Arama Sonuçları Reliability. - Daraltılmış: Online Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300$0026isd$003dtrue?dt=list
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Reliability
ent://SD_ILS/0/SD_ILS:233427
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Yazar Meyer, J. Patrick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Structural reliability
ent://SD_ILS/0/SD_ILS:297978
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Yazar Lemaire, Maurice. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability engineering
ent://SD_ILS/0/SD_ILS:341870
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Yazar Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Yer Numarası ONLINE(341870.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
MEMS Reliability
ent://SD_ILS/0/SD_ILS:172486
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Yazar Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Bayesian Reliability
ent://SD_ILS/0/SD_ILS:167542
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Yazar Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability fundamentals
ent://SD_ILS/0/SD_ILS:255215
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Yazar Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ensuring software reliability
ent://SD_ILS/0/SD_ILS:542468
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Yazar Neufelder, Ann Marie, 1960- author.<br/>Yer Numarası QA76.76 .R44 N48 1992<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439832752">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
System Software Reliability
ent://SD_ILS/0/SD_ILS:175367
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Yazar Pham, Hoang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:249382
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Yazar Raheja, Dev. Gullo, Louis J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical system reliability
ent://SD_ILS/0/SD_ILS:153146
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Yazar Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of MEMS
ent://SD_ILS/0/SD_ILS:303632
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Yazar Tsuchiya, Toshiyuki. Tabata, Osamu, 1956- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:543493
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Yazar Crow, Dana. Feinberg, Alec.<br/>Yer Numarası TK7836 .D473 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical reliability engineering
ent://SD_ILS/0/SD_ILS:305563
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Yazar O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Improving machinery reliability
ent://SD_ILS/0/SD_ILS:153828
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Yazar Bloch, Heinz P., 1933-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic reliability models
ent://SD_ILS/0/SD_ILS:299523
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Yazar Ushakov, I. A. (Igorʹ Alekseevich)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Statistical reliability engineering
ent://SD_ILS/0/SD_ILS:295099
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Yazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic reliability engineering
ent://SD_ILS/0/SD_ILS:295101
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Yazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Optimal Maintenance
ent://SD_ILS/0/SD_ILS:175380
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Yazar Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintenance Theory of Reliability
ent://SD_ILS/0/SD_ILS:175323
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Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Safety Engineering
ent://SD_ILS/0/SD_ILS:176193
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Yazar Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Engineering design reliability handbook
ent://SD_ILS/0/SD_ILS:544208
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Yazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Yer Numarası TA174 .E544 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of large systems
ent://SD_ILS/0/SD_ILS:254513
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Yazar Kołowrocki, Krzysztof.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power-system reliability calculations
ent://SD_ILS/0/SD_ILS:220175
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Yazar Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Circuit Design for Reliability
ent://SD_ILS/0/SD_ILS:529164
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Yazar Reis, Ricardo. editor. Cao, Yu. editor. Wirth, Gilson. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Models in Reliability
ent://SD_ILS/0/SD_ILS:332363
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Yazar Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332363.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Network Reliability and Resilience
ent://SD_ILS/0/SD_ILS:195005
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Yazar Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Life cycle reliability engineering
ent://SD_ILS/0/SD_ILS:296926
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Yazar Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied reliability for engineers
ent://SD_ILS/0/SD_ILS:565385
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Yazar Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reinforced concrete structural reliability
ent://SD_ILS/0/SD_ILS:543776
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Yazar El-Reedy, Mohamed Abdallah., author.<br/>Yer Numarası TA683 .E47 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439874172">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quantile-Based Reliability Analysis
ent://SD_ILS/0/SD_ILS:330556
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Yazar Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330556.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronic thin-film reliability
ent://SD_ILS/0/SD_ILS:278156
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Yazar Tu, K. N. (King-Ning), 1937-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electric power distribution reliability
ent://SD_ILS/0/SD_ILS:543516
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Yazar Brown, Richard E., 1969, author.<br/>Yer Numarası TK3091 .B76 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222332">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability-based Structural Design
ent://SD_ILS/0/SD_ILS:175421
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Yazar Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Six Sigma
ent://SD_ILS/0/SD_ILS:165709
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Yazar Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electric power distribution reliability
ent://SD_ILS/0/SD_ILS:539124
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Yazar Brown, Richard E., 1969- author.<br/>Yer Numarası TK3091 .B76 2002 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429164682">https://www.taylorfrancis.com/books/9780429164682</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lubrication and reliability handbook
ent://SD_ILS/0/SD_ILS:256333
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Yazar Neale, M. J. (Michael John)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fatigue design and reliability
ent://SD_ILS/0/SD_ILS:254466
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Yazar International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of reliability engineering
ent://SD_ILS/0/SD_ILS:295100
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications in Reliability and Statistical Computing
ent://SD_ILS/0/SD_ILS:527152
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Introduction to Quality and Reliability Engineering
ent://SD_ILS/0/SD_ILS:529803
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Jiang, Renyan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-47215-6">https://doi.org/10.1007/978-3-662-47215-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Innovations in Power Systems Reliability
ent://SD_ILS/0/SD_ILS:168417
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Nonparametric Statistics in Reliability
ent://SD_ILS/0/SD_ILS:168426
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software Reliability Assessment with OR Applications
ent://SD_ILS/0/SD_ILS:168454
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fatigue and Fracture Reliability Engineering
ent://SD_ILS/0/SD_ILS:168458
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mining Equipment Reliability, Maintainability, and Safety
ent://SD_ILS/0/SD_ILS:144346
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, Balbir S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced Reliability Models and Maintenance Policies
ent://SD_ILS/0/SD_ILS:175800
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Product Reliability Specification and Performance
ent://SD_ILS/0/SD_ILS:175790
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Murthy, Dodderi Narshima Prabhakar. author. Rausand, Marvin. author. Østerås, Trond. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Predictive Analytics in System Reliability
ent://SD_ILS/0/SD_ILS:526781
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Improving product reliability strategies and implementation
ent://SD_ILS/0/SD_ILS:295695
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Levin, Mark, 1959- Kalal, Ted T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a>
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John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic models in reliability engineering
ent://SD_ILS/0/SD_ILS:554549
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Cui, Lirong, 1960- editor. Frenkel, Ilia, 1950- editor. Lisnianski, Anatoly, editor.<br/>Yer Numarası TA169 .S759 2020 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429331527">https://www.taylorfrancis.com/books/9780429331527</a>
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KRIGING IN SLOPE RELIABILITY ANALYSIS
ent://SD_ILS/0/SD_ILS:589037
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Liu, Lei-Lei. Li, Jing-Ze. Huang, Lei.<br/>Yer Numarası TN272.7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003475156">https://www.taylorfrancis.com/books/9781003475156</a>
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Reliability modelling with information measures
ent://SD_ILS/0/SD_ILS:562731
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.<br/>Yer Numarası TA169 .N3526 2022 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a>
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RELIABILITY ENGINEERING a life cycle approach.
