Arama Sonu&ccedil;lar&#305; Reliability (Engineering). - Daralt&#305;lm&#305;&#351;: 2003 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092003$0025092003$0026ic$003dtrue$0026ps$003d300?dt=list 2026-06-03T06:58:03Z Reliability verification, testing and analysis in engineering design ent://SD_ILS/0/SD_ILS:547339 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Wasserman, Gary S., 1951, author.<br/>Yer Numaras&#305;&#160;TA169 .W37 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135551483">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability strategies and implementation ent://SD_ILS/0/SD_ILS:295695 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Levin, Mark, 1959-&#160;Kalal, Ted T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a> <a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a> John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Viewpoints and controversies in sensory science and consumer product testing ent://SD_ILS/0/SD_ILS:296001 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Moskowitz, Howard R.&#160;Mu&ntilde;oz, Alejandra M., 1957-&#160;Gacula, Maximo C.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanical reliability improvement : probability and statistics for experimental testing ent://SD_ILS/0/SD_ILS:541297 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Little, R. E. (Robert Eugene), 1933-&#160;Kosikowski, D. M.<br/>Yer Numaras&#305;&#160;TA169 L778 2003<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The civil engineering handbook ent://SD_ILS/0/SD_ILS:545860 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Chen, Wai-Fah, 1936-&#160;Liew, J. Y. Richard.<br/>Yer Numaras&#305;&#160;TA151 .C57 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420041217">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for failure mode and effects analysis for automotive, aerospace and general manufacturing industries ent://SD_ILS/0/SD_ILS:540286 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Dyadem Press.<br/>Yer Numaras&#305;&#160;TS156 .G795 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135495480">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Case studies in reliability and maintenance ent://SD_ILS/0/SD_ILS:300226 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk analysis in engineering and economics ent://SD_ILS/0/SD_ILS:539259 2026-06-03T06:58:03Z 2026-06-03T06:58:03Z Yazar&#160;Ayyub, Bilal M., author.<br/>Yer Numaras&#305;&#160;T174.5 .A98 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>