physical/Machine Learning Systems ent://SD_ILS/0/SD_ILS:578912 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Hasuo, Ichiro editor&#160;Ishikawa, Fuyuki editor<br/>Yer Numaras&#305;&#160;QA76.9 .A25<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003093350">https://www.taylorfrancis.com/books/9781003093350</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Barrier engineering : models and methods for technical safety ent://SD_ILS/0/SD_ILS:592524 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Liu, Yiliu, author.<br/>Yer Numaras&#305;&#160;TA169.7<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003245636">https://www.taylorfrancis.com/books/9781003245636</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Architecting resilient systems ent://SD_ILS/0/SD_ILS:599418 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Jackson, Scott, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Artificial Intelligence for Future Networks. ent://SD_ILS/0/SD_ILS:599611 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Matin, Mohammad A.&#160;Goudos, Sotirios K.&#160;Karagiannidis, George K.<br/>Yer Numaras&#305;&#160;TK5103.25<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394227952">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394227952</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Communication networks in smart power grids ent://SD_ILS/0/SD_ILS:599871 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Zhou, Boyang, author.<br/>Yer Numaras&#305;&#160;TK3105 .Z46 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285129">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285129</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optimization in sustainable energy : methods and applications ent://SD_ILS/0/SD_ILS:599983 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Chatterjee, Prasenjit, 1982- editor.<br/>Yer Numaras&#305;&#160;TJ163.2 .O68 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394242139">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394242139</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Functionalized nanomaterials for electronic and optoelectronic devices : design, fabrications and applications ent://SD_ILS/0/SD_ILS:600065 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Rawa, Gopal, editor.<br/>Yer Numaras&#305;&#160;TK7874.84 .F86 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394214105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394214105</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design and manufacturing practices for performability engineering ent://SD_ILS/0/SD_ILS:600102 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Chaturvedi, Sanjay K., editor.&#160;Gargama, Heeralal, editor.&#160;Rai, Rajiv N., editor.<br/>Yer Numaras&#305;&#160;TS171 .D47 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hydrogen energy production and fuel generation ent://SD_ILS/0/SD_ILS:600162 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Inamuddin, 1980- editor.<br/>Yer Numaras&#305;&#160;TP359 .H8 H93 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394248544">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394248544</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Adaptive artificial intelligence : fundamentals, challenges, and applications ent://SD_ILS/0/SD_ILS:600187 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kumar, P. 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K., editor.&#160;Sanjeevikumar, Padmanaban, 1978-<br/>Yer Numaras&#305;&#160;TA169 .S234 2024<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The UFAW handbook on the care and management of laboratory and other research animals ent://SD_ILS/0/SD_ILS:598956 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Golledge, Huw, editor.&#160;Richardson, Claire, editor.<br/>Yer Numaras&#305;&#160;SF406 .U55 2024<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119555278">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119555278</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multi-fidelity Surrogates Modeling, Optimization and Applications ent://SD_ILS/0/SD_ILS:528308 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Zhou, Qi. author.&#160;Zhao, Min. author.&#160;Hu, Jiexiang. author.&#160;Ma, Mengying. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-19-7210-2">https://doi.org/10.1007/978-981-19-7210-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Advances in Manufacturing Engineering and Processes Proceedings of ICMEP 2022 ent://SD_ILS/0/SD_ILS:528316 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Agarwal, Ramesh K. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-19-6841-9">https://doi.org/10.1007/978-981-19-6841-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Cognitive dependability engineering : managing risks in cyber-physical-social systems under deep uncertainty ent://SD_ILS/0/SD_ILS:576860 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Bukowski, Lech, author.<br/>Yer Numaras&#305;&#160;TA169 .B85 2023 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003020752">https://www.taylorfrancis.com/books/9781003020752</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability, usability, and quality for engineers ent://SD_ILS/0/SD_ILS:579176 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dhillon, B. 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(orcid)&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-25182-5">https://doi.org/10.1007/978-3-031-25182-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Body of Knowledge for Modeling and Simulation A Handbook by the Society for Modeling and Simulation International ent://SD_ILS/0/SD_ILS:520753 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;&Ouml;ren, Tuncer. editor.&#160;Zeigler, Bernard P. editor.