ent://SD_ILS/0/SD_ILS:575297
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bradley, Edgar.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Philosophies of structural safety and reliability
ent://SD_ILS/0/SD_ILS:582933
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Raĭzer, V. D. (Vladimir Davidovich), author. Elishakoff, Isaac, author.<br/>Yer Numarası TA656<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The reliability of generating data
ent://SD_ILS/0/SD_ILS:552847
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Krippendorff, Klaus, author.<br/>Yer Numarası QA76.9 .Q36<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112020">https://www.taylorfrancis.com/books/9781003112020</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Cloud reliability engineering : technologies and tools
ent://SD_ILS/0/SD_ILS:571108
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Raj, Pethuru, editor. Achary, Rathnakar, editor.<br/>Yer Numarası QA76.585 .C568 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003030973">https://www.taylorfrancis.com/books/9781003030973</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, maintainability, and safety for engineers
ent://SD_ILS/0/SD_ILS:590317
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S., author.<br/>Yer Numarası TS173<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429340574">https://www.taylorfrancis.com/books/9780429340574</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Aspect of Cloud Computing Environment
ent://SD_ILS/0/SD_ILS:399144
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:401906
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
In-Service Fatigue Reliability of Structures
ent://SD_ILS/0/SD_ILS:401041
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Petinov, Sergei V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality and Reliability in Analytical Chemistry.
ent://SD_ILS/0/SD_ILS:540933
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Baiulescu, George E., author.<br/>Yer Numarası QD75.4 .Q34<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781420038576">https://www.taylorfrancis.com/books/e/9781420038576</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429127441">https://www.taylorfrancis.com/books/e/9780429127441</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429127441">https://www.taylorfrancis.com/books/9780429127441</a>
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Wire Ropes Tension, Endurance, Reliability
ent://SD_ILS/0/SD_ILS:529516
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Feyrer, Klaus. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-54996-0">https://doi.org/10.1007/978-3-642-54996-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk and reliability in geotechnical engineering
ent://SD_ILS/0/SD_ILS:544526
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ching, Jianye, editor. Phoon, Kok-Kwang, editor.<br/>Yer Numarası TA706 .R48 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482227222">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ternary Networks Reliability and Monte Carlo
ent://SD_ILS/0/SD_ILS:485508
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of large and complex systems
ent://SD_ILS/0/SD_ILS:355886
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kołowrocki, Krzysztof, author.<br/>Yer Numarası ONLINE(355886.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability models for engineers and scientists
ent://SD_ILS/0/SD_ILS:545739
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kaminskiy, Mark, 1946, author.<br/>Yer Numarası TA169 .K36 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466565937">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer system reliability : safety and usability
ent://SD_ILS/0/SD_ILS:547174
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S., author.<br/>Yer Numarası QA76.76 .R44 D495 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466573130">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Analog IC Reliability in Nanometer CMOS
ent://SD_ILS/0/SD_ILS:331961
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331961.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electricity infrastructure reliability and vulnerabilities
ent://SD_ILS/0/SD_ILS:281073
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Guerritore, Walter B.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Klyatis, Lev M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and availability of cloud computing
ent://SD_ILS/0/SD_ILS:249383
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and maintenance : networks and systems
ent://SD_ILS/0/SD_ILS:546172
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Beichelt, Frank, 1942, author. Tittmann, Peter.<br/>Yer Numarası TA169 .B45 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826362">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor packaging : materials interaction and reliability
ent://SD_ILS/0/SD_ILS:546600
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Chen, Andrea., author. Lo, Randy.<br/>Yer Numarası TK7870.15 .C54 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439862070">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Measures of interobserver agreement and reliability
ent://SD_ILS/0/SD_ILS:539074
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Shoukri, M. M. (Mohamed M.), author. Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Yer Numarası RC71.3 .S478 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439810811">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multistate systems reliability theory with applications
ent://SD_ILS/0/SD_ILS:298781
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Natvig, Bent, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Functional Analysis Methods for Reliability Models
ent://SD_ILS/0/SD_ILS:176727
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gupur, Geni. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:191586
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transportation systems reliability and safety
ent://SD_ILS/0/SD_ILS:539600
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası TA1145 .D453 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439846414">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Human reliability assessment : theory and practice
ent://SD_ILS/0/SD_ILS:540046
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Spurgin, Anthony J., author.<br/>Yer Numarası TA166 .S685 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:192824
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety and reliability of bridge structures
ent://SD_ILS/0/SD_ILS:545232
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Mahmoud, Khaled M.<br/>Yer Numarası TG300 .M34 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135172435">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mathematical models for systems reliability
ent://SD_ILS/0/SD_ILS:538905
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Epstein, Benjamin, 1918, author. Weissman, Ishay, 1940-<br/>Yer Numarası TA169 .E67 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Silver Metallization Stability and Reliability
ent://SD_ILS/0/SD_ILS:175677
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:185203
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Critical Infrastructure Reliability and Vulnerability
ent://SD_ILS/0/SD_ILS:185336
