Arama Sonuçları Reliability. - Daraltılmış: 1991SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091991$0025091991$0026ps$003d300?dt=list2024-11-25T13:02:26ZThe theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-25T13:02:26Z2024-11-25T13:02:26ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and degradation of semiconductor lasers and LEDsent://SD_ILS/0/SD_ILS:585392024-11-25T13:02:26Z2024-11-25T13:02:26ZYazar Fukuda, Mitsuo.<br/>Yer Numarası TA 1700 F85 1991<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Statistical methods for the process industriesent://SD_ILS/0/SD_ILS:277602024-11-25T13:02:26Z2024-11-25T13:02:26ZYazar McNeese, William H. Klein, Robert Allan, 1947- ort. yaz.<br/>Yer Numarası TS 156.8 M42 1991<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Evaluation and control of measurementsent://SD_ILS/0/SD_ILS:519972024-11-25T13:02:26Z2024-11-25T13:02:26ZYazar Mandel, John.<br/>Yer Numarası QA 276 M326 1991 1.K<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~1<br/>