Arama Sonuçları Reliability. - Daraltılmış: 1996SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091996$0025091996$0026ps$003d300?2025-02-16T23:13:50ZThe theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152025-02-16T23:13:50Z2025-02-16T23:13:50ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantitative risk assessment of hazardous materials transport systems : rail, road, pipelines, and shipent://SD_ILS/0/SD_ILS:1123612025-02-16T23:13:50Z2025-02-16T23:13:50ZYazar Nicolet-Monnier, Michel. Gheorghe, Adrian V.<br/>Yer Numarası T55.3.H3 N53 1996<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Low-power HF Microelectronics A unified approachent://SD_ILS/0/SD_ILS:2477462025-02-16T23:13:50Z2025-02-16T23:13:50ZYazar Machado, Gerson A. S., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>