Arama Sonuçları Reliability. - Daraltılmış: Electronic Library
SirsiDynix Enterprise
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Reliability
ent://SD_ILS/0/SD_ILS:233427
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Yazar Meyer, J. Patrick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Structural reliability
ent://SD_ILS/0/SD_ILS:297978
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Yazar Lemaire, Maurice. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability engineering
ent://SD_ILS/0/SD_ILS:341870
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Yazar Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Yer Numarası ONLINE(341870.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
MEMS Reliability
ent://SD_ILS/0/SD_ILS:172486
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Yazar Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Bayesian Reliability
ent://SD_ILS/0/SD_ILS:167542
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Yazar Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability fundamentals
ent://SD_ILS/0/SD_ILS:255215
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Yazar Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System Software Reliability
ent://SD_ILS/0/SD_ILS:175367
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Yazar Pham, Hoang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:249382
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Yazar Raheja, Dev. Gullo, Louis J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical system reliability
ent://SD_ILS/0/SD_ILS:153146
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Yazar Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of MEMS
ent://SD_ILS/0/SD_ILS:303632
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Yazar Tsuchiya, Toshiyuki. Tabata, Osamu, 1956- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical reliability engineering
ent://SD_ILS/0/SD_ILS:305563
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Yazar O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Improving machinery reliability
ent://SD_ILS/0/SD_ILS:153828
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Yazar Bloch, Heinz P., 1933-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic reliability models
ent://SD_ILS/0/SD_ILS:299523
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Yazar Ushakov, I. A. (Igorʹ Alekseevich)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Statistical reliability engineering
ent://SD_ILS/0/SD_ILS:295099
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Yazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic reliability engineering
ent://SD_ILS/0/SD_ILS:295101
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Yazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Optimal Maintenance
ent://SD_ILS/0/SD_ILS:175380
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Yazar Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintenance Theory of Reliability
ent://SD_ILS/0/SD_ILS:175323
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Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Safety Engineering
ent://SD_ILS/0/SD_ILS:176193
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Yazar Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of large systems
ent://SD_ILS/0/SD_ILS:254513
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Yazar Kołowrocki, Krzysztof.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power-system reliability calculations
ent://SD_ILS/0/SD_ILS:220175
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Yazar Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Circuit Design for Reliability
ent://SD_ILS/0/SD_ILS:529164
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Yazar Reis, Ricardo. editor. Cao, Yu. editor. Wirth, Gilson. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Models in Reliability
ent://SD_ILS/0/SD_ILS:332363
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Yazar Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332363.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Network Reliability and Resilience
ent://SD_ILS/0/SD_ILS:195005
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Yazar Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Life cycle reliability engineering
ent://SD_ILS/0/SD_ILS:296926
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Yazar Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quantile-Based Reliability Analysis
ent://SD_ILS/0/SD_ILS:330556
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Yazar Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330556.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronic thin-film reliability
ent://SD_ILS/0/SD_ILS:278156
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Yazar Tu, K. N. (King-Ning), 1937-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability-based Structural Design
ent://SD_ILS/0/SD_ILS:175421
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Yazar Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Six Sigma
ent://SD_ILS/0/SD_ILS:165709
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Yazar Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lubrication and reliability handbook
ent://SD_ILS/0/SD_ILS:256333
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Yazar Neale, M. J. (Michael John)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fatigue design and reliability
ent://SD_ILS/0/SD_ILS:254466
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Yazar International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of reliability engineering
ent://SD_ILS/0/SD_ILS:295100
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Yazar Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications in Reliability and Statistical Computing
ent://SD_ILS/0/SD_ILS:527152
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Yazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Introduction to Quality and Reliability Engineering
ent://SD_ILS/0/SD_ILS:529803
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Yazar Jiang, Renyan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-47215-6">https://doi.org/10.1007/978-3-662-47215-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Innovations in Power Systems Reliability
ent://SD_ILS/0/SD_ILS:168417
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Yazar Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Nonparametric Statistics in Reliability
ent://SD_ILS/0/SD_ILS:168426
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Yazar Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software Reliability Assessment with OR Applications
ent://SD_ILS/0/SD_ILS:168454
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Yazar Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fatigue and Fracture Reliability Engineering
ent://SD_ILS/0/SD_ILS:168458
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Product Reliability Specification and Performance
ent://SD_ILS/0/SD_ILS:175790
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Murthy, Dodderi Narshima Prabhakar. author. Rausand, Marvin. author. Østerås, Trond. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced Reliability Models and Maintenance Policies
ent://SD_ILS/0/SD_ILS:175800