&#160;Tolk, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-11085-6">https://doi.org/10.1007/978-3-031-11085-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Web Services - ICWS 2023 30th International Conference, Held as Part of the Services Conference Federation, SCF 2023, Honolulu, HI, USA, September 23-26, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521181 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Zhang, Yuchao. editor.&#160;Zhang, Liang-Jie. editor. 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href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Functional safety of machinery : how to apply ISO 13849-1 and IEC 62061 ent://SD_ILS/0/SD_ILS:598269 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Tacchini, Marco, author.<br/>Yer Numaras&#305;&#160;TJ211.5 .T33 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598306 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Yer Numaras&#305;&#160;TA169 .A67 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Sustainability in biofuel production technology ent://SD_ILS/0/SD_ILS:597698 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Agrawal, Pratibha (Pratibha S.), author.&#160;Belkhode, Pramod, author.&#160;Rokhum, Samuel Lalthazuala, author.<br/>Yer Numaras&#305;&#160;TP339 .A42 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optimal reliability-based design of structures against several natural hazards ent://SD_ILS/0/SD_ILS:558659 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ang, Alfredo Hua-Sing, 1930- author.&#160;De Leon, David (De Leon Escobido), author.&#160;Fan, Wenliang, author.<br/>Yer Numaras&#305;&#160;TA658 .A56 2022<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003177289">https://www.taylorfrancis.com/books/9781003177289</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modelling with information measures ent://SD_ILS/0/SD_ILS:562731 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Nair, N. Unnikrishnan, 1945- author.&#160;Sunoj, S. M., 1972- author.&#160;Rajesh, G., 1971- author.<br/>Yer Numaras&#305;&#160;TA169 .N3526 2022 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> VCSEL industry : communication and sensing ent://SD_ILS/0/SD_ILS:597229 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Padullaparthi, Babu Dayal, author.&#160;Tatum, Jim A., author.&#160;Iga, Ken&#700;ichi, 1940- author.<br/>Yer Numaras&#305;&#160;TA1700<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust engineering designs of partial differential systems and their applications ent://SD_ILS/0/SD_ILS:567445 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Chen, Bor-Sen, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003229230">https://www.taylorfrancis.com/books/9781003229230</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Validity and reliability in built environment research : a selection of case studies ent://SD_ILS/0/SD_ILS:569018 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ahmed, Vian, editor.&#160;Opoku, Alex, editor.&#160;Olanipekun, Ayokunle, editor.&#160;Sutrisna, Monty, editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243226">https://www.taylorfrancis.com/books/9780429243226</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Philosophies of structural safety and reliability ent://SD_ILS/0/SD_ILS:582933 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ra&#301;zer, V. D. (Vladimir Davidovich), author.&#160;Elishakoff, Isaac, author.<br/>Yer Numaras&#305;&#160;TA656<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product maturity. 2, Principles and illustrations ent://SD_ILS/0/SD_ILS:597611 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Bayle, Franck, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Smart nanotextiles : wearable and technical applications ent://SD_ILS/0/SD_ILS:597666 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Yilmaz, Nazire Deniz.<br/>Yer Numaras&#305;&#160;TS1767<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Physics-Of-Healthy in Mechatronics. ent://SD_ILS/0/SD_ILS:598146 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;El Hami, Abdelkhalak.&#160;Delaux, David.&#160;Grzeskowiak, Henri.<br/>Yer Numaras&#305;&#160;TA169 .E515 2022<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for engineers ent://SD_ILS/0/SD_ILS:565385 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Achieving Product Reliability : A Key to Business Success. ent://SD_ILS/0/SD_ILS:563478 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Doganaksoy, Necip, 1960- author.&#160;Meeker, William Q., author.&#160;Hahn, Gerald J., author.<br/>Yer Numaras&#305;&#160;TS156<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003181361">https://www.taylorfrancis.com/books/9781003181361</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electrical connectors : design, manufacture, test, and selection ent://SD_ILS/0/SD_ILS:596172 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Pecht, Michael, editor.&#160;Kyeong, San, editor.<br/>Yer Numaras&#305;&#160;TK3521<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:596287 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Curtis, Peter M., author.<br/>Yer Numaras&#305;&#160;TA169 .C87 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dictionary of industrial terminology ent://SD_ILS/0/SD_ILS:596516 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Holloway, Michael D., 1963- author.&#160;Holloway, Emma, author.<br/>Yer Numaras&#305;&#160;HD301.15<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364078">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364078</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties ent://SD_ILS/0/SD_ILS:596531 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dahoo, Pierre Richard.&#160;Pougnet, Philippe.&#160;El Hami, Abdelkhalak.