Arama Sonuçları Reliability (Engineering). - Daraltılmış: Microelectronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability$002b$002528Engineering$002529.$0026qf$003dSUBJECT$002509Konu$002509Microelectronics.$002509Microelectronics.$0026ps$003d300?
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Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
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Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
2026-02-20T21:44:57Z
2026-02-20T21:44:57Z
Yazar Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Real-time embedded systems
ent://SD_ILS/0/SD_ILS:593770
2026-02-20T21:44:57Z
2026-02-20T21:44:57Z
Yazar Wang, Jiacun, 1963- author.<br/>Yer Numarası TK7895 .E42<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>