Arama Sonuçları Reliability (Engineering). - Daraltılmış: 2023
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092023$0025092023$0026ps$003d300?dt=list
2026-06-03T13:36:20Z
Computational intelligence in sustainable reliability engineering
ent://SD_ILS/0/SD_ILS:598272
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Malik, S. C., editor.<br/>Yer Numarası TA169 .C65 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday
ent://SD_ILS/0/SD_ILS:527804
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Liu, Yu. editor. Wang, Dong. editor. Mi, Jinhua. editor. Li, He. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28859-3">https://doi.org/10.1007/978-3-031-28859-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Industrial reliability and safety engineering : applications and practices
ent://SD_ILS/0/SD_ILS:578979
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Panchal, Dilbagh, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003140092">https://www.taylorfrancis.com/books/9781003140092</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modeling remaining useful life dynamics in reliability engineering
ent://SD_ILS/0/SD_ILS:579104
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Dersin, Pierre, author.<br/>Yer Numarası TS173<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003250685">https://www.taylorfrancis.com/books/9781003250685</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation
ent://SD_ILS/0/SD_ILS:528444
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar van Gulijk, Coen. editor. (orcid)0000-0003-4541-2693 Zaitseva, Elena. editor. Kvassay, Miroslav. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
ent://SD_ILS/0/SD_ILS:526829
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Woo, Seongwoo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Interconnect Reliability in Advanced Memory Device Packaging
ent://SD_ILS/0/SD_ILS:526838
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Which-Is-Better (WIB): Problems in Reliability Theory
ent://SD_ILS/0/SD_ILS:526867
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27316-2">https://doi.org/10.1007/978-3-031-27316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintainability of Building Envelope Elements Optimizing Predictive Condition-Based Maintenance Decisions
ent://SD_ILS/0/SD_ILS:527007
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Ferreira, Cláudia. author. Silva, Ana. author. de Brito, Jorge. author. Flores-Colen, Inês. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-14767-8">https://doi.org/10.1007/978-3-031-14767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications in Reliability and Statistical Computing
ent://SD_ILS/0/SD_ILS:527152
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System Dependability and Analytics Approaching System Dependability from Data, System and Analytics Perspectives
ent://SD_ILS/0/SD_ILS:528574
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Wang, Long. editor. Pattabiraman, Karthik. editor. Di Martino, Catello. editor. Athreya, Arjun. editor. Bagchi, Saurabh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-02063-6">https://doi.org/10.1007/978-3-031-02063-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Selective Maintenance Modelling and Optimization Basic Methods and Some Recent Advances
ent://SD_ILS/0/SD_ILS:527294
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Liu, Yu. author. Huang, Hong-Zhong. author. Jiang, Tao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-17323-3">https://doi.org/10.1007/978-3-031-17323-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optimal Inspection Models with Their Applications
ent://SD_ILS/0/SD_ILS:527328
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Ito, Kodo. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22021-0">https://doi.org/10.1007/978-3-031-22021-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
ent://SD_ILS/0/SD_ILS:526722
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Varde, Prabhakar V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-9334-3">https://doi.org/10.1007/978-981-19-9334-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Predictive Analytics in System Reliability
ent://SD_ILS/0/SD_ILS:526781
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Artificial Intelligence for Smart Manufacturing Methods, Applications, and Challenges
ent://SD_ILS/0/SD_ILS:527797
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Tran, Kim Phuc. editor. (orcid)0000-0002-6005-1497 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30510-8">https://doi.org/10.1007/978-3-031-30510-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and maintenance modeling with optimization : advances and applications
ent://SD_ILS/0/SD_ILS:562446
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Kimura, Mitsutaka, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095231">https://www.taylorfrancis.com/books/9781003095231</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability-based modeling of system performance
ent://SD_ILS/0/SD_ILS:598598
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar El Hami, Abdelkhalak, author. Eid, Mohamed, author.<br/>Yer Numarası TA169 .H36 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries
ent://SD_ILS/0/SD_ILS:598326
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.<br/>Yer Numarası TA169 .A67 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied reliability for industry. 3, Operational relability for the automobile, aeronautics, defense, medical, marine and space industries
ent://SD_ILS/0/SD_ILS:598345
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.<br/>Yer Numarası TA169 .A67 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Intelligent prognostics for engineering systems with machine learning techniques
ent://SD_ILS/0/SD_ILS:579335
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Soni, Gunjan, editor. Yadav, Om Prakash, 1964- editor. Badhotiya, Gaurav Kumar, editor. Ram, Mangey, editor.<br/>Yer Numarası TA153<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003434849">https://www.taylorfrancis.com/books/9781003434849</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software reliability techniques for real-world applications
ent://SD_ILS/0/SD_ILS:598123
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Youree, Roger K., author.<br/>Yer Numarası QA76.76 .R44<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
ent://SD_ILS/0/SD_ILS:256115
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Web Services - ICWS 2023 30th International Conference, Held as Part of the Services Conference Federation, SCF 2023, Honolulu, HI, USA, September 23-26, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521181
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Zhang, Yuchao. editor. Zhang, Liang-Jie. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44836-2">https://doi.org/10.1007/978-3-031-44836-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Prediction Technologies for Improving Engineering Product Efficiency
ent://SD_ILS/0/SD_ILS:527029
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Klyatis, Lev M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-16655-6">https://doi.org/10.1007/978-3-031-16655-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced Hybrid Information Processing 6th EAI International Conference, ADHIP 2022, Changsha, China, September 29-30, 2022, Proceedings, Part I