<br/>Yer Numaras&#305;&#160;QC88<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method ent://SD_ILS/0/SD_ILS:596749 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dahoo, Pierre Richard, author.&#160;Pougnet, Philippe, author.&#160;El Hami, Abdelkhalak, author.<br/>Yer Numaras&#305;&#160;QC88<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability : approaches from perspectives of statistical moments ent://SD_ILS/0/SD_ILS:596358 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Zhao, Yan-Gang, author.&#160;Lu, Zhao-Hui, author.<br/>Yer Numaras&#305;&#160;TA650 .Z53 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical sensing in power transformers ent://SD_ILS/0/SD_ILS:596469 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Jiang, Jun, 1988- author.&#160;Ma, Guoming, 1984- author.<br/>Yer Numaras&#305;&#160;TK2551<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119765325">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119765325</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modern industrial statistics : with applications in R, MINITAB and JMP ent://SD_ILS/0/SD_ILS:596471 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kenett, Ron, author.&#160;Zacks, Shelemyahu, 1932- author.&#160;Amberti, Daniele, author.<br/>Yer Numaras&#305;&#160;TS156 .K46 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> From LED to solid state lighting : principles, materials, packaging, characterization, and applications ent://SD_ILS/0/SD_ILS:596576 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Lee, Shi-Wei Ricky, author.&#160;Lo, Jeffery C. C., author.&#160;Tao, Mian, author.&#160;Ye, Huaiyu, author.<br/>Yer Numaras&#305;&#160;TK7871.89 .L53 L4365 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118881620">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118881620</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanical engineering under uncertainties : from classical approaches to some recent developments ent://SD_ILS/0/SD_ILS:596632 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Gogu, Christian, editor.<br/>Yer Numaras&#305;&#160;TJ145 .M43 2021 EB<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817635">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817635</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering ent://SD_ILS/0/SD_ILS:595527 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kenett, Ron, editor.&#160;Swarz, Robert S., editor.&#160;Zonnenshain, Avigdor, editor.<br/>Yer Numaras&#305;&#160;TA168 .S8727 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power systems control and reliability : electric power design and enhancement ent://SD_ILS/0/SD_ILS:562263 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Qamber, Isa S., author.<br/>Yer Numaras&#305;&#160;TK1001 .Q36 2020<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429287015">https://www.taylorfrancis.com/books/9780429287015</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Methods and Interdisciplinarity ent://SD_ILS/0/SD_ILS:595680 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Waldeck, Roger.<br/>Yer Numaras&#305;&#160;Q180.55 .I48<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681519">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681519</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fog computing : theory and practice ent://SD_ILS/0/SD_ILS:595723 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Zomaya, Albert Y., editor.&#160;Abbas, Assad, editor.&#160;Khan, Samee Ullah, editor.<br/>Yer Numaras&#305;&#160;QA76.585 .F648 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Smarter data science : succeeding with enterprise-grade data and AI projects ent://SD_ILS/0/SD_ILS:595959 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Fishman, Neal.&#160;Stryker, Cole.<br/>Yer Numaras&#305;&#160;T58.6<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119697985">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119697985</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Thermodynamic processes. 1, Systems without physical state change ent://SD_ILS/0/SD_ILS:595855 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Belaadi, Salah, author.<br/>Yer Numaras&#305;&#160;TJ265 .B45 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119706830">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119706830</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Network traffic engineering : stochastic models and applications ent://SD_ILS/0/SD_ILS:595984 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Baiocchi, Andrea, 1962- author.<br/>Yer Numaras&#305;&#160;TK5105.5 .B326 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119632498">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119632498</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Repairable systems reliability analysis : a comprehensive framework ent://SD_ILS/0/SD_ILS:596328 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Rai, Rajiv Nandan, author.&#160;Chaturvedi, Sanjay K., author.&#160;Bolia, Nomesh, author.<br/>Yer Numaras&#305;&#160;QA402 .R35 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, maintainability, and safety for engineers ent://SD_ILS/0/SD_ILS:590317 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dhillon, B. S., author.<br/>Yer Numaras&#305;&#160;TS173<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429340574">https://www.taylorfrancis.com/books/9780429340574</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Photovoltaic module reliability ent://SD_ILS/0/SD_ILS:595739 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Wohlgemuth, J. (John), 1946- author.<br/>Yer Numaras&#305;&#160;TK8322<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Electrical Engineering Handbook - Six Volume Set ent://SD_ILS/0/SD_ILS:542484 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Dorf, Richard C., editor.