Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: Online Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300$0026isd$003dtrue?dt=list 2026-01-11T04:39:10Z Reliability ent://SD_ILS/0/SD_ILS:233427 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Meyer, J. Patrick.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Yer Numaras&#305;&#160;ONLINE(341870.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:542468 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Neufelder, Ann Marie, 1960- author.<br/>Yer Numaras&#305;&#160;QA76.76 .R44 N48 1992<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439832752">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:543493 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Yer Numaras&#305;&#160;TK7836 .D473 2001<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:153828 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bloch, Heinz P., 1933-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:544208 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;TA174 .E544 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ko&#322;owrocki, Krzysztof.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Circuit Design for Reliability ent://SD_ILS/0/SD_ILS:529164 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Reis, Ricardo. editor.&#160;Cao, Yu. editor.&#160;Wirth, Gilson. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332363.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for engineers ent://SD_ILS/0/SD_ILS:565385 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:543776 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;El-Reedy, Mohamed Abdallah., author.<br/>Yer Numaras&#305;&#160;TA683 .E47 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439874172">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quantile-Based Reliability Analysis ent://SD_ILS/0/SD_ILS:330556 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Nair, N. Unnikrishnan. author.&#160;Sankaran, P.G. author.&#160;Balakrishnan, N. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330556.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Tu, K. N. (King-Ning), 1937-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:543516 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Brown, Richard E., 1969, author.<br/>Yer Numaras&#305;&#160;TK3091 .B76 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315222332">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability-based Structural Design ent://SD_ILS/0/SD_ILS:175421 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Choi, Seung-Kyum. author.&#160;Canfield, Robert A. author.&#160;Grandhi, Ramana V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:539124 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Brown, Richard E., 1969- author.<br/>Yer Numaras&#305;&#160;TK3091 .B76 2002 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429164682">https://www.taylorfrancis.com/books/9780429164682</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Neale, M. J. (Michael John)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applications in Reliability and Statistical Computing ent://SD_ILS/0/SD_ILS:527152 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to Quality and Reliability Engineering ent://SD_ILS/0/SD_ILS:529803 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Jiang, Renyan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-662-47215-6">https://doi.org/10.1007/978-3-662-47215-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Innovations in Power Systems Reliability ent://SD_ILS/0/SD_ILS:168417 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Anders, George. editor.&#160;Vaccaro, Alfredo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Nonparametric Statistics in Reliability ent://SD_ILS/0/SD_ILS:168426 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;G&aacute;miz, M. Luz. author.&#160;Kulasekera, K. B. author.&#160;Limnios, Nikolaos. author.&#160;Lindqvist, Bo Henry. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Reliability Assessment with OR Applications ent://SD_ILS/0/SD_ILS:168454 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kapur, P.K. author.&#160;Pham, Hoang. author.&#160;Gupta, A. author.&#160;Jha, P.C. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fatigue and Fracture Reliability Engineering ent://SD_ILS/0/SD_ILS:168458 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Xiong, J.J. author.&#160;Shenoi, R.A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mining Equipment Reliability, Maintainability, and Safety ent://SD_ILS/0/SD_ILS:144346 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, Balbir S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Reliability Models and Maintenance Policies 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Reliability ent://SD_ILS/0/SD_ILS:526781 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kumar, Vijay. editor.&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability strategies and implementation ent://SD_ILS/0/SD_ILS:295695 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Levin, Mark, 1959-&#160;Kalal, Ted T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a> <a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a> John Wiley <a 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Unnikrishnan, 1945- author.&#160;Sunoj, S. M., 1972- author.&#160;Rajesh, G., 1971- author.<br/>Yer Numaras&#305;&#160;TA169 .N3526 2022 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> RELIABILITY ENGINEERING a life cycle approach. ent://SD_ILS/0/SD_ILS:575297 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bradley, Edgar.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Philosophies of structural safety and reliability ent://SD_ILS/0/SD_ILS:582933 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ra&#301;zer, V. D. (Vladimir Davidovich), author.&#160;Elishakoff, Isaac, author.