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Murray, Alan T. editor. Grubesic, Tony H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Wire Ropes Tension, Endurance, Reliability
ent://SD_ILS/0/SD_ILS:183848
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Feyrer, K. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Distribution reliability and power quality
ent://SD_ILS/0/SD_ILS:543499
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Short, T. A. (Tom A.), 1966- author.<br/>Yer Numarası TK3091 .S465 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420036480">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintainability, maintenance, and reliability for engineers
ent://SD_ILS/0/SD_ILS:545920
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası TA168 .D53 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and risk a Bayesian perspective
ent://SD_ILS/0/SD_ILS:296819
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerated quality and reliability solutions
ent://SD_ILS/0/SD_ILS:254415
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Klyatis, Lev M. Klyatis, Eugene L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Ageing and Dependence for Reliability
ent://SD_ILS/0/SD_ILS:166017
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, quality, and safety for engineers
ent://SD_ILS/0/SD_ILS:547810
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası TS173 .D495 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Case studies in reliability and maintenance
ent://SD_ILS/0/SD_ILS:300226
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability modeling, prediction, and optimization
ent://SD_ILS/0/SD_ILS:300337
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ceramics processing, reliability, tribology and wear.
ent://SD_ILS/0/SD_ILS:300592
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Müller, G. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Medical device reliability and associated areas
ent://SD_ILS/0/SD_ILS:540912
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası R855.3 .D47 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design reliability : fundamentals and applications
ent://SD_ILS/0/SD_ILS:540572
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası TA174 .D4929 1999<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor memories technology, testing, and reliability
ent://SD_ILS/0/SD_ILS:249739
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
An elementary guide to reliability
ent://SD_ILS/0/SD_ILS:254325
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
New trends in system reliability evaluation
ent://SD_ILS/0/SD_ILS:255243
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety and Reliability Methodology and Applications.
ent://SD_ILS/0/SD_ILS:545362
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yer Numarası TA169.7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429226823">https://www.taylorfrancis.com/books/9780429226823</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Interconnect Reliability in Advanced Memory Device Packaging
ent://SD_ILS/0/SD_ILS:526838
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Processes with Applications to Reliability Theory
ent://SD_ILS/0/SD_ILS:168475
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Failure Rate Modelling for Reliability and Risk
ent://SD_ILS/0/SD_ILS:175868
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Shock and Damage Models in Reliability Theory
ent://SD_ILS/0/SD_ILS:175420
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Human Reliability and Error in Transportation Systems
ent://SD_ILS/0/SD_ILS:175578
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System Reliability and Security Techniques and Methodologies.
ent://SD_ILS/0/SD_ILS:576623
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Iqbal, Javaid. Masoodi, Faheem Syeed. Ahmad Malik, Ishfaq. Khurshid, Shozab. Saraf, Iqra.<br/>Yer Numarası QA76.9 .A25<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032624983">https://www.taylorfrancis.com/books/9781032624983</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied reliability, usability, and quality for engineers
ent://SD_ILS/0/SD_ILS:579176
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and safety of cable-supported bridges
ent://SD_ILS/0/SD_ILS:585766
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lu, Naiwei, editor. Liu, Yang (Of Haerbin gong ye da xue), editor. Noori, Mohammad, editor.<br/>Yer Numarası TG405<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003170594">https://www.taylorfrancis.com/books/9781003170594</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety-Critical Electrical Drives Topologies, Reliability, Performance
ent://SD_ILS/0/SD_ILS:401112
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk and Reliability : Coastal and Hydraulic Engineering
ent://SD_ILS/0/SD_ILS:541176
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Reeve, Dominic, author.<br/>Yer Numarası TC205 .R448 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331314.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Process plant equipment operation, control, and reliability
ent://SD_ILS/0/SD_ILS:299085
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Offshore Wind Turbines Reliability, availability and maintenance
ent://SD_ILS/0/SD_ILS:247956
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tavner, Peter<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Telecommunications system reliability engineering, theory, and practice
ent://SD_ILS/0/SD_ILS:249397
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ayers, Mark L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Compressors how to achieve high reliability & availability
ent://SD_ILS/0/SD_ILS:293579
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bloch, Heinz P., 1933- Geitner, Fred K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lead-free solders materials reliability for electronics
ent://SD_ILS/0/SD_ILS:305591
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hydrosystems engineering reliability assessment and risk analysis
ent://SD_ILS/0/SD_ILS:293215
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability centered maintenance (RCM) implementation made simple
ent://SD_ILS/0/SD_ILS:293571
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bloom, Neil.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Microtechnology Interconnects, Devices and Systems
ent://SD_ILS/0/SD_ILS:172420
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution
ent://SD_ILS/0/SD_ILS:191769
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Strong, Alvin Wayne, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solder Joint Reliability Prediction for Multiple Environments
ent://SD_ILS/0/SD_ILS:167673
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VoIP handbook : applications, technologies, reliability, and security
ent://SD_ILS/0/SD_ILS:547478
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Yer Numarası TK5105.8865 .V658 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420070217">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Rules of thumb for maintenance and reliability engineers
ent://SD_ILS/0/SD_ILS:306517
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Smith, Ricky. Mobley, R. Keith, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Rules of thumb for maintenance and reliability engineers
ent://SD_ILS/0/SD_ILS:149151