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mining Equipment Reliability, Maintainability, and Safety
ent://SD_ILS/0/SD_ILS:144346
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Dhillon, Balbir S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Predictive Analytics in System Reliability
ent://SD_ILS/0/SD_ILS:526781
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Improving product reliability strategies and implementation
ent://SD_ILS/0/SD_ILS:295695
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Levin, Mark, 1959- Kalal, Ted T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a>
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John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Aspect of Cloud Computing Environment
ent://SD_ILS/0/SD_ILS:399144
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
In-Service Fatigue Reliability of Structures
ent://SD_ILS/0/SD_ILS:401041
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Petinov, Sergei V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:401906
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Wire Ropes Tension, Endurance, Reliability
ent://SD_ILS/0/SD_ILS:529516
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Feyrer, Klaus. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-54996-0">https://doi.org/10.1007/978-3-642-54996-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of large and complex systems
ent://SD_ILS/0/SD_ILS:355886
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kołowrocki, Krzysztof, author.<br/>Yer Numarası ONLINE(355886.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ternary Networks Reliability and Monte Carlo
ent://SD_ILS/0/SD_ILS:485508
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Analog IC Reliability in Nanometer CMOS
ent://SD_ILS/0/SD_ILS:331961
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331961.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electricity infrastructure reliability and vulnerabilities
ent://SD_ILS/0/SD_ILS:281073
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Guerritore, Walter B.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and availability of cloud computing
ent://SD_ILS/0/SD_ILS:249383
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Klyatis, Lev M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:191586
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Functional Analysis Methods for Reliability Models
ent://SD_ILS/0/SD_ILS:176727
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gupur, Geni. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multistate systems reliability theory with applications
ent://SD_ILS/0/SD_ILS:298781
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Natvig, Bent, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:192824
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Silver Metallization Stability and Reliability
ent://SD_ILS/0/SD_ILS:175677
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Wire Ropes Tension, Endurance, Reliability
ent://SD_ILS/0/SD_ILS:183848
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Feyrer, K. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:185203
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Critical Infrastructure Reliability and Vulnerability
ent://SD_ILS/0/SD_ILS:185336
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Murray, Alan T. editor. Grubesic, Tony H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Ageing and Dependence for Reliability
ent://SD_ILS/0/SD_ILS:166017
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerated quality and reliability solutions
ent://SD_ILS/0/SD_ILS:254415
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Klyatis, Lev M. Klyatis, Eugene L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and risk a Bayesian perspective
ent://SD_ILS/0/SD_ILS:296819
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Case studies in reliability and maintenance
ent://SD_ILS/0/SD_ILS:300226
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ceramics processing, reliability, tribology and wear.
ent://SD_ILS/0/SD_ILS:300592
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Müller, G. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability modeling, prediction, and optimization
ent://SD_ILS/0/SD_ILS:300337
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor memories technology, testing, and reliability
ent://SD_ILS/0/SD_ILS:249739
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
An elementary guide to reliability
ent://SD_ILS/0/SD_ILS:254325
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
New trends in system reliability evaluation
ent://SD_ILS/0/SD_ILS:255243
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Interconnect Reliability in Advanced Memory Device Packaging
ent://SD_ILS/0/SD_ILS:526838
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Processes with Applications to Reliability Theory
ent://SD_ILS/0/SD_ILS:168475
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Failure Rate Modelling for Reliability and Risk
ent://SD_ILS/0/SD_ILS:175868
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Human Reliability and Error in Transportation Systems
ent://SD_ILS/0/SD_ILS:175578
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Shock and Damage Models in Reliability Theory
ent://SD_ILS/0/SD_ILS:175420
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety-Critical Electrical Drives Topologies, Reliability, Performance
ent://SD_ILS/0/SD_ILS:401112
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331314.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Offshore Wind Turbines Reliability, availability and maintenance
ent://SD_ILS/0/SD_ILS:247956
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tavner, Peter<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Telecommunications system reliability engineering, theory, and practice
ent://SD_ILS/0/SD_ILS:249397
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ayers, Mark L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Compressors how to achieve high reliability & availability
ent://SD_ILS/0/SD_ILS:293579
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bloch, Heinz P., 1933- Geitner, Fred K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Process plant equipment operation, control, and reliability
ent://SD_ILS/0/SD_ILS:299085
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Lead-free solders materials reliability for electronics
ent://SD_ILS/0/SD_ILS:305591
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Microtechnology Interconnects, Devices and Systems
ent://SD_ILS/0/SD_ILS:172420
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability centered maintenance (RCM) implementation made simple
ent://SD_ILS/0/SD_ILS:293571
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bloom, Neil.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hydrosystems engineering reliability assessment and risk analysis
ent://SD_ILS/0/SD_ILS:293215
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution
ent://SD_ILS/0/SD_ILS:191769
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solder Joint Reliability Prediction for Multiple Environments
ent://SD_ILS/0/SD_ILS:167673
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Strong, Alvin Wayne, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality and Reliability of Large-Eddy Simulations