<br/>Yer Numaras&#305;&#160;TA656<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The reliability of generating data ent://SD_ILS/0/SD_ILS:552847 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Krippendorff, Klaus, author.<br/>Yer Numaras&#305;&#160;QA76.9 .Q36<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112020">https://www.taylorfrancis.com/books/9781003112020</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Cloud reliability engineering : technologies and tools ent://SD_ILS/0/SD_ILS:571108 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Raj, Pethuru, editor.&#160;Achary, Rathnakar, editor.<br/>Yer Numaras&#305;&#160;QA76.585 .C568 2021<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003030973">https://www.taylorfrancis.com/books/9781003030973</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, maintainability, and safety for engineers ent://SD_ILS/0/SD_ILS:590317 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S., author.<br/>Yer Numaras&#305;&#160;TS173<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429340574">https://www.taylorfrancis.com/books/9780429340574</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Aspect of Cloud Computing Environment ent://SD_ILS/0/SD_ILS:399144 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kumar, Vikas. author.&#160;Vidhyalakshmi, R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:401906 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> In-Service Fatigue Reliability of Structures ent://SD_ILS/0/SD_ILS:401041 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Petinov, Sergei V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality 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2026-01-11T04:39:10Z Yazar&#160;Feyrer, Klaus. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-54996-0">https://doi.org/10.1007/978-3-642-54996-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk and reliability in geotechnical engineering ent://SD_ILS/0/SD_ILS:544526 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ching, Jianye, editor.&#160;Phoon, Kok-Kwang, editor.<br/>Yer Numaras&#305;&#160;TA706 .R48 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482227222">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ternary Networks Reliability and Monte Carlo ent://SD_ILS/0/SD_ILS:485508 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;Vaisman, Radislav. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:489410 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of large and complex systems ent://SD_ILS/0/SD_ILS:355886 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ko&#322;owrocki, Krzysztof, author.<br/>Yer Numaras&#305;&#160;ONLINE(355886.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability models for engineers and scientists ent://SD_ILS/0/SD_ILS:545739 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kaminskiy, Mark, 1946, author.<br/>Yer Numaras&#305;&#160;TA169 .K36 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466565937">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer system reliability : safety and usability ent://SD_ILS/0/SD_ILS:547174 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S., author.<br/>Yer Numaras&#305;&#160;QA76.76 .R44 D495 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466573130">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Analog IC Reliability in Nanometer CMOS ent://SD_ILS/0/SD_ILS:331961 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Maricau, Elie. author.&#160;Gielen, Georges. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331961.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electricity infrastructure reliability and vulnerabilities ent://SD_ILS/0/SD_ILS:281073 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Guerritore, Walter B.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Klyatis, Lev M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and availability of cloud computing ent://SD_ILS/0/SD_ILS:249383 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor process reliability in practice ent://SD_ILS/0/SD_ILS:293479 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gan, Zhenghao.&#160;Wong, Waisum.&#160;Liou, Juin J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lead Free Solder Mechanics and Reliability ent://SD_ILS/0/SD_ILS:173692 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Pang, John Hock Lye. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and maintenance : networks and systems ent://SD_ILS/0/SD_ILS:546172 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Beichelt, Frank, 1942, author.&#160;Tittmann, Peter.<br/>Yer Numaras&#305;&#160;TA169 .B45 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439826362">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor packaging : materials interaction and reliability ent://SD_ILS/0/SD_ILS:546600 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Chen, Andrea., author.&#160;Lo, Randy.<br/>Yer Numaras&#305;&#160;TK7870.15 .C54 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439862070">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Measures of interobserver agreement and reliability ent://SD_ILS/0/SD_ILS:539074 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Shoukri, M. M. (Mohamed M.), author.&#160;Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Yer Numaras&#305;&#160;RC71.3 .S478 2011<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439810811">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multistate systems reliability theory with applications ent://SD_ILS/0/SD_ILS:298781 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Natvig, Bent, 1946-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Functional Analysis Methods for Reliability Models ent://SD_ILS/0/SD_ILS:176727 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gupur, Geni. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:191586 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transportation systems reliability and safety ent://SD_ILS/0/SD_ILS:539600 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TA1145 .D453 2011<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439846414">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability assessment : theory and practice ent://SD_ILS/0/SD_ILS:540046 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Spurgin, Anthony J., author.<br/>Yer Numaras&#305;&#160;TA166 .S685 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:192824 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety and reliability of bridge structures ent://SD_ILS/0/SD_ILS:545232 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Mahmoud, Khaled M.<br/>Yer Numaras&#305;&#160;TG300 .M34 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135172435">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mathematical models for systems reliability ent://SD_ILS/0/SD_ILS:538905 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Epstein, Benjamin, 1918, author.&#160;Weissman, Ishay, 1940-<br/>Yer Numaras&#305;&#160;TA169 .E67 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Silver Metallization Stability and Reliability ent://SD_ILS/0/SD_ILS:175677 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Adams, Daniel. author.&#160;Alford, Terry L. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Critical Infrastructure Reliability and Vulnerability ent://SD_ILS/0/SD_ILS:185336 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Murray, Alan T. editor.&#160;Grubesic, Tony H. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wire Ropes Tension, Endurance, Reliability ent://SD_ILS/0/SD_ILS:183848 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Feyrer, K. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Distribution reliability and power quality ent://SD_ILS/0/SD_ILS:543499 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Short, T. A. (Tom A.), 1966- author.<br/>Yer Numaras&#305;&#160;TK3091 .S465 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420036480">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:545920 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TA168 .D53 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and risk a Bayesian perspective ent://SD_ILS/0/SD_ILS:296819 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Singpurwalla, Nozer D.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated quality and reliability solutions ent://SD_ILS/0/SD_ILS:254415 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Klyatis, Lev M.&#160;Klyatis, Eugene L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Ageing and Dependence for Reliability ent://SD_ILS/0/SD_ILS:166017 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Lai, Chin-Diew. author.&#160;Xie, Min. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:547810 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TS173 .D495 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Case studies in reliability and maintenance ent://SD_ILS/0/SD_ILS:300226 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ceramics processing, reliability, tribology and wear. ent://SD_ILS/0/SD_ILS:300592 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;M&uuml;ller, G.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:540912 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;R855.3 .D47 2000<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA174 .D4929 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor memories technology, testing, and reliability ent://SD_ILS/0/SD_ILS:249739 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Sharma, Ashok K.&#160;IEEE Solid-State Circuits Council.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Misra, Krishna B., 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety and Reliability Methodology and Applications. ent://SD_ILS/0/SD_ILS:545362 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yer Numaras&#305;&#160;TA169.7<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429226823">https://www.taylorfrancis.com/books/9780429226823</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Interconnect Reliability in Advanced Memory Device Packaging ent://SD_ILS/0/SD_ILS:526838 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gan, Chong Leong,. author.&#160;Huang, Chen-Yu,. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Processes with Applications to Reliability Theory ent://SD_ILS/0/SD_ILS:168475 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Shock and Damage Models in Reliability Theory ent://SD_ILS/0/SD_ILS:175420 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human Reliability and Error in Transportation Systems ent://SD_ILS/0/SD_ILS:175578 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System Reliability and Security Techniques and Methodologies. ent://SD_ILS/0/SD_ILS:576623 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Iqbal, Javaid.&#160;Masoodi, Faheem Syeed.&#160;Ahmad Malik, Ishfaq.&#160;Khurshid, Shozab.&#160;Saraf, Iqra.<br/>Yer Numaras&#305;&#160;QA76.9 .A25<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032624983">https://www.taylorfrancis.com/books/9781032624983</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability, usability, and quality for engineers ent://SD_ILS/0/SD_ILS:579176 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lifetime Reliability-aware Design of Integrated Circuits ent://SD_ILS/0/SD_ILS:527089 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Raji, Mohsen. author.&#160;Ghavami, Behnam. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and safety of cable-supported bridges ent://SD_ILS/0/SD_ILS:585766 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Lu, Naiwei, editor.&#160;Liu, Yang (Of Haerbin gong ye da xue), editor.&#160;Noori, Mohammad, editor.<br/>Yer Numaras&#305;&#160;TG405<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003170594">https://www.taylorfrancis.com/books/9781003170594</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety-Critical Electrical Drives Topologies, Reliability, Performance ent://SD_ILS/0/SD_ILS:401112 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bolvashenkov, Igor. author.