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Smith, Ricky. Mobley, R. Keith, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality and Reliability of Large-Eddy Simulations
ent://SD_ILS/0/SD_ILS:170230
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Meyers, Johan. editor. Geurts, Bernard J. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
New Computational Methods in Power System Reliability
ent://SD_ILS/0/SD_ILS:187983
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Elmakias, David. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solder Joint Technology Materials, Properties, and Reliability
ent://SD_ILS/0/SD_ILS:166252
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tu, King-Ning. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and risk models setting reliability requirements
ent://SD_ILS/0/SD_ILS:295900
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Todinov, M. T. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical reliability of electronic equipment and products
ent://SD_ILS/0/SD_ILS:545333
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Hnatek, Eugene R., author.<br/>Yer Numarası TK7870.23 .H53 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135564438">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Managing risk and reliability of process plants
ent://SD_ILS/0/SD_ILS:254721
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tweeddale, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High reliability magnetic devices : design and fabrication
ent://SD_ILS/0/SD_ILS:547829
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar McLyman, Colonel William T., 1932, author.<br/>Yer Numarası TK454.4 .M3 M35 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135563738">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Cognitive reliability and error analysis method CREAM
ent://SD_ILS/0/SD_ILS:254433
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Hollnagel, Erik, 1941-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System reliability theory models and statistical methods
ent://SD_ILS/0/SD_ILS:295270
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Heyman, Joseph S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Which-Is-Better (WIB): Problems in Reliability Theory
ent://SD_ILS/0/SD_ILS:526867
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27316-2">https://doi.org/10.1007/978-3-031-27316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday
ent://SD_ILS/0/SD_ILS:527804
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Liu, Yu. editor. Wang, Dong. editor. Mi, Jinhua. editor. Li, He. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28859-3">https://doi.org/10.1007/978-3-031-28859-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
ent://SD_ILS/0/SD_ILS:526829
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Woo, Seongwoo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Point Processes for Reliability Analysis Shocks and Repairable Systems
ent://SD_ILS/0/SD_ILS:402392
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Multi-state Systems Reliability Theory and Applications
ent://SD_ILS/0/SD_ILS:401098
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
ent://SD_ILS/0/SD_ILS:401845
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Human Reliability, Error, and Human Factors in Power Generation
ent://SD_ILS/0/SD_ILS:487643
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Monte Carlo Simulation Method for System Reliability and Risk Analysis
ent://SD_ILS/0/SD_ILS:331017
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Zio, Enrico. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331017.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Design
ent://SD_ILS/0/SD_ILS:331097
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tinga, T. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331097.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday
ent://SD_ILS/0/SD_ILS:331109
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331109.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations
ent://SD_ILS/0/SD_ILS:331121
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331121.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inference
ent://SD_ILS/0/SD_ILS:173390
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability technology principles and practice of failure prevention in electronic systems
ent://SD_ILS/0/SD_ILS:298817
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Pascoe, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
ent://SD_ILS/0/SD_ILS:168571
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Simulation Methods for Reliability and Availability of Complex Systems
ent://SD_ILS/0/SD_ILS:175923
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Faulin, Javier. editor. Juan, Angel A. editor. Martorell, Sebastián. editor. Ramírez-Márquez, José-Emmanuel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Complex System Reliability Multichannel Systems with Imperfect Fault Coverage
ent://SD_ILS/0/SD_ILS:176244
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Myers, Albert. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Reliability and Quality in Design
ent://SD_ILS/0/SD_ILS:175716
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Reliability and Quality Fundamentals, Methods and Procedures
ent://SD_ILS/0/SD_ILS:175443
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Universal Generating Function in Reliability Analysis and Optimization
ent://SD_ILS/0/SD_ILS:175337
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Levitin, Gregory. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Designing faultless mechanical products based on advanced reliability analysis
ent://SD_ILS/0/SD_ILS:590951
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Woo, Seongwoo, 1966- author.<br/>Yer Numarası TS173<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003451471">https://www.taylorfrancis.com/books/9781003451471</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System reliability analysis : transition from binary to multi-state models
ent://SD_ILS/0/SD_ILS:591002
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kumar, Akshay, editor. Ram, Mangey, editor. Gaonkar, Rajesh S. Prabhu, editor. Klochkov, Yury, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003546214">https://www.taylorfrancis.com/books/9781003546214</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and maintenance modeling with optimization : advances and applications
ent://SD_ILS/0/SD_ILS:562446
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kimura, Mitsutaka, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095231">https://www.taylorfrancis.com/books/9781003095231</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Industrial reliability and safety engineering : applications and practices
ent://SD_ILS/0/SD_ILS:578979
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Panchal, Dilbagh, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003140092">https://www.taylorfrancis.com/books/9781003140092</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Statistical modeling of reliability structures and industrial processes
ent://SD_ILS/0/SD_ILS:564431
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003203124">https://www.taylorfrancis.com/books/9781003203124</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design of mechanical systems based on statistics : a guide to improving product reliability