ent://SD_ILS/0/SD_ILS:170230
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Meyers, Johan. editor. Geurts, Bernard J. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
New Computational Methods in Power System Reliability
ent://SD_ILS/0/SD_ILS:187983
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Elmakias, David. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Rules of thumb for maintenance and reliability engineers
ent://SD_ILS/0/SD_ILS:149151
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Smith, Ricky. Mobley, R. Keith, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Rules of thumb for maintenance and reliability engineers
ent://SD_ILS/0/SD_ILS:306517
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Smith, Ricky. Mobley, R. Keith, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solder Joint Technology Materials, Properties, and Reliability
ent://SD_ILS/0/SD_ILS:166252
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tu, King-Ning. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and risk models setting reliability requirements
ent://SD_ILS/0/SD_ILS:295900
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Todinov, M. T. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Managing risk and reliability of process plants
ent://SD_ILS/0/SD_ILS:254721
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tweeddale, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Cognitive reliability and error analysis method CREAM
ent://SD_ILS/0/SD_ILS:254433
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Hollnagel, Erik, 1941-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System reliability theory models and statistical methods
ent://SD_ILS/0/SD_ILS:295270
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Heyman, Joseph S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
ent://SD_ILS/0/SD_ILS:526829
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Woo, Seongwoo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Which-Is-Better (WIB): Problems in Reliability Theory
ent://SD_ILS/0/SD_ILS:526867
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27316-2">https://doi.org/10.1007/978-3-031-27316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday
ent://SD_ILS/0/SD_ILS:527804
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Liu, Yu. editor. Wang, Dong. editor. Mi, Jinhua. editor. Li, He. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28859-3">https://doi.org/10.1007/978-3-031-28859-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
ent://SD_ILS/0/SD_ILS:401845
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Point Processes for Reliability Analysis Shocks and Repairable Systems
ent://SD_ILS/0/SD_ILS:402392
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Multi-state Systems Reliability Theory and Applications
ent://SD_ILS/0/SD_ILS:401098
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Human Reliability, Error, and Human Factors in Power Generation
ent://SD_ILS/0/SD_ILS:487643
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Monte Carlo Simulation Method for System Reliability and Risk Analysis
ent://SD_ILS/0/SD_ILS:331017
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Zio, Enrico. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331017.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday
ent://SD_ILS/0/SD_ILS:331109
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331109.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations
ent://SD_ILS/0/SD_ILS:331121
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331121.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Design
ent://SD_ILS/0/SD_ILS:331097
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tinga, T. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331097.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inference
ent://SD_ILS/0/SD_ILS:173390
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
ent://SD_ILS/0/SD_ILS:168571
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability technology principles and practice of failure prevention in electronic systems
ent://SD_ILS/0/SD_ILS:298817
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Pascoe, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Simulation Methods for Reliability and Availability of Complex Systems
ent://SD_ILS/0/SD_ILS:175923
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Faulin, Javier. editor. Juan, Angel A. editor. Martorell, Sebastián. editor. Ramírez-Márquez, José-Emmanuel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Complex System Reliability Multichannel Systems with Imperfect Fault Coverage
ent://SD_ILS/0/SD_ILS:176244
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Myers, Albert. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Reliability and Quality in Design
ent://SD_ILS/0/SD_ILS:175716
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Reliability and Quality Fundamentals, Methods and Procedures
ent://SD_ILS/0/SD_ILS:175443
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Universal Generating Function in Reliability Analysis and Optimization
ent://SD_ILS/0/SD_ILS:175337
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Levitin, Gregory. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fracture mechanics. 1, Analysis of reliability and quality control
ent://SD_ILS/0/SD_ILS:305424
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Grous, Ammar, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
ent://SD_ILS/0/SD_ILS:175839
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Security and Reliability of Damaged Structures and Defective Materials
ent://SD_ILS/0/SD_ILS:204889
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines
ent://SD_ILS/0/SD_ILS:169842
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Guidelines for improving plant reliability through data collection and analysis
ent://SD_ILS/0/SD_ILS:300022
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
ent://SD_ILS/0/SD_ILS:256115
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China
ent://SD_ILS/0/SD_ILS:279620
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521137
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521180
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521134
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 22nd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Artificial Intelligence in Transportation, RelStat-2022, October 20-21, 2022, Riga, Latvia
ent://SD_ILS/0/SD_ILS:527300
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26655-3">https://doi.org/10.1007/978-3-031-26655-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation
ent://SD_ILS/0/SD_ILS:528444
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar van Gulijk, Coen. editor. (orcid)0000-0003-4541-2693 Zaitseva, Elena. editor. Kvassay, Miroslav. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Intelligent Reliability and Maintainability of Energy Infrastructure Assets
ent://SD_ILS/0/SD_ILS:526952
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Li, He. author. Peng, Weiwen. author. Adumene, Sidum. author. Yazdi, Mohammad. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-29962-9">https://doi.org/10.1007/978-3-031-29962-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