&#160;Herzog, Hans-Georg. author.&#160;Frenkel, Ilia. author.&#160;Khvatskin, Lev. author.&#160;Lisnianski, Anatoly. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk and Reliability : Coastal and Hydraulic Engineering ent://SD_ILS/0/SD_ILS:541176 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Reeve, Dominic, author.<br/>Yer Numaras&#305;&#160;TC205 .R448 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solid State Lighting Reliability Components to Systems ent://SD_ILS/0/SD_ILS:331314 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;van Driel, W.D. editor.&#160;Fan, X.J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331314.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Process plant equipment operation, control, and reliability ent://SD_ILS/0/SD_ILS:299085 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Holloway, Michael D., 1963-&#160;Nwaoha, Chikezie, 1984-&#160;Onyewuenyi, Oliver A., 1952-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Offshore Wind Turbines Reliability, availability and maintenance ent://SD_ILS/0/SD_ILS:247956 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Tavner, Peter<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ayers, Mark L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Compressors how to achieve high reliability &amp; 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N., Ph. 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Y., editor of compilation.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and optimization of structural systems : proceedings of Reliability and Optimization of Structural Systems, Tum, Munchen, Germany, 7-10 April 2010 ent://SD_ILS/0/SD_ILS:542232 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Reliability and Optimization of Structural Systems (2010 : Tum, Munchen, Germany)&#160;Straub, D.<br/>Yer Numaras&#305;&#160;TA658.2 .R45 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781136898563">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, risk and safety : theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009, Prague, Czech Republic, 7-10 September 2009 ent://SD_ILS/0/SD_ILS:542234 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;European Safety and Reliability Conference (2009 : Prague, Czech Republic)&#160;Bri&scaron;, Radim, 1957-&#160;Martorell, Sebasti&aacute;n.&#160;Soares, C. 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href="https://www.taylorfrancis.com/books/9781003542827">https://www.taylorfrancis.com/books/9781003542827</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The iron triangle of energy : how to improve energy cost, reliability, and emissions ent://SD_ILS/0/SD_ILS:551570 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Miller, Ronald L., author.<br/>Yer Numaras&#305;&#160;TJ163.2<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788770046848">https://www.taylorfrancis.com/books/9788770046848</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik 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Pawe&#322;.&#160;Gr&#261;dzki, Rafa&#322;.&#160;Golak, Karol.<br/>Yer Numaras&#305;&#160;HD30.23<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032638447">https://www.taylorfrancis.com/books/9781032638447</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 22nd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Artificial Intelligence in Transportation, RelStat-2022, October 20-21, 2022, Riga, Latvia ent://SD_ILS/0/SD_ILS:527300 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kabashkin, Igor. editor.&#160;Yatskiv, Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-26655-3">https://doi.org/10.1007/978-3-031-26655-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation ent://SD_ILS/0/SD_ILS:528444 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;van Gulijk, Coen. editor. 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D., editor.&#160;Ajayan, J., editor.&#160;Grabinski, W&#322;adys&#322;aw, editor.<br/>Yer Numaras&#305;&#160;TK7871.89 .L53<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003340577">https://www.taylorfrancis.com/books/9781003340577</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> ICPER 2020 Proceedings of the 7th International Conference on Production, Energy and Reliability ent://SD_ILS/0/SD_ILS:527387 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ahmad, Faiz. editor.&#160;Al-Kayiem, Hussain H. editor.&#160;King Soon, William Pao. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-19-1939-8">https://doi.org/10.1007/978-981-19-1939-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security. 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Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521180 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Milius, Birgit. editor.&#160;Collart-Dutilleul, Simon. editor.&#160;Lecomte, Thierry. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521134 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Bitsch, Friedemann. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022) ent://SD_ILS/0/SD_ILS:528353 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Senthil Kumar, C. editor.&#160;Sujatha, R. editor.&#160;Muthukumar, R. editor.&#160;Rao, K. 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(Mohammad), author.&#160;Groth, Katrina, author.<br/>Yer Numaras&#305;&#160;TA169 .M63 2023<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> LEADERSHIP STYLES AND JOB PERFORMANCE the impact of fake leadership on organizational reliability. ent://SD_ILS/0/SD_ILS:565979 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bie&#324;kowska, Agnieszka, author.&#160;Tworek, Katarzyna, author.