ent://SD_ILS/0/SD_ILS:585409
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Woo, Seong-woo, author.<br/>Yer Numarası TJ245.5<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429022050">https://www.taylorfrancis.com/books/9780429022050</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability management and engineering : challenges and future trends
ent://SD_ILS/0/SD_ILS:583504
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Garg, Harish, editor. Ram, Mangey, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429268922">https://www.taylorfrancis.com/books/9780429268922</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fracture mechanics. 1, Analysis of reliability and quality control
ent://SD_ILS/0/SD_ILS:305424
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Grous, Ammar, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
ent://SD_ILS/0/SD_ILS:175839
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Security and Reliability of Damaged Structures and Defective Materials
ent://SD_ILS/0/SD_ILS:204889
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines
ent://SD_ILS/0/SD_ILS:169842
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Guidelines for improving plant reliability through data collection and analysis
ent://SD_ILS/0/SD_ILS:300022
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
ent://SD_ILS/0/SD_ILS:256115
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Reliability and Maintenance Modeling : Proceedings of the 11th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM 2024, Nagoya, Japan, 26-30 August 2024)
ent://SD_ILS/0/SD_ILS:561997
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (11th : 2024 : Nagoya, Japan). Okamura, Hiroyuki, editor. Inoue, Shinji, editor. Xiao, Xiao, editor.<br/>Yer Numarası TA342<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003491309">https://www.taylorfrancis.com/books/9781003491309</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China
ent://SD_ILS/0/SD_ILS:279620
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and optimization of structural systems : proceedings of Reliability and Optimization of Structural Systems, Tum, Munchen, Germany, 7-10 April 2010
ent://SD_ILS/0/SD_ILS:542232
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Reliability and Optimization of Structural Systems (2010 : Tum, Munchen, Germany) Straub, D.<br/>Yer Numarası TA658.2 .R45 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781136898563">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, risk and safety : theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009, Prague, Czech Republic, 7-10 September 2009
ent://SD_ILS/0/SD_ILS:542234
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar European Safety and Reliability Conference (2009 : Prague, Czech Republic) Briš, Radim, 1957- Martorell, Sebastián. Soares, C. Guedes.<br/>Yer Numarası TA169.7 .E975 2009 EB<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9780429206504">https://www.taylorfrancis.com/books/9780429206504</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429206504">https://www.taylorfrancis.com/books/9780429206504</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009
ent://SD_ILS/0/SD_ILS:546575
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) CRC Press.<br/>Yer Numarası TA168 .I58 2009<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781439847657">https://www.taylorfrancis.com/books/9781439847657</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367803667">https://www.taylorfrancis.com/books/9780367803667</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
SYSTEM RELIABILITY, RISK, LONGEVITY, SUSTAINABILITY AND OPTIMAL DECISION MAKING ... emphasis on marine structures.
ent://SD_ILS/0/SD_ILS:580432
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Frangopol, Dan M. Kim, Sunyong, 1976- author.<br/>Yer Numarası TC1665<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003542827">https://www.taylorfrancis.com/books/9781003542827</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The iron triangle of energy : how to improve energy cost, reliability, and emissions
ent://SD_ILS/0/SD_ILS:551570
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Miller, Ronald L., author.<br/>Yer Numarası TJ163.2<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788770046848">https://www.taylorfrancis.com/books/9788770046848</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Long-term strength of materials : reliability assessment and lifetime prediction of engineering structures
ent://SD_ILS/0/SD_ILS:584038
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Chudnovsky, Alexander, author. Sehanobish, Kalyan, author.<br/>Yer Numarası TA405<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003359845">https://www.taylorfrancis.com/books/9781003359845</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
THEORY AND PRACTICE OF DECISION MAKING IN REGULATION, DIAGNOSTICS AND RELIABILITY OF MACHINES
ent://SD_ILS/0/SD_ILS:588241
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lindstedt, Paweł. Grądzki, Rafał. Golak, Karol.<br/>Yer Numarası HD30.23<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032638447">https://www.taylorfrancis.com/books/9781032638447</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 22nd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Artificial Intelligence in Transportation, RelStat-2022, October 20-21, 2022, Riga, Latvia
ent://SD_ILS/0/SD_ILS:527300
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26655-3">https://doi.org/10.1007/978-3-031-26655-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation
ent://SD_ILS/0/SD_ILS:528444
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar van Gulijk, Coen. editor. (orcid)0000-0003-4541-2693 Zaitseva, Elena. editor. Kvassay, Miroslav. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
ORGANIC AND INORGANIC LIGHT EMITTING DIODES reliability issues and.
ent://SD_ILS/0/SD_ILS:553105
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Subash, T. D., editor. Ajayan, J., editor. Grabinski, Władysław, editor.<br/>Yer Numarası TK7871.89 .L53<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003340577">https://www.taylorfrancis.com/books/9781003340577</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
ICPER 2020 Proceedings of the 7th International Conference on Production, Energy and Reliability
ent://SD_ILS/0/SD_ILS:527387
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ahmad, Faiz. editor. Al-Kayiem, Hussain H. editor. King Soon, William Pao. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-1939-8">https://doi.org/10.1007/978-981-19-1939-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521137
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521180
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521134
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
ent://SD_ILS/0/SD_ILS:528353
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5049-2">https://doi.org/10.1007/978-981-99-5049-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
What every engineer should know about reliability and risk analysis
ent://SD_ILS/0/SD_ILS:565637
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Modarres, M. (Mohammad), author. Groth, Katrina, author.<br/>Yer Numarası TA169 .M63 2023<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
LEADERSHIP STYLES AND JOB PERFORMANCE the impact of fake leadership on organizational reliability.