ent://SD_ILS/0/SD_ILS:528353
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5049-2">https://doi.org/10.1007/978-981-99-5049-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
ICPER 2020 Proceedings of the 7th International Conference on Production, Energy and Reliability
ent://SD_ILS/0/SD_ILS:527387
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ahmad, Faiz. editor. Al-Kayiem, Hussain H. editor. King Soon, William Pao. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-1939-8">https://doi.org/10.1007/978-981-19-1939-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11–13, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:483736
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4–6, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:486274
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3–4, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:486900
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Duong, Trung Q. editor. Vo, Nguyen-Son. editor. Phan, Van Ca. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:484867
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Gashi, Ilir. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
ent://SD_ILS/0/SD_ILS:485213
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’18, 17-20 October 2018, Riga, Latvia
ent://SD_ILS/0/SD_ILS:486996
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kabashkin, Igor. editor. Yatskiv (Jackiva), Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
ent://SD_ILS/0/SD_ILS:485921
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Boring, Ronald L. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthday
ent://SD_ILS/0/SD_ILS:486029
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Li, Quan-Lin. editor. Wang, Jinting. editor. Yu, Hai-Bo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applications
ent://SD_ILS/0/SD_ILS:487045
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Siddique, Shafaqat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
ent://SD_ILS/0/SD_ILS:401830
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia
ent://SD_ILS/0/SD_ILS:402395
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
ent://SD_ILS/0/SD_ILS:460117
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Suganuma, Katsuaki, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
ent://SD_ILS/0/SD_ILS:400290
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:400344
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:400873
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:399783
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
ent://SD_ILS/0/SD_ILS:401348
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid State Lighting Reliability Part 2 Components to Systems
ent://SD_ILS/0/SD_ILS:401528
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semi-Markov processes : applications in system reliability and maintenance
ent://SD_ILS/0/SD_ILS:355517
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Grabski, Franciszek, author.<br/>Yer Numarası ONLINE(355517.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Steel Columns Protected by Intumescent Coatings Subjected to Natural Fires
ent://SD_ILS/0/SD_ILS:530376
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Zhang, Chao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-46379-6">https://doi.org/10.1007/978-3-662-46379-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519026
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-24255-2">https://doi.org/10.1007/978-3-319-24255-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
ent://SD_ILS/0/SD_ILS:530050
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Nakagawa, Toshio. author. Zhao, Xufeng. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-20813-8">https://doi.org/10.1007/978-3-319-20813-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Availability of Quality Control Based on Wavelet Computer Vision
ent://SD_ILS/0/SD_ILS:530061
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kuzmanić, Ivica. author. Vujović, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-13317-1">https://doi.org/10.1007/978-3-319-13317-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability
ent://SD_ILS/0/SD_ILS:530321
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lee, Tae-Kyu. author. Bieler, Thomas R. author. Kim, Choong-Un. author. Ma, Hongtao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-9266-5">https://doi.org/10.1007/978-1-4614-9266-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519092
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems
ent://SD_ILS/0/SD_ILS:529277
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability
ent://SD_ILS/0/SD_ILS:529569
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-2751-7">https://doi.org/10.1007/978-1-4939-2751-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
ent://SD_ILS/0/SD_ILS:488848
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Richter, Detlev. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of safety-critical systems : theory and application
ent://SD_ILS/0/SD_ILS:341773
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Rausand, Marvin.<br/>Yer Numarası ONLINE(341773.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of reliability engineering : applications in multistage interconnection networks
ent://SD_ILS/0/SD_ILS:342010
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gunawan, Indra.<br/>Yer Numarası ONLINE(342010.1)<br/>Elektronik Erişim Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a>
Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a>
ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability prediction from burn-in data fit to reliability models
ent://SD_ILS/0/SD_ILS:355921
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bernstein, Joseph.<br/>Yer Numarası ONLINE(355921.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:482801
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bondavalli, Andrea. editor. Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:489055
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Teufel, Stephanie. editor. A Min, Tjoa. editor. You, Illsun. editor. Weippl, Edgar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:489246
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and failure of electronic materials and devices
ent://SD_ILS/0/SD_ILS:355485
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Yer Numarası ONLINE(355485.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solder Joint Reliability Assessment Finite Element Simulation Methodology
ent://SD_ILS/0/SD_ILS:530730
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tamin, Mohd N. author. Shaffiar, Norhashimah M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-00092-3">https://doi.org/10.1007/978-3-319-00092-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings
ent://SD_ILS/0/SD_ILS:485676
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bondavalli, Andrea. editor. Ceccarelli, Andrea. editor. Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Gas and oil reliability engineering modeling and analysis
ent://SD_ILS/0/SD_ILS:145907
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Calixto, Eduardo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:334505