ent://SD_ILS/0/SD_ILS:520370
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Fu, Weina. editor. Yun, Lin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28787-9">https://doi.org/10.1007/978-3-031-28787-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Evaluation of Novel Approaches to Software Engineering 17th International Conference, ENASE 2022, Virtual Event, April 25-26, 2022, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:520493
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Kaindl, Hermann. editor. Mannion, Mike. editor. Maciaszek, Leszek A. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36597-3">https://doi.org/10.1007/978-3-031-36597-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Product Lifecycle Management. PLM in Transition Times: The Place of Humans and Transformative Technologies 19th IFIP WG 5.1 International Conference, PLM 2022, Grenoble, France, July 10-13, 2022, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:520558
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Noël, Frédéric. editor. Nyffenegger, Felix. editor. (orcid) Rivest, Louis. editor. Bouras, Abdelaziz. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25182-5">https://doi.org/10.1007/978-3-031-25182-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mathematical Foundations of Software Engineering A Practical Guide to Essentials
ent://SD_ILS/0/SD_ILS:520574
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar O'Regan, Gerard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26212-8">https://doi.org/10.1007/978-3-031-26212-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
What every engineer should know about risk engineering and management
ent://SD_ILS/0/SD_ILS:581243
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Wang, John X., 1962- author.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003371014">https://www.taylorfrancis.com/books/9781003371014</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied reliability, usability, and quality for engineers
ent://SD_ILS/0/SD_ILS:579176
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced ultra low-power semiconductor devices : design and applications
ent://SD_ILS/0/SD_ILS:598708
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Tayal, Shubham, editor Upadhyay, Abhishek Kumar, editor Rahi, Shiromani Balmukund, editor. Song, Young Suh, editor<br/>Yer Numarası TK7871.85 .A38 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394167647">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394167647</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Sustainability in biofuel production technology
ent://SD_ILS/0/SD_ILS:597698
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Agrawal, Pratibha (Pratibha S.), author. Belkhode, Pramod, author. Rokhum, Samuel Lalthazuala, author.<br/>Yer Numarası TP339 .A42 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced techniques for maintenance modeling and reliability analysis of repairable systems
ent://SD_ILS/0/SD_ILS:598651
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Sharma, Garima, author. Rai, Rajiv Nandan, author.<br/>Yer Numarası TA169 .S53 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability analysis using MINITAB and Python
ent://SD_ILS/0/SD_ILS:597824
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Hwang, Jaejin, author.<br/>Yer Numarası TA169 .H93 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Functional safety of machinery : how to apply ISO 13849-1 and IEC 62061
ent://SD_ILS/0/SD_ILS:598269
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Tacchini, Marco, author.<br/>Yer Numarası TJ211.5 .T33 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries
ent://SD_ILS/0/SD_ILS:598306
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.<br/>Yer Numarası TA169 .A67 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Cybersecurity in intelligent networking systems
ent://SD_ILS/0/SD_ILS:597809
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Xu, Shengjie (Professor), author. Qian, Yi, 1962- author. Hu, Rose Qingyang, author.<br/>Yer Numarası TK5105.59 .X8 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119784135">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119784135</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electromechanical coupling theory, methodology and applications for high-performance microwave equipment
ent://SD_ILS/0/SD_ILS:597980
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Duan, Baoyan, author. Zhang, Shuxin (Professor of electromechanical engineering), author.<br/>Yer Numarası TK7876 .D83 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
What every engineer should know about reliability and risk analysis
ent://SD_ILS/0/SD_ILS:565637
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Modarres, M. (Mohammad), author. Groth, Katrina, author.<br/>Yer Numarası TA169 .M63 2023<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Cognitive dependability engineering : managing risks in cyber-physical-social systems under deep uncertainty
ent://SD_ILS/0/SD_ILS:576860
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Bukowski, Lech, author.<br/>Yer Numarası TA169 .B85 2023 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003020752">https://www.taylorfrancis.com/books/9781003020752</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Body of Knowledge for Modeling and Simulation A Handbook by the Society for Modeling and Simulation International
ent://SD_ILS/0/SD_ILS:520753
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Ören, Tuncer. editor. Zeigler, Bernard P. editor. Tolk, Andreas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-11085-6">https://doi.org/10.1007/978-3-031-11085-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
16th WCEAM Proceedings
ent://SD_ILS/0/SD_ILS:526734
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Crespo Márquez, Adolfo. editor. Gómez Fernández, Juan Francisco. editor. González-Prida Díaz, Vicente. editor. Amadi-Echendu, Joe. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25448-2">https://doi.org/10.1007/978-3-031-25448-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical Approach to Mammalian Cell and Organ Culture
ent://SD_ILS/0/SD_ILS:527156
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Mukherjee, Tapan Kumar. editor. Malik, Parth. editor. Mukherjee, Srirupa. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-1731-8">https://doi.org/10.1007/978-981-19-1731-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multi-fidelity Surrogates Modeling, Optimization and Applications
ent://SD_ILS/0/SD_ILS:528308
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Zhou, Qi. author. Zhao, Min. author. Hu, Jiexiang. author. Ma, Mengying. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-7210-2">https://doi.org/10.1007/978-981-19-7210-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Manufacturing Engineering and Processes Proceedings of ICMEP 2022
ent://SD_ILS/0/SD_ILS:528316
2026-06-03T13:36:20Z
2026-06-03T13:36:20Z
Yazar Agarwal, Ramesh K. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6841-9">https://doi.org/10.1007/978-981-19-6841-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>