<br/>Yer Numaras&#305;&#160;HD57.7<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032664194">https://www.taylorfrancis.com/books/9781032664194</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multi-criteria decision models in software reliability : methods and applications ent://SD_ILS/0/SD_ILS:571883 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Mishra, Ashish (Ashish Kumar), editor.&#160;Dieu Linh, Nguyen Thi, editor.&#160;Bhardwaj, Manish (Professor of computer science and engineering), editor.&#160;Pinto, Carla M. 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(Computer scientist), editor.<br/>Yer Numaras&#305;&#160;QA76.76 .R44 M85 2023<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367816414">https://www.taylorfrancis.com/books/9780367816414</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modeling remaining useful life dynamics in reliability engineering ent://SD_ILS/0/SD_ILS:579104 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Dersin, Pierre, author.<br/>Yer Numaras&#305;&#160;TS173<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003250685">https://www.taylorfrancis.com/books/9781003250685</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> ELECTRIC UTILITY RESOURCE PLANNING; ECONOMICS, RELIABILITY, AND DECISION-MAKING ent://SD_ILS/0/SD_ILS:555995 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Sim, Steven.<br/>Yer Numaras&#305;&#160;TK1001<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003301509">https://www.taylorfrancis.com/books/9781003301509</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Intelligent Reliability and Maintainability of Energy Infrastructure Assets ent://SD_ILS/0/SD_ILS:526952 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Li, He. author.&#160;Peng, Weiwen. author.&#160;Adumene, Sidum. author.&#160;Yazdi, Mohammad. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-29962-9">https://doi.org/10.1007/978-3-031-29962-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Performance, reliability, and availability evaluation of computational systems. Volume 1, Performance and background ent://SD_ILS/0/SD_ILS:585932 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Maciel, Paulo Romero Martins, author.<br/>Yer Numaras&#305;&#160;QA76<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306016">https://www.taylorfrancis.com/books/9781003306016</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Performance, reliability, and availability evaluation of computational systems. 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href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dynamic Management and Leadership in Education : High Reliability Techniques for Schools and Universities ent://SD_ILS/0/SD_ILS:567409 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kelly, Anthony, 1957- author.<br/>Yer Numaras&#305;&#160;LB2806 .K45 2022<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003217220">https://www.taylorfrancis.com/books/9781003217220</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Validity and reliability in built environment research : a 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href="https://www.taylorfrancis.com/books/9781003339816">https://www.taylorfrancis.com/books/9781003339816</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modern diagnostic X-ray sources : technology, manufacturing, reliability ent://SD_ILS/0/SD_ILS:560465 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Behling, Rolf, author.<br/>Yer Numaras&#305;&#160;RC78<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095408">https://www.taylorfrancis.com/books/9781003095408</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A comprehensive critique of student evaluation of teaching : critical perspectives on validity, reliability, and impartiality ent://SD_ILS/0/SD_ILS:573999 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Clayson, Dennis E., author.<br/>Yer Numaras&#305;&#160;LB2333 .C57 2021<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003091462">https://www.taylorfrancis.com/books/9781003091462</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Achieving Product Reliability : A Key to Business Success. ent://SD_ILS/0/SD_ILS:563478 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Doganaksoy, Necip, 1960- author.&#160;Meeker, William Q., author.&#160;Hahn, Gerald J., author.<br/>Yer Numaras&#305;&#160;TS156<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003181361">https://www.taylorfrancis.com/books/9781003181361</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, security, and reliability of robotic systems algorithms, applications, and technologies ent://SD_ILS/0/SD_ILS:556594 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gupta, Brij, 1982- editor.&#160;Nedjah, Nadia, editor.<br/>Yer Numaras&#305;&#160;TJ211.49<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003031352">https://www.taylorfrancis.com/books/9781003031352</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability-based analysis and design of structures and infrastructure ent://SD_ILS/0/SD_ILS:585816 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Farsangi, Ehsan Noroozinejad, editor.<br/>Yer Numaras&#305;&#160;TA658<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003194613">https://www.taylorfrancis.com/books/9781003194613</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Synesis : the unification of productivity, quality, safety and reliability ent://SD_ILS/0/SD_ILS:570100 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Hollnagel, Erik, 1941- author.<br/>Yer Numaras&#305;&#160;HD58.9<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003038245">https://www.taylorfrancis.com/books/9781003038245</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power systems control and reliability : electric power design and enhancement ent://SD_ILS/0/SD_ILS:562263 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Qamber, Isa S., author.