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Singh, Karan. editor. Awasthi, Amit K. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334505.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:334958
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.<br/>Yer Numarası ONLINE(334958.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:335005
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335005.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ent://SD_ILS/0/SD_ILS:331478
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331478.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
ent://SD_ILS/0/SD_ILS:365001
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Yer Numarası ONLINE(365001.1)<br/>Elektronik Erişim Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
ent://SD_ILS/0/SD_ILS:305286
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Epperlein, Peter W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332682.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optimal Stochastic Control Schemes within a Structural Reliability Framework
ent://SD_ILS/0/SD_ILS:332864
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Leira, Bernt J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332864.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications
ent://SD_ILS/0/SD_ILS:306566
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Wu, Bin, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and Risk Evaluation of Wind Integrated Power Systems
ent://SD_ILS/0/SD_ILS:335484
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335484.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Early Software Reliability Prediction A Fuzzy Logic Approach
ent://SD_ILS/0/SD_ILS:335512
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Pandey, Ajeet Kumar. author. Goyal, Neeraj Kumar. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335512.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked
ent://SD_ILS/0/SD_ILS:332149
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Li, Haijun. editor. Li, Xiaohu. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332149.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197227
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197419
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197420
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability
ent://SD_ILS/0/SD_ILS:173816
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
ent://SD_ILS/0/SD_ILS:173841
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Liu, Yong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Availability and Serviceability of Networks-on-Chip
ent://SD_ILS/0/SD_ILS:173779
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR
ent://SD_ILS/0/SD_ILS:206444
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Breysse, Denys. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
ent://SD_ILS/0/SD_ILS:249351
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bauer, Eric. Adams, Randee. Eustace, Dan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
ent://SD_ILS/0/SD_ILS:305462
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bauer, Eric. Adams, Randee. Eustace, Dan. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Using the Weibull distribution reliability, modeling, and inference
ent://SD_ILS/0/SD_ILS:299479
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar McCool, John, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a>
ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:196648
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Importance measures in reliability, risk, and optimization principles and applications
ent://SD_ILS/0/SD_ILS:299386
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Assessment of Power System Reliability Methods and Applications
ent://SD_ILS/0/SD_ILS:168569
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Čepin, Marko. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
ent://SD_ILS/0/SD_ILS:172530
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality and Reliability of Large-Eddy Simulations II
ent://SD_ILS/0/SD_ILS:205784
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Salvetti, Maria Vittoria. editor. Geurts, Bernard. editor. Meyers, Johan. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Adhesives technology for electronic applications materials, processing, reliability
ent://SD_ILS/0/SD_ILS:146014
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Licari, James J., 1930- Swanson, Dale W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.
ent://SD_ILS/0/SD_ILS:149176
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Smith, David J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195586
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Flammini, Francesco. editor. Bologna, Sandro. editor. Vittorini, Valeria. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software
ent://SD_ILS/0/SD_ILS:237354
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Walker, I. R..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, maintainability, and risk : practical methods for engineers
ent://SD_ILS/0/SD_ILS:459422
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Smith, David J. (David John), 1943 June 22-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Spacecraft reliability and multi-state failures a statistical approach
ent://SD_ILS/0/SD_ILS:305721
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probability, statistics, and reliability for engineers and scientists
ent://SD_ILS/0/SD_ILS:312915
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Yer Numarası ONLINE(312915.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Basic Concepts and Applications in ICT
ent://SD_ILS/0/SD_ILS:194550
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195302
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tjoa, A Min. editor. Quirchmayr, Gerald. editor. You, Ilsun. editor. Xu, Lida. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testing
ent://SD_ILS/0/SD_ILS:298653
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Liu, S. (Sheng), 1963- Liu, Yong, 1962- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networks
ent://SD_ILS/0/SD_ILS:168292
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Skiadas, Christos H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance
ent://SD_ILS/0/SD_ILS:168321
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Control
ent://SD_ILS/0/SD_ILS:168333
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probability and Statistical Models Foundations for Problems in Reliability and Financial Mathematics
ent://SD_ILS/0/SD_ILS:168337
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gupta, Arjun K. author. Zeng, Wei-Bin. author. Wu, Yanhong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4987-6">http://dx.doi.org/10.1007/978-0-8176-4987-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:172571
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar McPherson, J.W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers
ent://SD_ILS/0/SD_ILS:176221
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Lisnianski, Anatoly. author. Frenkel, Ilia. author. Ding, Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-320-6">http://dx.doi.org/10.1007/978-1-84996-320-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Process risk and reliability management operational integrity management