ent://SD_ILS/0/SD_ILS:565979
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bieńkowska, Agnieszka, author. Tworek, Katarzyna, author.<br/>Yer Numarası HD57.7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032664194">https://www.taylorfrancis.com/books/9781032664194</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multi-criteria decision models in software reliability : methods and applications
ent://SD_ILS/0/SD_ILS:571883
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Mishra, Ashish (Ashish Kumar), editor. Dieu Linh, Nguyen Thi, editor. Bhardwaj, Manish (Professor of computer science and engineering), editor. Pinto, Carla M. A. (Computer scientist), editor.<br/>Yer Numarası QA76.76 .R44 M85 2023<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367816414">https://www.taylorfrancis.com/books/9780367816414</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modeling remaining useful life dynamics in reliability engineering
ent://SD_ILS/0/SD_ILS:579104
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Dersin, Pierre, author.<br/>Yer Numarası TS173<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003250685">https://www.taylorfrancis.com/books/9781003250685</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
ELECTRIC UTILITY RESOURCE PLANNING; ECONOMICS, RELIABILITY, AND DECISION-MAKING
ent://SD_ILS/0/SD_ILS:555995
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Sim, Steven.<br/>Yer Numarası TK1001<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003301509">https://www.taylorfrancis.com/books/9781003301509</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Intelligent Reliability and Maintainability of Energy Infrastructure Assets
ent://SD_ILS/0/SD_ILS:526952
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Li, He. author. Peng, Weiwen. author. Adumene, Sidum. author. Yazdi, Mohammad. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-29962-9">https://doi.org/10.1007/978-3-031-29962-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Performance, reliability, and availability evaluation of computational systems. Volume 1, Performance and background
ent://SD_ILS/0/SD_ILS:585932
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Maciel, Paulo Romero Martins, author.<br/>Yer Numarası QA76<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306016">https://www.taylorfrancis.com/books/9781003306016</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Performance, reliability, and availability evaluation of computational systems. Volume 2, Reliability, availability modeling, measuring, and data analysis
ent://SD_ILS/0/SD_ILS:585933
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Maciel, Paulo Romero Martins, author.<br/>Yer Numarası QA76<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306030">https://www.taylorfrancis.com/books/9781003306030</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Information technology in contemporary organizations : redefining IT management for organizational reliability
ent://SD_ILS/0/SD_ILS:590844
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tworek, Katarzyna, author.<br/>Yer Numarası HD30.213<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003365044">https://www.taylorfrancis.com/books/9781003365044</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optimal reliability-based design of structures against several natural hazards
ent://SD_ILS/0/SD_ILS:558659
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ang, Alfredo Hua-Sing, 1930- author. De Leon, David (De Leon Escobido), author. Fan, Wenliang, author.<br/>Yer Numarası TA658 .A56 2022<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003177289">https://www.taylorfrancis.com/books/9781003177289</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Dynamic Management and Leadership in Education : High Reliability Techniques for Schools and Universities
ent://SD_ILS/0/SD_ILS:567409
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kelly, Anthony, 1957- author.<br/>Yer Numarası LB2806 .K45 2022<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003217220">https://www.taylorfrancis.com/books/9781003217220</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Validity and reliability in built environment research : a selection of case studies
ent://SD_ILS/0/SD_ILS:569018
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ahmed, Vian, editor. Opoku, Alex, editor. Olanipekun, Ayokunle, editor. Sutrisna, Monty, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243226">https://www.taylorfrancis.com/books/9780429243226</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Total manufacturing assurance : controlling product quality, reliability, and safety
ent://SD_ILS/0/SD_ILS:575150
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Brauer, Douglas, author. Cesarone, John, author.<br/>Yer Numarası TS156.6<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003208051">https://www.taylorfrancis.com/books/9781003208051</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability-based design in soil and rock engineering
ent://SD_ILS/0/SD_ILS:551889
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Low, Bak Kong, author.<br/>Yer Numarası TA705<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112297">https://www.taylorfrancis.com/books/9781003112297</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
DISCRETE STOCHASTIC MODELS AND APPLICATIONS FOR RELIABILITY ENGINEERING AND STATISTICAL QUALITY CONTROL
ent://SD_ILS/0/SD_ILS:589623
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Eryilmaz, Serkan.<br/>Yer Numarası QA274.2<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003160632">https://www.taylorfrancis.com/books/9781003160632</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Thermal and reliability criteria for nuclear fuel safety
ent://SD_ILS/0/SD_ILS:554086
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Maksymov, Maksym. Alyokhina, Svitlana. Brunetkin, Oleksandr.<br/>Yer Numarası TK9360<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003339816">https://www.taylorfrancis.com/books/9781003339816</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modern diagnostic X-ray sources : technology, manufacturing, reliability
ent://SD_ILS/0/SD_ILS:560465
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Behling, Rolf, author.<br/>Yer Numarası RC78<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095408">https://www.taylorfrancis.com/books/9781003095408</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
A comprehensive critique of student evaluation of teaching : critical perspectives on validity, reliability, and impartiality
ent://SD_ILS/0/SD_ILS:573999
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Clayson, Dennis E., author.<br/>Yer Numarası LB2333 .C57 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003091462">https://www.taylorfrancis.com/books/9781003091462</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Achieving Product Reliability : A Key to Business Success.