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;R857 .B54<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust statistics : theory and methods (with R) ent://SD_ILS/0/SD_ILS:594721 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Maronna, Ricardo A., author.&#160;Martin, R. Douglas, author.&#160;Yohai, V&iacute;ctor J., author.<br/>Yer Numaras&#305;&#160;QA276 .M336 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electric power grid reliability evaluation : models and methods ent://SD_ILS/0/SD_ILS:594919 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Singh, Chanan, author.&#160;Jirutitijaroen, Panida, author.&#160;Mitra, Joydeep, author.<br/>Yer Numaras&#305;&#160;TK3001<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119536772">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119536772</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Microgrid planning and design : a concise guide ent://SD_ILS/0/SD_ILS:595155 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Farhangi, Hassan, author.&#160;Jo&oacute;s, G&eacute;za, author.<br/>Yer Numaras&#305;&#160;TK3105<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119453550">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119453550</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors ent://SD_ILS/0/SD_ILS:595289 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Xing, Liudong, author.&#160;Levitin, Gregory, author.&#160;Wang, Chaonan, 1986- author.<br/>Yer Numaras&#305;&#160;TA169 .X56 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> VLSI Design and Test for Systems Dependability ent://SD_ILS/0/SD_ILS:483711 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Asai, Shojiro. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical pharmaceutical engineering ent://SD_ILS/0/SD_ILS:594289 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Prager, Gary, 1943- author.<br/>Yer Numaras&#305;&#160;RS192 .P73 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418764">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418764</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to stochastic processes and simulation ent://SD_ILS/0/SD_ILS:595544 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Cochard, G&eacute;rard-Michel, author.<br/>Yer Numaras&#305;&#160;QA274<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119670827">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119670827</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Methods for reliability improvement and risk reduction ent://SD_ILS/0/SD_ILS:594697 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Todinov, M. T., author.<br/>Yer Numaras&#305;&#160;TA169 .T649 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability and software quality : strategies, tools, process and implementation ent://SD_ILS/0/SD_ILS:595034 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Levin, Mark, 1959- author.&#160;Kalal, Ted T., author.&#160;Rodin, Jonathan, 1957- author.<br/>Yer Numaras&#305;&#160;TS173 .L48 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical applications of Bayesian reliability ent://SD_ILS/0/SD_ILS:595173 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Liu, Yan, author.&#160;Abeyratne, Athula I., author.<br/>Yer Numaras&#305;&#160;QA279.5<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of maintained systems subjected to wear failure mechanisms : theory and applications ent://SD_ILS/0/SD_ILS:595240 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Bayle, Franck, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Avionics : development and implementation ent://SD_ILS/0/SD_ILS:540505 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Spitzer, Cary R., editor.<br/>Yer Numaras&#305;&#160;TL695<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315222233">https://www.taylorfrancis.com/books/9781315222233</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for failure modes and effects analysis for medical devices ent://SD_ILS/0/SD_ILS:543242 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;PRESS, DYADEM.<br/>Yer Numaras&#305;&#160;R856.6<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205804">https://www.taylorfrancis.com/books/9780429205804</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transdisciplinary engineering design process ent://SD_ILS/0/SD_ILS:594394 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Ertas, Atila, 1944- author.<br/>Yer Numaras&#305;&#160;TA174 .E7824 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119474654">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119474654</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Forensic systems engineering : evaluating operations by discovery ent://SD_ILS/0/SD_ILS:593932 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Stimson, William A., author.<br/>Yer Numaras&#305;&#160;TA169.5 .S755 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural health monitoring of large civil engineering structures ent://SD_ILS/0/SD_ILS:594137 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Chen, Hua-Peng, author.&#160;Ni, Yi-Qing, contributor.<br/>Yer Numaras&#305;&#160;TA656.6 .C44 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166641">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166641</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability prediction and testing textbook ent://SD_ILS/0/SD_ILS:594209 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Klyatis, Lev M., author.&#160;Anderson, Edward, 1945- author.<br/>Yer Numaras&#305;&#160;TA169.3 .K5964 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability analysis and prediction ent://SD_ILS/0/SD_ILS:593807 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Melchers, R. E. (Robert E.), 1945- author.