ent://SD_ILS/0/SD_ILS:147219
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Sutton, Ian S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for reliability information and computer-based systems
ent://SD_ILS/0/SD_ILS:249879
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bauer, Eric.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Calculation of Roundabouts Capacity, Waiting Phenomena and Reliability
ent://SD_ILS/0/SD_ILS:190985
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Mauro, Raffaele. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:193040
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Schoitsch, Erwin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design
ent://SD_ILS/0/SD_ILS:175745
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedings
ent://SD_ILS/0/SD_ILS:191426
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bartolini, Novella. editor. Nikoletseas, Sotiris. editor. Sinha, Prasun. editor. Cardellini, Valeria. editor. Mahanti, Anirban. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Machine Learning in Cyber Trust Security, Privacy, and Reliability
ent://SD_ILS/0/SD_ILS:167900
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Yu, Philip S. editor. Tsai, Jeffrey J. P. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power distribution system reliability practical methods and applications
ent://SD_ILS/0/SD_ILS:249563
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedings
ent://SD_ILS/0/SD_ILS:190960
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida
ent://SD_ILS/0/SD_ILS:297457
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Robust design methodology for reliability exploring the effects of variation and uncertainty
ent://SD_ILS/0/SD_ILS:298396
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedings
ent://SD_ILS/0/SD_ILS:188894
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability
ent://SD_ILS/0/SD_ILS:183993
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bertsche, Bernd. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Developments in Telecommunications With a Focus on SS7 Network Reliability
ent://SD_ILS/0/SD_ILS:187329
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Rufa, Gerhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Engineering design reliability applications for the aerospace, automotive, and ship industries
ent://SD_ILS/0/SD_ILS:153040
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis
ent://SD_ILS/0/SD_ILS:167030
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11n
ent://SD_ILS/0/SD_ILS:236024
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Perahia, Eldad. Stacey, Robert.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Tutorial on hardware and software reliability, maintainability, and availability
ent://SD_ILS/0/SD_ILS:249814
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Schneidewind, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mathematical methods in survival analysis, reliability and quality of life
ent://SD_ILS/0/SD_ILS:297543
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Huber, Catherine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimization
ent://SD_ILS/0/SD_ILS:184534
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Levitin, Gregory. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliability
ent://SD_ILS/0/SD_ILS:184535
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Levitin, Gregory. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007. Proceedings
ent://SD_ILS/0/SD_ILS:187335
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Saglietti, Francesca. editor. Oster, Norbert. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
A Guide to Lead-free Solders Physical Metallurgy and Reliability
ent://SD_ILS/0/SD_ILS:175373
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
ent://SD_ILS/0/SD_ILS:165900
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientists
ent://SD_ILS/0/SD_ILS:166411
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Saunders, Sam C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semi-Markov Risk Models for Finance, Insurance and Reliability
ent://SD_ILS/0/SD_ILS:166761
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Jacques, Janssen. author. Raimondo, Manca. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-70730-1">http://dx.doi.org/10.1007/0-387-70730-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System Signatures and their Applications in Engineering Reliability
ent://SD_ILS/0/SD_ILS:166881
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Samaniego, Francisco J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk-based reliability analysis and generic principles for risk reduction
ent://SD_ILS/0/SD_ILS:148956
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Todinov, M. T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Margins of error a study of reliability in survey measurement
ent://SD_ILS/0/SD_ILS:296996
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedings
ent://SD_ILS/0/SD_ILS:184859
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Górski, Janusz. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1–3 September, 2004
ent://SD_ILS/0/SD_ILS:169088
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Yang, W. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedings
ent://SD_ILS/0/SD_ILS:183068
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Winther, Rune. editor. Gran, Bjørn Axel. editor. Dahll, Gustav. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11563228">http://dx.doi.org/10.1007/11563228</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applications
ent://SD_ILS/0/SD_ILS:168118
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Balakrishnan, N. editor. Nagaraja, H. N. editor. Kannan, N. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138793">http://dx.doi.org/10.1007/b138793</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, maintainability and risk practical methods for engineers
ent://SD_ILS/0/SD_ILS:254854
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Smith, David John, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Adhesives technology for electronic applications materials, processes, reliability
ent://SD_ILS/0/SD_ILS:256461
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Licari, James J., 1930- Swanson, Dale W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Robust communications software extreme availability, reliability and scalability for carrier-grade systems
ent://SD_ILS/0/SD_ILS:295648
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Utas, Greg. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470011793">http://dx.doi.org/10.1002/0470011793</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineering
ent://SD_ILS/0/SD_ILS:301672
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar El-Haik, Basem.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550</a>
John Wiley <a href="http://dx.doi.org/10.1002/0471714682">http://dx.doi.org/10.1002/0471714682</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Coating materials for electronic applications polymers, processes, reliability, testing