<br/>Yer Numaras&#305;&#160;TK1001 .Q36 2020<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429287015">https://www.taylorfrancis.com/books/9780429287015</a> OCLC metadata license 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W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3&ndash;4, 2018, Proceedings ent://SD_ILS/0/SD_ILS:486900 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Duong, Trung Q. editor.&#160;Vo, Nguyen-Son. editor.&#160;Phan, Van Ca. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat&rsquo;18, 17-20 October 2018, Riga, Latvia ent://SD_ILS/0/SD_ILS:486996 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kabashkin, Igor. editor.&#160;Yatskiv (Jackiva), Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applications ent://SD_ILS/0/SD_ILS:487045 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Siddique, Shafaqat. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11&ndash;13, 2019, Proceedings ent://SD_ILS/0/SD_ILS:483736 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;Troubitsyna, Elena. editor.&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedings ent://SD_ILS/0/SD_ILS:484867 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;Troubitsyna, Elena. editor.&#160;Gashi, Ilir. editor.&#160;Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering ent://SD_ILS/0/SD_ILS:485213 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ali, Syed Riffat. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA ent://SD_ILS/0/SD_ILS:485921 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Boring, Ronald L. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthday ent://SD_ILS/0/SD_ILS:486029 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Li, Quan-Lin. editor.&#160;Wang, Jinting. editor.&#160;Yu, Hai-Bo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4&ndash;6, 2019, Proceedings ent://SD_ILS/0/SD_ILS:486274 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Collart-Dutilleul, Simon. editor.&#160;Lecomte, Thierry. editor.&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, V&auml;ster&aring;s, Sweden, September 18, 2018, Proceedings ent://SD_ILS/0/SD_ILS:399783 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gallina, Barbara. editor. (orcid)0000-0002-6952-1053&#160;Skavhaug, Amund. editor.&#160;Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip ent://SD_ILS/0/SD_ILS:401348 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Wang, Zheng. author.&#160;Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solid State Lighting Reliability Part 2 Components to Systems ent://SD_ILS/0/SD_ILS:401528 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;van Driel, Willem Dirk. editor.&#160;Fan, Xuejun. editor.&#160;Zhang, Guo Qi. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability ent://SD_ILS/0/SD_ILS:400290 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Jahanshahi, Mohsen. author.&#160;Bistouni, Fathollah. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, V&auml;ster&aring;s, Sweden, September 19-21, 2018, Proceedings ent://SD_ILS/0/SD_ILS:400344 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Gallina, Barbara. editor. 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Numaras&#305;&#160;ONLINE(355921.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ent://SD_ILS/0/SD_ILS:331478 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ueda, Osamu. editor.&#160;Pearton, Stephen J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331478.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked ent://SD_ILS/0/SD_ILS:332149 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z 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W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332682.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Early Software Reliability Prediction A Fuzzy Logic Approach ent://SD_ILS/0/SD_ILS:335512 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Pandey, Ajeet Kumar. author.&#160;Goyal, Neeraj Kumar. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335512.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optimal Stochastic Control Schemes within a Structural Reliability Framework ent://SD_ILS/0/SD_ILS:332864 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Leira, Bernt J. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332864.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers ent://SD_ILS/0/SD_ILS:334505 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Singh, Karan. editor.&#160;Awasthi, Amit K. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334505.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings ent://SD_ILS/0/SD_ILS:334958 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Yer Numaras&#305;&#160;ONLINE(334958.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Risk Evaluation of Wind Integrated Power Systems ent://SD_ILS/0/SD_ILS:335484 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Billinton, Roy. editor.&#160;Karki, Rajesh. editor.&#160;Verma, Ajit Kumar. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335484.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings ent://SD_ILS/0/SD_ILS:335005 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bitsch, Friedemann. editor.&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Ka&acirc;niche, Mohamed. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335005.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. ent://SD_ILS/0/SD_ILS:305286 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Epperlein, Peter W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Yer Numaras&#305;&#160;ONLINE(365001.1)<br/>Elektronik Eri&#351;im&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications ent://SD_ILS/0/SD_ILS:306566 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Wu, Bin, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Gas and oil reliability engineering modeling and analysis ent://SD_ILS/0/SD_ILS:145907 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Calixto, Eduardo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Using the Weibull distribution reliability, modeling, and inference ent://SD_ILS/0/SD_ILS:299479 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;McCool, John, 1936-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a> ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197419 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197420 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:249351 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:299386 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Kuo, Way, 1951-&#160;Zhu, Xiaoyan.