&#160;Beck, Andr&eacute; T., author.<br/>Yer Numaras&#305;&#160;TA656.5 .M45 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanics of microsystems ent://SD_ILS/0/SD_ILS:594077 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Corigliano, Alberto, author.<br/>Yer Numaras&#305;&#160;TK7875<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053828">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053828</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of safety principles ent://SD_ILS/0/SD_ILS:594034 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;M&ouml;ller, Niklas, editor.&#160;Hansson, Sven Ove, 1951- editor.&#160;Holmberg, Jan-Erik, editor.<br/>Yer Numaras&#305;&#160;HD7261 .H36 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Analytic methods in systems and software testing ent://SD_ILS/0/SD_ILS:594482 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kenett, Ron, editor.&#160;Ruggeri, Fabrizio, editor.&#160;Faltin, Frederick W., editor.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 A52 2018 EB<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Production availability and reliability : use in the oil and gas industry ent://SD_ILS/0/SD_ILS:594494 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Leroy, Alain, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Yer Numaras&#305;&#160;TA169.5<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Continuous manufacturing of pharmaceuticals ent://SD_ILS/0/SD_ILS:593575 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Kleinebudde, Peter, 1958- editor.&#160;Khinast, Johannes, 1964- editor.&#160;Rantanen, Jukka, editor.<br/>Yer Numaras&#305;&#160;RS192 .C67 2017<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Real-time embedded systems ent://SD_ILS/0/SD_ILS:593770 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Wang, Jiacun, 1963- author.<br/>Yer Numaras&#305;&#160;TK7895 .E42<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Progress in Systems Engineering Proceedings of the Twenty-Third International Conference on Systems Engineering ent://SD_ILS/0/SD_ILS:529589 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Selvaraj, Henry. editor.&#160;Zydek, Dawid. editor.&#160;Chmaj, Grzegorz. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-08422-0">https://doi.org/10.1007/978-3-319-08422-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Structural Engineering Dynamics, Volume Two ent://SD_ILS/0/SD_ILS:529791 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Matsagar, Vasant. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-81-322-2193-7">https://doi.org/10.1007/978-81-322-2193-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Encyclopedia of Earthquake Engineering ent://SD_ILS/0/SD_ILS:530227 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Beer, Michael. editor.&#160;Kougioumtzoglou, Ioannis A. editor.&#160;Patelli, Edoardo. editor.&#160;Au, Ivan Siu-Kui. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-35344-4">https://doi.org/10.1007/978-3-642-35344-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bridge deck analysis ent://SD_ILS/0/SD_ILS:542120 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Obrien, Eugene J., 1958, author.&#160;Keogh, Damien L., 1969- author.&#160;O'Connor, Alan (Bridge engineer), author.<br/>Yer Numaras&#305;&#160;TG325.6 .O27 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482227246">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Green building, materials and civil engineering : proceedings of the 4th International Conference on Green Building, Materials and Civil Engineering (GBMCE 2014), Hong Kong, 21-22 August 2014 ent://SD_ILS/0/SD_ILS:543362 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;International Conference on Green Building, Materials and Civil Engineering (GBMCE) (4th : 2014 : Hong Kong). Author.&#160;Kao, Jimmy C. M. (Jimmy Chih-Ming), 1963- editor.&#160;Sung, Wen-Pei, editor.&#160;Chen, Ran, Dr., editor.<br/>Yer Numaras&#305;&#160;TH880 .I58 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315751986">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Application of systemic-structural activity theory to design and training ent://SD_ILS/0/SD_ILS:547112 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Bedny, Gregory Z., author.<br/>Yer Numaras&#305;&#160;TA166 .B349 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482258035">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semi-Markov processes : applications in system reliability and maintenance ent://SD_ILS/0/SD_ILS:355517 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;Grabski, Franciszek, author.<br/>Yer Numaras&#305;&#160;ONLINE(355517.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering and Applied Sciences Optimization Dedicated to the Memory of Professor M.G. 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2014 ent://SD_ILS/0/SD_ILS:540365 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;International Symposium Occupational Safety and Hygiene (2014 : Portugal), sponsor.&#160;Arezes, Pedro M., editor.&#160;Baptista, Joao Santos, editor.&#160;Barroso, Monica P., editor.&#160;Carneiro, Paula, editor.<br/>Yer Numaras&#305;&#160;T55 .A1 I58 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315773520">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Civil engineering and urban planning III : proceedings of the Third International Conference on Civil Engineering and Urban Planning (CEUP 2014), Wuhan, China, 20-22 June 2014 ent://SD_ILS/0/SD_ILS:547358 2026-02-20T22:16:58Z 2026-02-20T22:16:58Z Yazar&#160;International Conference on Civil Engineering and Urban Planning (3rd : 2014 : Wuhan, China)&#160;Mohammadian, Abolfazl, 1970- editor.<br/>Yer Numaras&#305;&#160;TA5 .I58 2014<br/>Elektronik 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