ent://SD_ILS/0/SD_ILS:563478
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.<br/>Yer Numarası TS156<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003181361">https://www.taylorfrancis.com/books/9781003181361</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety, security, and reliability of robotic systems algorithms, applications, and technologies
ent://SD_ILS/0/SD_ILS:556594
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gupta, Brij, 1982- editor. Nedjah, Nadia, editor.<br/>Yer Numarası TJ211.49<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003031352">https://www.taylorfrancis.com/books/9781003031352</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability-based analysis and design of structures and infrastructure
ent://SD_ILS/0/SD_ILS:585816
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Farsangi, Ehsan Noroozinejad, editor.<br/>Yer Numarası TA658<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003194613">https://www.taylorfrancis.com/books/9781003194613</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Synesis : the unification of productivity, quality, safety and reliability
ent://SD_ILS/0/SD_ILS:570100
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Hollnagel, Erik, 1941- author.<br/>Yer Numarası HD58.9<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003038245">https://www.taylorfrancis.com/books/9781003038245</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power systems control and reliability : electric power design and enhancement
ent://SD_ILS/0/SD_ILS:562263
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Qamber, Isa S., author.<br/>Yer Numarası TK1001 .Q36 2020<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429287015">https://www.taylorfrancis.com/books/9780429287015</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Organizational reliability : human resources, information technology and management
ent://SD_ILS/0/SD_ILS:558536
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bieńkowska, Agnieszka, author. Tworek, Katarzyna, author. Zabłocka-Kluczka, Anna, author.<br/>Yer Numarası HF5549 .B4594 2020<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003047995">https://www.taylorfrancis.com/books/9781003047995</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3–4, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:486900
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Duong, Trung Q. editor. Vo, Nguyen-Son. editor. Phan, Van Ca. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’18, 17-20 October 2018, Riga, Latvia
ent://SD_ILS/0/SD_ILS:486996
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kabashkin, Igor. editor. Yatskiv (Jackiva), Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applications
ent://SD_ILS/0/SD_ILS:487045
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Siddique, Shafaqat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11–13, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:483736
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:484867
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Gashi, Ilir. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
ent://SD_ILS/0/SD_ILS:485213
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
ent://SD_ILS/0/SD_ILS:485921
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Boring, Ronald L. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthday
ent://SD_ILS/0/SD_ILS:486029
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Li, Quan-Lin. editor. Wang, Jinting. editor. Yu, Hai-Bo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4–6, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:486274
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:399783
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
ent://SD_ILS/0/SD_ILS:401348
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid State Lighting Reliability Part 2 Components to Systems
ent://SD_ILS/0/SD_ILS:401528
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
ent://SD_ILS/0/SD_ILS:400290
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:400344
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia
ent://SD_ILS/0/SD_ILS:402395
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
ent://SD_ILS/0/SD_ILS:460117
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Suganuma, Katsuaki, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:400873
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
ent://SD_ILS/0/SD_ILS:401830
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Pattern recognition for reliability assessment of water distribution networks
ent://SD_ILS/0/SD_ILS:546715
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Trifunović, Nemanja. CRC Press LLC.<br/>Yer Numarası TD481<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429097645">https://www.taylorfrancis.com/books/9780429097645</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Availability of Quality Control Based on Wavelet Computer Vision
ent://SD_ILS/0/SD_ILS:530061
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kuzmanić, Ivica. author. Vujović, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-13317-1">https://doi.org/10.1007/978-3-319-13317-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Steel Columns Protected by Intumescent Coatings Subjected to Natural Fires
ent://SD_ILS/0/SD_ILS:530376
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Zhang, Chao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-46379-6">https://doi.org/10.1007/978-3-662-46379-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519092
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems
ent://SD_ILS/0/SD_ILS:529277
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability
ent://SD_ILS/0/SD_ILS:529569
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-2751-7">https://doi.org/10.1007/978-1-4939-2751-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
ent://SD_ILS/0/SD_ILS:530050
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Nakagawa, Toshio. author. Zhao, Xufeng. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-20813-8">https://doi.org/10.1007/978-3-319-20813-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability
ent://SD_ILS/0/SD_ILS:530321
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Lee, Tae-Kyu. author. Bieler, Thomas R. author. Kim, Choong-Un. author. Ma, Hongtao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-9266-5">https://doi.org/10.1007/978-1-4614-9266-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semi-Markov processes : applications in system reliability and maintenance
ent://SD_ILS/0/SD_ILS:355517
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Grabski, Franciszek, author.<br/>Yer Numarası ONLINE(355517.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Chemical and biochemical technology : materials, processing, and reliability
ent://SD_ILS/0/SD_ILS:540085
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Varfolomeev, Sergei Dmitrievich, editor.<br/>Yer Numarası TP145 .C44 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482257625">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519026
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-24255-2">https://doi.org/10.1007/978-3-319-24255-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:482801
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bondavalli, Andrea. editor. Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety, Reliability, Risk and Life-Cycle Performance of Structures and Infrastructures
ent://SD_ILS/0/SD_ILS:539366
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Deodatis, George, editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.<br/>Yer Numarası TA656<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429227950">https://www.taylorfrancis.com/books/9780429227950</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
ent://SD_ILS/0/SD_ILS:488848
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Richter, Detlev. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings
ent://SD_ILS/0/SD_ILS:485676
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bondavalli, Andrea. editor. Ceccarelli, Andrea. editor. Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:489055
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Teufel, Stephanie. editor. A Min, Tjoa. editor. You, Illsun. editor. Weippl, Edgar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:489246
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solder Joint Reliability Assessment Finite Element Simulation Methodology
ent://SD_ILS/0/SD_ILS:530730
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Tamin, Mohd N. author. Shaffiar, Norhashimah M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-00092-3">https://doi.org/10.1007/978-3-319-00092-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of reliability engineering : applications in multistage interconnection networks
ent://SD_ILS/0/SD_ILS:342010
