Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: 1996 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091996$0025091996$0026te$003dILS$0026ps$003d300?dt=list 2026-06-06T01:34:09Z The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-06-06T01:34:09Z 2026-06-06T01:34:09Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quantitative risk assessment of hazardous materials transport systems : rail, road, pipelines, and ship ent://SD_ILS/0/SD_ILS:112361 2026-06-06T01:34:09Z 2026-06-06T01:34:09Z Yazar&#160;Nicolet-Monnier, Michel.&#160;Gheorghe, Adrian V.<br/>Yer Numaras&#305;&#160;T55.3.H3 N53 1996<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Genotype -by- environment interaction ent://SD_ILS/0/SD_ILS:545557 2026-06-06T01:34:09Z 2026-06-06T01:34:09Z Yazar&#160;Kang, Manjit S.&#160;Gauch, Hugh G., Jr., 1942-<br/>Yer Numaras&#305;&#160;SB123 .G427 1996<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420049374">https://www.taylorfrancis.com/books/9781420049374</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802226">https://www.taylorfrancis.com/books/9780367802226</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Low-power HF Microelectronics A unified approach ent://SD_ILS/0/SD_ILS:247746 2026-06-06T01:34:09Z 2026-06-06T01:34:09Z Yazar&#160;Machado, Gerson A. S., ed.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>