ent://SD_ILS/0/SD_ILS:254844
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Licari, James J., 1930-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, survivability and quality of large scale telecommunications systems
ent://SD_ILS/0/SD_ILS:301093
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Stavroulakis, Peter. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470860812">http://dx.doi.org/10.1002/0470860812</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk, Reliability, Uncertainty, and Robustness of Water Resource Systems
ent://SD_ILS/0/SD_ILS:236637
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Bogardi, Janos J.. Kundzewicz, Zbigniew W..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511546006">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of computer systems and networks fault tolerance, analysis and design
ent://SD_ILS/0/SD_ILS:301466
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Shooman, Martin L. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/047122460X">http://dx.doi.org/10.1002/047122460X</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html">http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fault detectability in DWDM toward higher signal quality & system reliability
ent://SD_ILS/0/SD_ILS:249713
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kartalopoulos, Stamatios V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Engineering maintainability how to design for reliability and easy maintenance
ent://SD_ILS/0/SD_ILS:254337
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and failure of electronic materials and devices
ent://SD_ILS/0/SD_ILS:256309
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ohring, Milton, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
ent://SD_ILS/0/SD_ILS:249594
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Pukite, Jan, 1928- Pukite, Paul.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Guardians of science fairness and reliability of peer review
ent://SD_ILS/0/SD_ILS:300518
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Daniel, Hans-Dieter, 1955- Russey, William E. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/29859865.html">http://catalog.hathitrust.org/api/volumes/oclc/29859865.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527602208">http://dx.doi.org/10.1002/3527602208</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability analysis and prediction a methodology oriented treatment
ent://SD_ILS/0/SD_ILS:255244
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Guidelines for process equipment reliability data with data tables
ent://SD_ILS/0/SD_ILS:300061
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470938355">http://dx.doi.org/10.1002/9780470938355</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability theory and models stochastic failure models, optimal maintenance policies, life testing, and structures
ent://SD_ILS/0/SD_ILS:256119
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Abdel-Hameed, Mohamed S. Çınlar, E. (Erhan), 1941- Quinn, Joseph.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120414208">http://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mathematical models for the study of the reliability of systems
ent://SD_ILS/0/SD_ILS:256673
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kaufmann, A. (Arnold), 1911- Grouchko, Daniel. Cruon, R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124023703">http://www.sciencedirect.com/science/book/9780124023703</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Graph theory in modern engineering computer aided design, control, optimization, reliability analysis
ent://SD_ILS/0/SD_ILS:256727
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Henley, Ernest J. Williams, R. A. (Richard A.)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123408501">http://www.sciencedirect.com/science/book/9780123408501</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Implosion : lessons from national security, high reliability spacecraft, electronics, and the forces which changed them
ent://SD_ILS/0/SD_ILS:249341
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Temple, L. Parker.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
ent://SD_ILS/0/SD_ILS:526722
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Varde, Prabhakar V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-9334-3">https://doi.org/10.1007/978-981-19-9334-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintainability of Building Envelope Elements Optimizing Predictive Condition-Based Maintenance Decisions
ent://SD_ILS/0/SD_ILS:527007
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ferreira, Cláudia. author. Silva, Ana. author. de Brito, Jorge. author. Flores-Colen, Inês. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-14767-8">https://doi.org/10.1007/978-3-031-14767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optimal Inspection Models with Their Applications
ent://SD_ILS/0/SD_ILS:527328
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Ito, Kodo. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22021-0">https://doi.org/10.1007/978-3-031-22021-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Selective Maintenance Modelling and Optimization Basic Methods and Some Recent Advances
ent://SD_ILS/0/SD_ILS:527294
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Liu, Yu. author. Huang, Hong-Zhong. author. Jiang, Tao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-17323-3">https://doi.org/10.1007/978-3-031-17323-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Artificial Intelligence for Smart Manufacturing Methods, Applications, and Challenges
ent://SD_ILS/0/SD_ILS:527797
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tran, Kim Phuc. editor. (orcid)0000-0002-6005-1497 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30510-8">https://doi.org/10.1007/978-3-031-30510-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System Dependability and Analytics Approaching System Dependability from Data, System and Analytics Perspectives
ent://SD_ILS/0/SD_ILS:528574
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Wang, Long. editor. Pattabiraman, Karthik. editor. Di Martino, Catello. editor. Athreya, Arjun. editor. Bagchi, Saurabh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-02063-6">https://doi.org/10.1007/978-3-031-02063-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Technical System Maintenance Delay-Time-Based Modelling
ent://SD_ILS/0/SD_ILS:483411
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Werbińska-Wojciechowska, Sylwia. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10788-8">https://doi.org/10.1007/978-3-030-10788-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Engineering Design under Uncertainty and Health Prognostics
ent://SD_ILS/0/SD_ILS:487389
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Hu, Chao. author. Youn, Byeng D. author. Wang, Pingfeng. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-92574-5">https://doi.org/10.1007/978-3-319-92574-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced Maintenance Policies for Shock and Damage Models
ent://SD_ILS/0/SD_ILS:399178
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-70456-2">https://doi.org/10.1007/978-3-319-70456-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plants