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Gunawan, Indra.<br/>Yer Numarası ONLINE(342010.1)<br/>Elektronik Erişim Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a>
Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a>
ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and failure of electronic materials and devices
ent://SD_ILS/0/SD_ILS:355485
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Yer Numarası ONLINE(355485.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of safety-critical systems : theory and application
ent://SD_ILS/0/SD_ILS:341773
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Rausand, Marvin.<br/>Yer Numarası ONLINE(341773.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability prediction from burn-in data fit to reliability models
ent://SD_ILS/0/SD_ILS:355921
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bernstein, Joseph.<br/>Yer Numarası ONLINE(355921.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ent://SD_ILS/0/SD_ILS:331478
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331478.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked
ent://SD_ILS/0/SD_ILS:332149
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Li, Haijun. editor. Li, Xiaohu. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332149.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332682.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Early Software Reliability Prediction A Fuzzy Logic Approach
ent://SD_ILS/0/SD_ILS:335512
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Pandey, Ajeet Kumar. author. Goyal, Neeraj Kumar. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335512.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optimal Stochastic Control Schemes within a Structural Reliability Framework
ent://SD_ILS/0/SD_ILS:332864
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Leira, Bernt J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332864.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:334505
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Singh, Karan. editor. Awasthi, Amit K. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334505.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:334958
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.<br/>Yer Numarası ONLINE(334958.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Risk Evaluation of Wind Integrated Power Systems
ent://SD_ILS/0/SD_ILS:335484
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335484.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:335005
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335005.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
ent://SD_ILS/0/SD_ILS:305286
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Epperlein, Peter W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
ent://SD_ILS/0/SD_ILS:365001
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Yer Numarası ONLINE(365001.1)<br/>Elektronik Erişim Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications
ent://SD_ILS/0/SD_ILS:306566
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Wu, Bin, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Gas and oil reliability engineering modeling and analysis
ent://SD_ILS/0/SD_ILS:145907
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Calixto, Eduardo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Using the Weibull distribution reliability, modeling, and inference
ent://SD_ILS/0/SD_ILS:299479
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar McCool, John, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a>
ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197419
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197420
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
ent://SD_ILS/0/SD_ILS:249351
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bauer, Eric. Adams, Randee. Eustace, Dan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Importance measures in reliability, risk, and optimization principles and applications
ent://SD_ILS/0/SD_ILS:299386
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
ent://SD_ILS/0/SD_ILS:305462
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Bauer, Eric. Adams, Randee. Eustace, Dan. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR
ent://SD_ILS/0/SD_ILS:206444
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Breysse, Denys. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability
ent://SD_ILS/0/SD_ILS:173816
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
ent://SD_ILS/0/SD_ILS:173841
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Liu, Yong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:196648
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197227
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Availability and Serviceability of Networks-on-Chip
ent://SD_ILS/0/SD_ILS:173779
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electric utility resource planning : economics, reliability, and decision-making
ent://SD_ILS/0/SD_ILS:547458
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Sim, Steven., author.<br/>Yer Numarası TK1001 .S515 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315216744">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, maintainability, and risk : practical methods for engineers
ent://SD_ILS/0/SD_ILS:459422
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Smith, David J. (David John), 1943 June 22-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testing
ent://SD_ILS/0/SD_ILS:298653
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Liu, S. (Sheng), 1963- Liu, Yong, 1962- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probability, statistics, and reliability for engineers and scientists
ent://SD_ILS/0/SD_ILS:312915
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Yer Numarası ONLINE(312915.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software
ent://SD_ILS/0/SD_ILS:237354
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Walker, I. R..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Spacecraft reliability and multi-state failures a statistical approach
ent://SD_ILS/0/SD_ILS:305721
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2026-01-11T04:39:10Z
Yazar Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality and Reliability of Large-Eddy Simulations II
ent://SD_ILS/0/SD_ILS:205784
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Yazar Salvetti, Maria Vittoria. editor. Geurts, Bernard. editor. Meyers, Johan. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
ent://SD_ILS/0/SD_ILS:172530
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Yazar Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Basic Concepts and Applications in ICT
ent://SD_ILS/0/SD_ILS:194550
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Yazar Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195302
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Yazar Tjoa, A Min. editor. Quirchmayr, Gerald. editor. You, Ilsun. editor. Xu, Lida. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Assessment of Power System Reliability Methods and Applications
ent://SD_ILS/0/SD_ILS:168569
2026-01-11T04:39:10Z
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Yazar Čepin, Marko. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195586
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Flammini, Francesco. editor. Bologna, Sandro. editor. Vittorini, Valeria. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Adhesives technology for electronic applications materials, processing, reliability
ent://SD_ILS/0/SD_ILS:146014
2026-01-11T04:39:10Z
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Yazar Licari, James J., 1930- Swanson, Dale W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.
ent://SD_ILS/0/SD_ILS:149176
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Yazar Smith, David J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mining equipment and systems : theory and practice of exploitation and reliability
ent://SD_ILS/0/SD_ILS:544540
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Yazar Czaplicki, Jacek M., author.<br/>Yer Numarası TN146 .C93 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9780203852804">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for reliability information and computer-based systems
ent://SD_ILS/0/SD_ILS:249879
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Yazar Bauer, Eric.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance
ent://SD_ILS/0/SD_ILS:168321
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2026-01-11T04:39:10Z
Yazar Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Control
ent://SD_ILS/0/SD_ILS:168333
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2026-01-11T04:39:10Z
Yazar Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:193040
2026-01-11T04:39:10Z
2026-01-11T04:39:10Z
Yazar Schoitsch, Erwin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>