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:305462 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR ent://SD_ILS/0/SD_ILS:206444 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Breysse, Denys. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability ent://SD_ILS/0/SD_ILS:173816 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Levinson, David M. editor.&#160;Liu, Henry X. editor.&#160;Bell, Michael. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power Electronic Packaging Design, Assembly Process, Reliability and Modeling ent://SD_ILS/0/SD_ILS:173841 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Liu, Yong. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers ent://SD_ILS/0/SD_ILS:196648 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Zhang, Xi. editor.&#160;Qiao, Daji. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197227 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Quirchmayr, Gerald. editor.&#160;Basl, Josef. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;Weippl, Edgar. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Availability and Serviceability of Networks-on-Chip ent://SD_ILS/0/SD_ILS:173779 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Cota, &Eacute;rika. author.&#160;Morais Amory, Alexandre. author.&#160;Soares Lubaszewski, Marcelo. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electric utility resource planning : economics, reliability, and decision-making ent://SD_ILS/0/SD_ILS:547458 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Sim, Steven., author.<br/>Yer Numaras&#305;&#160;TK1001 .S515 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315216744">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, maintainability, and risk : practical methods for engineers ent://SD_ILS/0/SD_ILS:459422 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Smith, David J. (David John), 1943 June 22-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testing ent://SD_ILS/0/SD_ILS:298653 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Liu, S. (Sheng), 1963-&#160;Liu, Yong, 1962-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probability, statistics, and reliability for engineers and scientists ent://SD_ILS/0/SD_ILS:312915 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Ayyub, Bilal M., author.&#160;McCuen, Richard H., 1941-<br/>Yer Numaras&#305;&#160;ONLINE(312915.1)<br/>Elektronik Eri&#351;im&#160;Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software ent://SD_ILS/0/SD_ILS:237354 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Walker, I. R..<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Spacecraft reliability and multi-state failures a statistical approach ent://SD_ILS/0/SD_ILS:305721 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Saleh, Joseph H., 1971-&#160;Castet, Jean-Fran&ccedil;ois.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality and Reliability of Large-Eddy Simulations II ent://SD_ILS/0/SD_ILS:205784 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Salvetti, Maria Vittoria. editor.&#160;Geurts, Bernard. editor.&#160;Meyers, Johan. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures ent://SD_ILS/0/SD_ILS:172530 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Stanisavljevi&#263;, Milo&scaron;. author.&#160;Schmid, Alexandre. author.&#160;Leblebici, Yusuf. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Basic Concepts and Applications in ICT ent://SD_ILS/0/SD_ILS:194550 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Lazzaroni, Massimo. author.&#160;Cristaldi, Loredana. author.&#160;Peretto, Lorenzo. author.&#160;Rinaldi, Paola. author.&#160;Catelani, Marcantonio. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. 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Proceedings ent://SD_ILS/0/SD_ILS:195586 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Flammini, Francesco. editor.&#160;Bologna, Sandro. editor.&#160;Vittorini, Valeria. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Adhesives technology for electronic applications materials, processing, reliability ent://SD_ILS/0/SD_ILS:146014 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Licari, James J., 1930-&#160;Swanson, Dale W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems. ent://SD_ILS/0/SD_ILS:149176 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Smith, David J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mining equipment and systems : theory and practice of exploitation and reliability ent://SD_ILS/0/SD_ILS:544540 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Czaplicki, Jacek M., author.<br/>Yer Numaras&#305;&#160;TN146 .C93 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9780203852804">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Bauer, Eric.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance ent://SD_ILS/0/SD_ILS:168321 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Nikulin, M.S. editor.&#160;Limnios, Nikolaos. editor.&#160;Balakrishnan, N. editor.&#160;Kahle, Waltraud. editor.&#160;Huber-Carol, Catherine. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Control ent://SD_ILS/0/SD_ILS:168333 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Rykov, V.V. editor.&#160;Balakrishnan, N. editor.&#160;Nikulin, M.S. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedings ent://SD_ILS/0/SD_ILS:193040 2026-01-11T04:39:10Z 2026-01-11T04:39:10Z Yazar&#160;Schoitsch, Erwin. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>