ent://SD_ILS/0/SD_ILS:400726
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Varde, Prabhakar V. author. Pecht, Michael G. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-0090-5">https://doi.org/10.1007/978-981-13-0090-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk Management of Non-Renewable Energy Systems
ent://SD_ILS/0/SD_ILS:529649
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Verma, Ajit Kumar. author. Ajit, Srividya. author. Muruva, Hari Prasad. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16062-7">https://doi.org/10.1007/978-3-319-16062-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Game Theoretic Analysis of Congestion, Safety and Security Traffic and Transportation Theory
ent://SD_ILS/0/SD_ILS:529429
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Hausken, Kjell. editor. Zhuang, Jun. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-11674-7">https://doi.org/10.1007/978-3-319-11674-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Game Theoretic Analysis of Congestion, Safety and Security Networks, Air Traffic and Emergency Departments
ent://SD_ILS/0/SD_ILS:529568
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Hausken, Kjell. editor. Zhuang, Jun. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-13009-5">https://doi.org/10.1007/978-3-319-13009-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Offshore Risk Assessment vol 2. Principles, Modelling and Applications of QRA Studies
ent://SD_ILS/0/SD_ILS:484312
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Vinnem, Jan-Erik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-5213-2">https://doi.org/10.1007/978-1-4471-5213-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Offshore Risk Assessment vol 1. Principles, Modelling and Applications of QRA Studies
ent://SD_ILS/0/SD_ILS:484335
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Vinnem, Jan-Erik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-5207-1">https://doi.org/10.1007/978-1-4471-5207-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Extended Warranties, Maintenance Service and Lease Contracts Modeling and Analysis for Decision-Making
ent://SD_ILS/0/SD_ILS:484374
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Murthy, D.N.Prabhakar. author. Jack, Nat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6440-1">https://doi.org/10.1007/978-1-4471-6440-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Random Maintenance Policies
ent://SD_ILS/0/SD_ILS:487923
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6575-0">https://doi.org/10.1007/978-1-4471-6575-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality Control Applications
ent://SD_ILS/0/SD_ILS:330894
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Chorafas, Dimitris N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330894.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2966-0">http://dx.doi.org/10.1007/978-1-4471-2966-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Improving the Earthquake Resilience of Buildings The worst case approach
ent://SD_ILS/0/SD_ILS:330916
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Takewaki, Izuru. author. Moustafa, Abbas. author. Fujita, Kohei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330916.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4144-0">http://dx.doi.org/10.1007/978-1-4471-4144-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Using Game Theory to Improve Safety within Chemical Industrial Parks
ent://SD_ILS/0/SD_ILS:331129
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Reniers, Genserik. author. Pavlova, Yulia. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331129.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5052-7">http://dx.doi.org/10.1007/978-1-4471-5052-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Analysis of Offshore Steel Structures An Analytical Appraisal
ent://SD_ILS/0/SD_ILS:332580
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Karadeniz, Halil. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332580.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-190-5">http://dx.doi.org/10.1007/978-1-84996-190-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Atomic Information Technology Safety and Economy of Nuclear Power Plants
ent://SD_ILS/0/SD_ILS:173523
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Woo, Taeho. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4030-6">http://dx.doi.org/10.1007/978-1-4471-4030-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk and Interdependencies in Critical Infrastructures A Guideline for Analysis
ent://SD_ILS/0/SD_ILS:173560
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Hokstad, Per. editor. Utne, Ingrid B. editor. Vatn, Jørn. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4661-2">http://dx.doi.org/10.1007/978-1-4471-4661-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Thermal Power Plant Performance Analysis
ent://SD_ILS/0/SD_ILS:173416
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar de Souza, Gilberto Francisco Martha. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2309-5">http://dx.doi.org/10.1007/978-1-4471-2309-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Stochastic Systems Uncertainty Quantification and Propagation
ent://SD_ILS/0/SD_ILS:173422
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Grigoriu, Mircea. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2327-9">http://dx.doi.org/10.1007/978-1-4471-2327-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintenance Management in Network Utilities Framework and Practical Implementation
ent://SD_ILS/0/SD_ILS:173475
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Gómez Fernández, Juan F. author. Crespo Márquez, Adolfo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2757-4">http://dx.doi.org/10.1007/978-1-4471-2757-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis
ent://SD_ILS/0/SD_ILS:299377
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Carlson, Carl (Carl Seymour)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118312575">http://dx.doi.org/10.1002/9781118312575</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=46749">http://www.books24x7.com/marc.asp?bookid=46749</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10558143">http://site.ebrary.com/lib/alltitles/Doc?id=10558143</a>
ebrary <a href="http://site.ebrary.com/id/10558143">http://site.ebrary.com/id/10558143</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Bayesian Inference for Probabilistic Risk Assessment A Practitioner's Guidebook
ent://SD_ILS/0/SD_ILS:176181
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Kelly, Dana. author. Smith, Curtis. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-187-5">http://dx.doi.org/10.1007/978-1-84996-187-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Replacement Models with Minimal Repair
ent://SD_ILS/0/SD_ILS:168457
2026-02-17T21:31:10Z
2026-02-17T21:31:10Z
Yazar Tadj, Lotfi. editor. Ouali, M.-Salah. editor. Yacout, Soumaya. editor. Ait-Kadi, Daoud. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-215-5">http://dx.doi.org/10.1007/978-0-85729-215-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>